Upload
lyn
View
43
Download
0
Embed Size (px)
DESCRIPTION
Designing a Processor from the Ground Up to Allow Voltage/Reliability Tradeoffs. Andrew Kahng ( UCSD ) Seokhyeong Kang ( UCSD ) Rakesh Kumar ( Illinois ) John Sartori ( Illinois ). Timing Errors. Power is a first-order design constraint Voltage scaling can significantly reduce power - PowerPoint PPT Presentation
Citation preview
Designing a Processor from the Ground Up to Allow
Voltage/Reliability Tradeoffs
Andrew Kahng (UCSD) Seokhyeong Kang (UCSD)
Rakesh Kumar (Illinois)John Sartori (Illinois)
Timing Errors
• Power is a first-order design constraint
• Voltage scaling can significantly reduce power
• Voltage scaling may result in timing errors
Operating Voltage
Research Questions
• How does a conventional processor behave when we fix frequency and scale down voltage?
• How can we reduce the voltage at which timing errors are observed? • Reduce power while maintaining the
same performance level
Limitation of Voltage Scaling• At some voltage, circuit breaks
down
Voltage scaling must halt after only 10% scaling.
0.0
0.1
0.2
0.3
0.4
0.5
0.50.60.70.80.91.0Voltage
Err
ors
/ C
ycle
.
Limitation of Voltage Scaling
Error Rate (%)
Module 1.0V 0.9V 0.8V 0.7V 0.6V 0.5V
lsu_dctl 0.00 0.23 8.60 29.46 45.13 54.90
lsu_qctl1 0.00 5.94 10.85 16.99 16.56 37.53
lsu_stb_ctl 0.00 0.08 0.65 5.19 11.79 22.38
sparc_exu_div 0.00 0.15 0.23 0.35 0.49 1.10
sparc_exu_ecl 0.00 3.31 10.97 87.08 88.93 73.03
sparc_ifu_dec 0.00 0.08 0.87 7.09 15.22 20.48
sparc_ifu_errdp 0.00 0.00 0.00 0.00 0.00 9.21
sparc_ifu_fcl 0.00 10.56 22.25 50.04 55.06 56.95
spu_ctl 0.00 0.00 0.00 1.30 2.96 35.53
tlu_mmu_ctl 0.00 0.01 0.02 0.06 0.14 0.19
What problems are caused by steep error degradation?
Problems with Steep Error Degradation
Erro
r Ra
te
(lower voltage)
Maximum error rate
Power consumption
Pow
er Error rate
Vmin
Pmin Erro
r Ra
te
(lower voltage)
Maximum error rate
V’min
P’min
Voltage scaling limited in traditional designs.
• No power savings as error rate increases
Error RateError Rate Technique 2
Power consumption
PowerPTech1
Error Rate Technique 1
PTech2
Traditional design No reliability/power tradeoff
Problems with Steep Error Degradation
Why do circuits fail catastrophically?
• Reliability/power tradeoffs enabled• Allows switching between error
tolerance techniques at different voltages/error rates
Error RateError Rate Technique 2
Power consumption
Power
PTech1
Error Rate Technique 1
PTech2
Higher error rate Lower power
Problems with Steep Error Degradation
Reason for Steep Error Degradation• Critical paths are bunched up in
traditional designs.
Question…
How can we change the slack distribution to achieve a graceful
failure characteristic?
Power-optimized design:
Reclaim excess timing slack
Make slack distribution gradual by re-distributing slack between paths.
Both gradual failure and low power can be achieved.
Slack-optimized design:
Optimize critical paths
Design Objectives and Insight
Timing slack0
Zero slack after voltage scaling
0
‘wall’ of slack ‘gradual slope’ slack
Num
ber o
f pat
hs
• Optimize frequently exercised critical paths.• De-optimize rarely exercised
paths.
Positive SlackNegative Slack
Slack Re-distribution Example
0.0
-0.1
Negative SlackPositive Slack
Error Rate = 1%Error Rate = 25%
Proposed Design Flow
Estimate Error Rate at Target
Voltage
Optimize Negative Slack Paths at Target
Voltage by Resizing Cells
Error Rate>Target Rate
YESUndo
OptimizationPower >
Current PowerYES
NO
Place and Route
Choose New (Lower) Target
Voltage
NO
Error Rate>Target Rate
NO YES
Reduce Power by Resizing Non-critical
Cells (optional)
Voltage ScalingPath OptimizationArea Reduction
• Input: RTL description• Output: Gradual slack design• Objective: Minimize voltage for a
given error rate over a range of error rates
Using fixed target results in over-optimization.
Iterative optimization avoids unnecessary swaps.
Iterative Optimization
Error Rate Forecasting
CLK
BA B
FF FF
P1
P2
P3P1 P1 P1P2 P2 P3
TG(P1) = 0.3TG(P2) = 0.2TG(P3) = 0.1
Slack(P1) = posSlack(P2) = negSlack(P3) = pos ER(B) = TG(B) ∙
TG(B) = 0.6
Timing Error
TG(P2)
TG(P1) + TG(P2) + TG(P3) = 0.2
•Functional simulation•Cadence NC Verilog – Gate-level simulation
•Library characterization•Cadence SignalStorm – Synopsys Liberty generation for each voltage
•Slack Optimization•C++ with Synopsys PrimeTime interface
•ECO P&R•Cadence SOCEncounter – Placement and Routing
•Benchmark generation•Virtutech Simics – Test vector generation
Design-level Methodology
Gradual Slack Distribution
Slack optimization achieves gradual slack distribution.
Processor Module Optimization
Slack optimized design has lowest power for all error rates.
Processor Error Rate and Power
Designs with comparable error rates have much
higher power/area overheads.
Reliability/Power Tradeoff
Slack-optimized design enjoys continued power reduction as error
rate increases.
Enhancing Razor-based Design
Slack optimization extends range of voltage scaling and reduces Razor
recovery cost.
Summary and Conclusion
• Showed limitations of traditional processors w.r.t. voltage scaling• Traditional designs break down
• Presented design technique that enables voltage/reliability tradeoffs• Optimize frequently exercised critical
paths• De-optimize rarely-exercised paths
• Demonstrated significant power benefits of gradual slack design• Reduced power 29% for 2% error rate,
27% on average
Bonus Slides
Slack Optimization Techniques
• Path Optimization and Power Reduction
Erro
r Rat
e
Vmin
Pmin
(lower voltage)
Maximum error rate
Power consumption
Pow
er
Error rate
Operating point Er
ror R
ate
(lower voltage)
Maximum error rate
Power consumption
Pow
er
Error rate
Operating point
Vmin
Pmin
1. Optimize Paths
Erro
r Rat
e
(lower voltage)
Maximum error rate
Power consumption
Pow
er
Error rate
Operating point
Vmin
Pmin
2. Reduce Power
Extended Voltage Scaling
• Focus on frequently exercised negative slack paths
• Reduce error rate while minimizing cell swaps (power overhead)
Path TG Opt. Rank
A-B-C-D 0.22 1A-B-D 0.15 2A-C-D 0.05 3
Rank paths by error rate contribution.
Upsize cells in paths to increase slack.
SWAP
Power Reduction
• Downsize cells on rarely exercised paths
• Reduce leakage power while leaving error rate unaffected
SWAP
Toggle Rate ≈ 0
Check Path Slack
Error Rate Forecasting
• Error rate contribution of one FF
• Error rate of design
ALL
NEG
P
Pffff TG
TGTGER
Dff
ffD ERER
Significance of Processor Power• Power is a first-order design
constraint• Voltage scaling can significantly
reduce power
0
20
40
60
80
100
0.50.60.70.80.91.0Voltage
Pow
er S
avin
gs
(%)
.
Voltage Scaling: 50% Power Reduction: 80%
DVFS Benefit and Cost
0.00.20.40.60.81.0
0.50.60.70.80.91.0Voltage
Relative Power Relative Performance
How effective is voltage scaling when frequency is fixed?
Alternatives – Blueshift
• Goal: Optimize paths that cause errors to enable more frequency overscaling
• Techniques: PCT/OSB• Uses iterative simulation loop –
infeasible for large designs
Alternatives – Tightly Constrained SP&R
• Goal: Optimize all paths aggressively
• Technique: Traditional SP&R with aggressive target
• Some paths will not meet tight constraint, and slack distribution becomes more gradual
Insight
• Optimize frequently exercised paths at the expense of rarely exercised paths
• Optimizing frequently exercised paths enables deeper voltage scaling
• De-optimizing rarely exercised paths keeps power overhead low
Iterative Optimization Flow
Estimate Error Rate at Target
Voltage
Optimize Negative Slack Paths at Target
Voltage by Resizing Cells
Error Rate>Target Rate
YESUndo
OptimizationPower >
Current PowerYES
NO
Place and Route
Choose New (Lower) Target
Voltage
NO
Error Rate>Target Rate
NO YES
Reduce Power by Resizing Non-critical
Cells (optional)
Scale Voltage
Optimize Paths
Iterate
A New Processor Design Goal• Reshape the slack distribution so
processor fails gracefully
Timing slack0
Zero slack after voltage scaling
0
‘wall’ of slack ‘gradual slope’ slack
Num
ber
of p
aths
Moore’s Law
• Power consumption of processor node doubles every 18 months.
Power Scaling
• With current design techniques, processor power soon on par with nuclear power plant
Outline
• Background and Motivation• Insight• Power Reduction Techniques• Design Flow• Results• Summary