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IN CIRCUIT HiTESTER
1220 1 2 2 0 - 0 0 / 1 2 2 0 - 0 1 / 1 2 2 0 - 0 2 / 1 2 2 0 - 1 1
HIOKI. Certifying reliability.
Add value to your testing system with
a high-performance measurement engine.
Ready for an unlimited number of applications.
Introducing the 1220 standalone measurement unit.
The peace of mind of knowing you’re using
the test line standard.
The 1220 line now features standalone measurement units. By making its highly reliable measurement units available separately, HIOKI is able to bring the 1220’s advanced performance to customers in a variety of fields. Replace an existing in-circuit tester’s measurement system or utilize a 1220 Series model as a programmable multi-channel measurement unit—either way, you gain an all-around team player.
In their role as the “mother tools” of industry, measuring instruments are held to an exacting standard of accuracy. The 1220’s DC and AC measurement circuits are completely isolated from one another to eliminate interference. The combination of a dedicated measurement CPU and a high-speed A/D board delivers stable, high-speed, high-precision measurement.
Resistance
measurementDMM/milliohm meter DC measurement
board
Capacitance
measurement
High-speed
measurement
LCR meter
Memory HiCORDER
AC measurement board
A/D conversion board
Years of HIOKI know-how.
Yours, in the 1220.
HIOKI has been identifying market needs and delivering next-generation products for over 70 years. Today the final test process is evolving from the point at which defects are discovered to the locus for value-added systems. With unprecedented industry demand for accurate numerical measurement and high reliability, the 1220 is the ideal tool for quality assurance and process improvement.
IN-CIRCUIT HiTESTER
1220SERIES1220-00 / 1220-01 / 1220-02 / 1220-11 IN-CIRCUIT HiTESTER
Moving from inspection to assurance.
Another high-performance solution
from industry pioneer HIOKI.
IN-CIRCUIT HiTESTER
IN-CIRCUIT HiTESTER
IN-CIRCUIT HiTESTER
One unit does it all. And does it fast.Introducing dependable new functionality for to your production floor.
New measurement modes
Component TestThe 1220 augments the 20 test types offered by previous models with new measurement modes designed to enable testing of previously untestable components. This new functionality drives up total detection rates to meet the industry’s increasingly complex and diverse testing needs.Now test for incorrect fuse ratings
Standard feature: 4-terminal measurement functionalityUntil now it was only possible to detect low resistance defects in short mode. But complex, high value-added boards require milliohm-level quality assurance. Enter 4-terminal measurement functionality, a standard feature on the 1220. Add an 1131-03 Relay Board to unleash the potential of measurement starting at just 40 μΩ.
Support for measurement of up to 100 V
High-current/high-voltage diode testingNow it’s possible to test diodes and Zener diodes at their true rated values. Whereas characteristics testing of diodes was previously impossible due to power limitations, you can now test Zener diodes rated at up to 100 V.
(Requires 1131-03 Relay Board and 1137-01 High-voltage Measurement Unit.)
From combined resistance to impedance measurement
Standard feature: Impedance measurementHigh-density circuit designs are making it increasingly difficult to place measurement pins. Where detection of pinless components had been implemented by taking a combined resistance reading, impedance measurements enable a higher level of precision.
Dramatically shortened measurement time
New optional functionality lets you add a second measurement system to slash testing times for multi board layouts by approximately half.
High-speed testing of multi-board layouts
Parallel test (previous model)
Board A
Board A is tested, followed by Board B.
h Requires AD board, AC measurement board, and DC measurement board.
Board A and Board B are tested simultaneously.
In product ion set t ings where improving productivity is the top priority, even small time losses are unacceptable. The 1220 provides a single solution for jobs that previously required multiple measuring instruments. Compared to previous industrial busses (ISA and VME), the 1220’s compact PCI bus delivers a dramatic speed boost of about 150%. In short, by performing more test steps in a given cycle, storing the measurement signal directly in memory, and performing high-speed calculations, the 1220 dramatically reduces measurement time compared to previous testing products. An optional second measurement system slashes testing times for multi-board layouts to approximately half of previous values (as confirmed by HIOKI in in-house comparison tests).
Parallel test (1220)
Board B Board A Board B
Macro test
If you’re using separate processes for ICT and function testing...
Master configurationUsing the 1220-00 as the controller, perform an active test following the ICT test with the same pinboard—with no setup change.
If you’re performing only function tests with no ICT...
PC
Your one-stop solution for continuous testing
Active TestSimple, programming-free operation
Macro Test
Trilingual support
Standard Chinese Language Support
Component test
BoardActive test
Function testing generally refers to the testing of boards while powering them at their operating voltage. The step is typically performed during the process following the in-circuit test step and requires a dedicated measurement system due to test configuration, customer, and model differences. HIOKI has incorporated voltage application, output voltage, frequency measurement, and other basic function test functionality into the in-circuit tester in the form of the active test, enabling testing that previously required two separate processes to be conducted in one. This capability can also be used to reduce the load placed on the subsequent function test process. An optional GP-IB interface allows the use of a variety of measuring instruments.
Slave configurationIt’s a good idea to perform a minimal short test before activating the board’s power supply. Using the 1220-00 as a slave, the HiTESTER can be incorporated into your existing system, requiring only an increase in the number of pins in order to perform simple ICT testing with your current test fixture.
The macro test function was a popular feature of the 1120 and 1121 IN-CIRCUIT HiTESTERs that HIOKI discontinued at the end of the 1990s. Many customers liked the programming-free approach, and the feature was deemed to be reason enough to choose those models. In response to the chorus of voices calling for a return of the macro test, HIOKI has reintroduced it in the 1220. The actual test requires that the customer provide only a pinboard and a known-good master board. Test data is automatically acquired from the board, and no debugging is required. The customer can add component test steps as necessary. Advantages include reduced lead times in test fixture manufacturing and the ability of test fixture manufacturers to offer services even if the tester in question is not available at their facility.
Support for local languages is in demand as production shifts overseas. Against this backdrop, China is the focus of Japanese and worldwide attention as the world’s largest manufacturing nation. The 1220 includes Chinese language support as a means of boosting efficiency by allowing operators to interact with the device in their native language. lSupported languages: Japanese, English, Chinese
PC
MemoryHiCORDER
MemoryHiCORDER
DMMPowerSupply
DMMPowerSupply
Pin Contact CheckFaulty contact between the probe pins and the board under test can cause short errors to go undetected, while multiple press cycles cause increased damage to target boards. The 1220 uses pin contact check data automatically generated from a proprietary algorithm to verify that proper probe contact has been established before starting the test.
Dramatically improved test process efficiency.Compatibility with the legacy data of yesterday.Support for the networking capabilities of tomorrow.
Enhanced process detection rates
Test ProcessIncreased circuit board density in recent years has made it impossible to place pins, causing a decline in defect detection rates. New 1220 measurement functions are designed to address this problem by improving detection rates for ICT processes.
Automatic testing flow
Charge TestResidual charge in components such as capacitors renders accurate measurement impossible, and rush current can cause hardware damage. The charge test measures charge and automatically discharges components whose readings exceed a preset threshold.
S/O TestThis test consists of a round-robin short/open test between all nets. New functionality and a faster measurement unit act to detect short defects as quickly as possible.
Component TestEmploying a variety of measurement modes to detect erroneous component constants, missing components, and component characteristics, the component test is the heart of the ICT test. A new measurement unit reliably delivers a speed boost of 50% over previous models.over previous models.nA new impedance measurement mode provides impedance testing of components where making pin contact is impossible. nFour-terminal measurement is used to assess low-resistance components such as fuses.
IC MeasurementIC measurement combines a test for reverse insertion using an IC parasitic diode with inter-pin S/O tests.
Active TestDuring an active test, the board’s output voltage, frequency, and other characteristics are measured while it is powered on, enabling post-process function testing to be carried out as part of the in-circuit process. Work that previously required two processes can now be performed in a single step—and for the cost of a single test fixture.
The test functionality demanded of in-circuit testers has grown increasingly advanced and complex in recent years. The 1220 is the result of a radical ground-up reassessment of the testing process that prompted the addition of a variety of new features designed to improve ease of use as well as test efficiency. At the same time, the line is easy on operators, allowing legacy data to be easily converted for use in the new equipment. With support for advanced needs such as networking, the 1220 is designed to deliver the maximum benefit for the minimum investment cost.
The following methods can be used to load 1101/1102 data, which cannot be loaded directly due to its use of a special format:
l1137 Data Conversion Application (1105 data creation application)
The 1105 data creation application can be used to convert the data. If you have access to an 1105 HiTESTER, that unit can also be used to perform the conversion.
1101data
1102data
1105data
1137 Data Conversion Application1137-03 Data Conversion Unit
Data suitablefor use with the 1220
(1)Read barcode/QR code.(2)Select/switch test data.(3)Check pinboard ID.(4)Perform test.(5)Save data by input code.
Server PC Network
(2)Select/switch test data.
(3)Check pinboard ID.
(5)Save data by input code.
(1)Read barcode/QR code. (4)Perform test.
1220-11PASS
Standard in-line model
Use legacy data
Data CompatibilitySupport for high-speed systems
Standard Barcode SystemWith the 1220, HIOKI users will never waste legacy test data, which can be used with the 1220 following conversion, reacquisition of S/O data, and some debugging. Pinboards are fully compatible. Data from 1105 HiTESTERs can be used without modification, and 1220 data can be saved as 1105 data. Data from 1101/1102 HiTESTERs, introduced more than 20 years ago but still in use, is also supported.
l1137-03 Data Conversion Unit (1102-1105 data conversion unit)
Factory Option
Although the 1220 computer runs on Windows XP, you can also install PC-DOS 2000 to run the 1137 application. Just change the operating system at startup and launch the 1137 application to convert 1105 data for use with the 1220.
No conversion required
Production sites for applications requiring high reliability, such as boards used on vehicles, require more advanced and rapid testing solutions, leading to increased demand for features such as test result management and automatic setup. The 1220 is designed to prevent human error and facilitate maximum automation, an approach that is also reflected in its networking support.
1220-02
1220
Take advantage of existing hardware assets.See how updating your measurement environment can expand your business’s potential.
Keep using the same test fixtures. Update only your measurement unit.
Exceptional ExpandabilityInvestment in in-circuit testing equipment is not to be undertaken lightly. The 1220 recognizes this fact by letting you make effective use of pinboards from previous models, including superannuated test fixtures. By updating your system’s measurement unit to 1220 technology, you gain a state-of-the-art measurement environment that delivers superior cost performance. You also gain the ability to convert test data while taking advantage of exceptional expandability that facilitates back board and burn-in board testing, previously troublesome multi-channel connector testing, and S/O testing. Just connect your own test fixture to take advantage of these leading-edge capabilities.
And don’t worry if you’re not currently using a HIOKI instrument. The 1220 is available as a separate measurement environment unit, allowing you to update the heart of your system to a state-of-the-art HIOKI 1220 while continuing to use the same test fixtures. Rest assured that every HIOKI in-circuit testing solution is backed by a tradition of accomplishment that promises to meet the industry’s demand for unprecedented levels of precision and reliability.
1220-02
1220
Sample test applications
Probe endurance test
The 1220 collects data from individual probes as it performs multi-channel, high-precision 4 terminal low-resistance measurement. When connected to a computer, it can act as a logger to capture data efficiently.
Fan control board high-speed inspection
Built-in boards can be tested with the macro test’s impedance measurement function, enabling the test to be performed with the minimum necessary number of probes to limit test fixture costs.
PASSor
FAIL
Example Applications (User Objectives)
Application
Tuner board testing1
2
3
4
5
6
Single-operator testing equipment for the ICT age
Desktop PressThe 1220 line now features the standalone 1220-00 desktop measurement unit, which can be paired with a desktop press to form a truly compact testing environment. Space-saving configurations like this one are ideal for the growing cell production market.
Tests/measurements used Additional boards
Macro test None
Pickup board testing
DVD optical system testing
Voltage/current measurement Dedicated board
Frequency measurement GP-IB board
Testing of boards for electrical automotive equipment High-voltage Vz measurement 1131-03 Relay Board, 1937 High-voltage Board
Burn-in board testing S/O test + ICT test 1912-01 Expansion I/O Board
Probe endurance test 4-terminal low-resistance measurement 1131-03 Relay Board
Materials testing Multi-channel isolation test 1131-03 Relay Board, 1937 High-voltage Board
Unit Architecture
n Basic 1220 HiTESTER System Diagram
Support for high-density boardsHIOKI can install straight pins at pitches as low as 0.5 mm with a high-precision punching machine, enabling accurate probing of increasingly small points.
1.
2.
Connection Specifications
Interface support for advanced applications
Technical InformationTechnicians frequently ask about the 1220’s unit architecture and standard external I/O assignments. This page provides technical information to aid in your purchase decision.
Consistent supply of high-quality pinboards
Pinboard Manufacturing
Every year, pinboard manufacturing is subject to ever more exacting demands due to the challenge of increasingly high-density board designs and the need to accelerate the transition from prototype to full production. HIOKI can leverage its experience as a manufacturer of in-circuit testers to meet an extensive range of customer needs.
ProbesProbes must deliver both high reliability and durability. HIOKI uses only the most dependable probes from a variety of manufacturers, selecting the best probes for each application based on tip shape, diameter, pressure, and structure.
CPU board
Standard I/O board
AD board
AC measurement board
DC measurement board
Scanner board
Scanner board
Scanner board
Scanner board
Scanner board
Primary interface boardMeasurement line expansion connector
1220 HiTESTER
Ori
gin
al b
us ⇔
cP
CI b
us b
rid
ge
cPC
I bus
are
aO
rig
inal
loca
l bus
are
a
Slot1
Slot2
Slot3
Slot4
Slot5
Slot6
Slot7
Slot8
Slot9
Slot10
Slot11
Slot12
CN1
CPU board
I/O board
Empty
Empty
AD conversion board
AC measurement board
DC measurement board
Empty
Empty
Empty
Scanner board
Scanner board
Measurement line expansion connector
Po
wer
sup
ply
uni
t
Optional boards
Expansion I/O board
GP-IB board
Second AD conversion board
Second AC measurement board
Second DC measurement board
Scanner board
Relay board
High-voltage boardH
Function boardH
Primary interface board
Slot6
Slot2
CFx1
RTOS
LANSIOUSBVGAPIO
Bac
kpla
ne p
ow
er s
upp
ly
100 to 240 V AC50/60 Hz, single-phase
To measurement line connector on expansion box (extension rack)
LAN cable
Computer
lComputer lMonitor lKeyboard lMouse lPrinter
HThese boards occupy 2 slots each.
To secondary interface board connector on expansion box (extension rack)
n With 4 racks (Total: [10 + 10 + 10 + 4] × 64 = 2,176 pins)
Empty
Expansion Box(Rack No. 3)
Expansion Box(Rack No. 2)
Rear of HiTESTER(Rack No. 1)
Expansion Box(Rack No. 4)
577 to 640
513 to 576
449 to 512
385 to 448
321 to 384
257 to 320
193 to 256
129 to 192
65 to 128
1 to 64
1217 to 1280
1155 to 1216
1089 to 1154
1025 to 1088
961 to 1024
897 to 960
833 to 896
769 to 832
705 to 768
641 to 704
1857 to 1920
1793 to 1856
1537 to 1600
1601 to 1664
1473 to 1536
1729 to 1792
1665 to 1728
1409 to 1472
1345 to 1408
1281 to 1344
CPU
I/O
AC
DC
2113 to 2176
2049 to 2112
1985 to 2648
1921 to 1984
A/D
Connector pin assignments (standard I/O board)
Signal Descriptions
CN1 Press control (I/O = 12/4) 20-pin
Signal name Pin no. 1220 signal name Description
IN1_COM1IN1_1IN1_2IN1_3
IN1_4
IN1_5IN1_6IN1_7
IN1_8
IN1_9
IN1_10
IN1_11IN1_12OUT1_24VOUT1_1
OUT1_2OUT1_3OUT1_4OUT1_GND1N.C
1234
5
6789
10
11
12
1314151617181920
IN1_COM1AREA_SENSOR1E_STOP_SW1PRESS_DOWN_LS1(VCM_STRAT1)PRESS_UP_LS1(VCM_STOP1)MANUAL_SW1AREA_SENSOR2
E_STOP_SW2PRESS_DOWN_LS1(VCM_STRAT1)
MANUAL_SW2
AUTO_PRESS_UP1#AUTO_PRESS_UP2#AUTO_VCM1
AUTO_VCM2
Input COM (Supports sink and source output.) IN1_COM1
IN2_1
IN2_3IN2_2
OUT2_5OUT2_4OUT2_3OUT2_2OUT2_1OUT2_24V1IN2_16IN2_15IN2_14IN2_13IN2_12IN2_11IN2_10IN2_9
IN2_COM2IN2_8IN2_7IN2_6IN2_5IN2_4
N.COUT2_GND3OUT2_24OUT2_23OUT2_22OUT2_21OUT2_20OUT2_19OUT2_18OUT2_17OUT2_24V3OUT2_GND2OUT2_16OUT2_15OUT2_14OUT2_13OUT2_12OUT2_11OUT2_10OUT2_9OUT2_24V2OUT2_GND1OUT2_8OUT2_7OUT2_6
N.C
20
191817161514131211
1098765432
1
302928
27262524232221
393837363534333231
494847
46454443424140
50
GROUP PORT4#
GROUP PORT3#
GROUP PORT2#GROUP PORT1#
BUZZER#
MON_PRESS_UP_LS2#MON_PRESS_DOWN_LS2#
MON_AREASENSOR2#
MON_PRESS_UP_LS1#
MON_PRESS_DOWN_LS1#MON_AREASENSOR1#AUTO_PRESS_UP2#AUTO_PRESS_UP1#
E_STOP#
CNT_FAIL#
READY#
RETEST#
TEST_END#TEST#FAIL2#FAIL1#
PASS#
PRESS2#
PRESS1#
BAR CODE READTEST_STOP_TRIGGERTEST_START_TRIGGER
PRESS_UP_LS2(VCM_STOP1)
4.
5.
6.
3. 7.
Circuit Diagram
n InputInternal circuitry
FPGA
IN
R1
3.3V
R2R3 IN
COM
DC 24V
FPGA
OUT
Rx
3.3V
R2
R3
+COM
-COM
OUTLED
DC 24VDC 5V
R1
Fuse
Optimized programmingExpert technicians conduct an optimized debugging process from your populated board to assess the most suitable tolerances, wait times, and guarding. The need for post-delivery debugging is minimized by performing the debugging process on the same testing equipment as operated by the customer.Design that minimizes stress on the boardWarping of the board when the press is lowered subjects not only the board but also its components to significant stress. Extensive experience allows HIOKI to deliver consistent, warp-free probing.
Fast deliveryWith the time from prototype to full production shrinking every year, the most effective way to assure product quality is to deploy an in-circuit testing solution at the earliest possible stage. HIOKI is currently working to revamp and streamline our manufacturing processes to enable us to meet customers’ demands for fast product delivery.DocumentationEvery HIOKI pinboard ships with the documentation required for customer quality control and pinboard maintenance, including a debugging list, probe plot, and location diagram.
Extensive optionsIn addition to electrical testing, pinboards can be used in a variety of tests:lStamp unitStamps PASS boards. A variety of print surfaces are available, from typical water-based ink to oil-based ink. (Requires tester with stamp mechanism.)lConnector detection and reverse insertion testChecks for improper manual connector insertion with a switch probe.lCapacitor reverse insertion testDetects reverse capacitor insertion by probing the tops of electrolytic capacitors with a special probe. (Requires tester with capacitor reverse insertion detection function.)lCounter function and antistatic design
Documentation required for manufacturing a test fixture:(1)Circuit diagram (2)Component list (3)Bare board(4)Populated board(s) (as many as possible) (5)Component plot (6)Net list, etc.*Test fixtures can also be manufactured from Gerber data.
10 1
20 11
25
50
1
26
Area sensorEmergency stop switchDown signal when press 1 is lowered (signal that turns AUTO_VCM1 on)Up signal when press 1 is raised (signal that turns AUTO_VCM1 off)Signal when the press 1 manual switch is turned onArea sensorEmergency stop switch
Signal when the press 2 manual switch is turned on
Output +24 V power supplySignal to raise press 1Signal to raise press 2Vacuum 1 solenoid valve controlVacuum 2 solenoid valve controlOutput common 24 V groundNot connected
Down signal when press 1 is lowered (signal that turns AUTO_VCM1 on)Up signal when press 2 is raised (signal that turns AUTO_VCM2 off)
Press 1Press 1Press 1
Press 1
Press 1Press 2Press 2Press 2
Press 2
Press 2
Press 1Press 2Press 1Press 2
CN2 External interface (I/O = 16/20) 50-pin
Signal name Pin no. 1220 signal name Description
Down signal when press 1 is lowered (signal that turns AUTO_VCM1 on)Test start when on for at least 200 msTest stop when on for at least 200 ms Barcode scan when on for at least 200 ms
COM for IN2_9 to IN2_16 input(Supports sink and source output.)
Output +24 V power supply 1 Press 1 has started test.Press 2 has started test.
Reserved
Output common 24 V ground 1Output +24 V power supply 2Automatic test mode Stop due to consecutive FAIL results
IN1_1 Press 1: Area sensor monitorIN1_3 Press 1: Down signal monitorIN1_4 Press 1: Up signal monitorOutput common 24 V ground 2 Output +24 V power supply 3IN1_6 Press 2: Area sensor monitor IN1_8 Press 2: Down signal monitorIN1_9 Press 2: Up signal monitor
Group output port 1 Group output port 2Group output port 3Group output port 4 Output common 24 V ground 3 Not connectedNot connected
n Output (A single power supply can be used as both the external and drive power supply.)
Internal circuitry
External circuitry
External circuitry
Dotted line: Source output
Solid line: Sink output
1110
HIOKI’s extensive model line-up is in tune with today’s testing needs.
Computer Applications
HiTESTER models
Extension boards CablesExpansion boxes
Windows notebook PC
You can use your own computer.HRequires at least 1 empty network port.
I f y o u d o n ’ t h a v e a computer to use, consider the 1913-01 Computer Unit.
h
l1220 PC Application (1137-02)Controls the 1220 HiTESTER from the computer using the familiar Windows operating system.
Factory Option
1220-00Desktop TypeThe HiTESTER and expansion box are both the size of a tower-type computer. The computer is sold separately, and you can use your own computer if desired. If the unit will be used primarily for automatic testing, the optional Standalone Application can be used to enable HiTESTER operation without a computer for a more compact installation.
1220-01Press TypeThis traditional horizontal type press can accommodate more test pins in recognition of the trend toward more pins due to the high mounting densities on today’s boards. Its versatile design allows the operator to either sit or stand.
lExpansion Box 1912 • For 1220-00 • Max. 640 pins
lExtension Rack 1911-02 • For 1220-01/02/11 • Max. 640 pins
l1102-1105 Data Conversion Unit (1137-03)Converts test data from previous HIOKI models (1101, 1102) to the 1105 test data format. The converted 1105 test data can be read with the 1220. Uses the PC-DOS 2000 operating system.
l1220 HiTESTER Standalone Application (1137-04) Allows you to connect a keyboard, mouse, and display directly to the 1220 HiTESTER to perform standalone automatic testing and simple data editing without using the 1220 control computer.
l1220 Data Creation Application (1137-05)Allows 1220 data to be created on a general-purpose computer.
Factory Option
lScanner Board 1131-01 • Analog switching (high-speed) • 64 pins/board, switchable between 2- and 4-terminal operation • Maximum rating: 30 V/20 mA
lRelay Board 1131-03 • Read relay (high-voltage) • 64 pins/board, switchable between 2- and 4-terminal operation • Maximum rating: 250 V/500 mA
lScanner Cable (64-pin, shielded) 1156-01
lScanner Cable (64-pin) 1131-01
1110
HIOKI’s extensive model line-up is in tune with today’s testing needs.
Optional boards
Test Fixtures Additional Options External unit
1220-02Space-saving TypeDesp i t e i t s ma ins t r eam tower design, this model provides 1,536 pins of testing capability—as much as most customers will ever need. It’s all about getting the most power in the smallest possible space.
1220-11Standard In-line TypeDesigned for in-line applications, this model includes transport functionality to meet customers’ d e m a n d s f o r a u t o m a t e d operation. It brings together a range of HIOKI technologies for faster, safer, and more reliable testing.
lGP-IB Communications Function Board 1936Communicates directly with the necessary external measuring instruments when performing an active test.
Connection to the 1220-00 requires a separately available 24 V power supply.
h
All 1220 models
These products are available on a build-to-order basis. Confirm specifications and delivery time before ordering.
lHigh-voltage/Isolation Measurement Unit 1937Features the functionality of both the 1937-01 and 1937-02 boards.
lHigh-voltage Measurement Unit 1937-01
High-voltage diode measurement from 25 to 100 VDC high-voltage measurement from 1 mV to 250 V
lIsolation Measurement Unit 1937-02
High-voltage resistance measurement from 1 to 100 V / 400 m to 1 GΩIsolation measurement from 1 to 100 V/200 m to 1 GΩ
lExpansion I/O board 1912-01
32 input points (sink input, 0 to 24 V DC)32 output points (open collector +12 to 24 V DC)
lLAN Connection Unit 1913-03
Add a LAN board to the 1220 control computer for network connectivity.
lDedicated BoardProvides output functionality required when performing an active test (digital output, analog output, LVDS, etc.)
lPress Unit (for use with part 1160)
1144 l1160
l1162
lPress Unit (for use with part 1162)
1142
Factory Option
lElectrolytic capacitor polarity detectionlIC reverse insertion detectionlHigh-voltage Zener diode VZ measurement (25 to 120 V)
lHigh-current-applied diode VF measurement (200 mV)
lMulti-board layout high-speed testing
1220-01/02/11
1220-01/02
lArea sensor (with cover)
lSide safety coverlRear safety cover
l1,024-pin one-touch connectorl2,048-pin one-touch connectorlLarge pinboard supportlStamp unit
lUPS Unit (available only in Japan)
1913-02
No. of test steps
Other
Control unit
Operating environment
External I/O
Automatic data creation function
Statistical functions
Self-test function
Test signals
Test types and ranges
Measurement ranges
Scanner unit
Measurement unit
Judgment range
Guarding
1220-00, 1220-01, 1220-02, and 1220-11 Shared Specifications
Component dataRound-robin short/openPin contact data
:::
Max. 10,000 steps2,176 pins2,176 pins
IC data h
Group dataCharge data
:
::
500 steps(Max. 4,000 pins/step)256 groups40 sets
ResistanceLow resistance hImpedanceHigh-voltage low-resistance measurement hIsolation measurement hCapacitorsCoilsDiodes and transistorsHigh-current-applied diodes hZener diodes
::::::::::
400 mΩ to 40 MΩ40 μΩ to 400 mΩ1 Ω to 10 MΩ400 mΩ to 1 GΩ200 Ω to 1 GΩ10 pF to 400 mΩ10 μH to 100 H100 mV to 25 V100 mV to 9 V100 mV to 25 V
High-voltage Zener diodes hSwitching transistorsPhotocoupler test functionDC voltage measurementOpenShortDischargeCapacitor reverse insertion detection hIC reverse insertion detection h
:::::::::
25 V to 100 V100 mV to 25 V100 mV to 25 V100 mV to 25 V4 Ω to 4 MΩ400 mΩ to 400 kΩ
DC low voltageDC low currentAC low voltage
:::
0.1 V, 0.4 V 200 mA to 100 mA 160 Hz, 0.1 Vrms1.6 kHz, 0.1 Vrms0.2 Vrms to 2.0 Vrms in 0.1 V steps16 kHz, 0.1 Vrms160 kHz, 0.1 Vrms0.2 Vrms to 2.0 Vrms in 0.1 V steps
DC voltmeterDC ammeterAC ammeter
:::
800 μV f.s. to 25 V f.s.100 nA f.s. to 250 mA f.s.100 μA rms to 10 mA in 0.1 V steps
Analog switching(1131-01 Scanner Board)
: 64 channels/board2-/4-terminal switchableInput protection: ±15 V/±0.5 V(with batch configuration)
IC testCharge
::
From approx. 1.0 ms/pinFrom approx. 3.0 ms/set
Round-robin short/openComponentMacro
:::
From approx. 0.8 ms/pinFrom approx. 0.9 ms/stepFrom approx. 2.0 ms/step
Control deviceOperating systemStorage mediaDisplayInput devicesExternal I/O
::::::
PC/AT-compatible computerWindows 2000/XPh2, Japanese or English versionFloppy disk and hard disk15” LCDPS/2 keyboard, PS/2 mouseUSB × 6 ports, Ethernet (LAN) 10BASE-T/100BASE-TX × 1, SIO × 1 port, PIO × 1 port
Control deviceOperating systemStorage media
:::
Single-board computerReal-time OSCompactFlash × 1
Round-robin short/open : 4 Ω to 400 Ω
2 ranges8 rangessingle rangesingle range
single rangesingle range
-99.9% to +999.9% or absolute value
Max. 5 points/step
Overall FAIL rate by test and group; graph display by month; histogram function; linked with Excel
ATG function (automatic reference data acquisition and guard point configuration), acquisition of reference values from reference board, acquisition of wiring resistance, acquisition of stray capacitance, group specification
Standard I/O: 28 input points and 28 output points (For more information, contact your nearest HIOKI Sales Office.)
Operating temperature and humidity rangeEnvironmentStorage temperature range
:::
23°C ±10°C at 75% rh or lowerAvoid using the HiTESTER in environments characterized by the presence of dust, vibration, or corrosive gasses.10°C to 43°C
Read relay(1131-03 Relay Board)
: 64 channels/board2-/4-terminal switchable
Execution format : By unit (manual)/at startup
Computerh1
HiTESTER
Faulty contact retry/reverse-polarity retry/retest functions, FAIL stop, test jump, test hold function, test data, test result output function (printer/RS-232C/disk), FAIL map display function, mask pin configuration function, surplus test function, consecutive FAIL stop function, password protection function, automatic test data backup function, load/convert legacy data (1105 data, text data), test data switching function (A/B data), network connectivity, remote self-test function
C o m p o n e n t test
Optional. h1 Computer is optional for the 1220-00. h2 Windows 2000 and Windows XP are registered trademarks of Microsoft Corporation.
nIn-Circuit HiTESTER 1220-00, 1220-01, 1220-02, and 1220-11 Dimensions (unit: mm)
200 1030 10
1220-00
297
1220-01
1220-02
1220-11
1470
1
0
710 10 655 10 705 10 780 20 940 20
670
10
900
15
900
10
730
10
645
10
760
10
550
1585
1
5
323
1610
1
0
1220 In-Circuit HiTESTER Specifications
Measurable board
dimensions
No. of test
Judgment criteria
Measurement unit
Test signals
Test type and range
No. of test steps
Accessories
Common accessories
W e i g h t a n d
dimensions
Power supplies
Press unit
Interface unit
Measurement unit
Generation unit
Test types
No. of test steps
Data creation
Guarding
Measurement time
Other
Macro Test Specifications
Active Test Shared Specifications
1220-00 1220-01 1220-02 1220-11
StandardMax.
Max.
::
:
128 pins320 pins (with standard HiTESTER)
(Can be expanded in 64-pin blocks.)2,176 pins
(Supports up to three 640-pin expansion boxes.)
Standard, single-sidedStandard, double-sidedLarge, single-sidedLarge, double-sided
::::
390×300mm340×240mm416×340mm416×335mm
Determined by test fixture unit. Special-order sizes are also available.
NoneTheoretical thrust: 3.96 kN (at 0.5 MPa)Support pinboard: 1160 (measurable board dimensions: 420 × 300 mm)Air pressure: 0.5 to 1.0 MPa (dry air)
HiTESTER100 to 240 V AC (±10%)Single-phase, 50/60 Hz
Power consumption: Max. 700 VA(in full 320-pin scanner board configuration)
Expansion box100 to 240 V AC (±10%)Single-phase, 50/60 Hz
Power consumption: Max. 700 VA(in full 640-pin scanner board configuration)
HiTESTER
100 to 120 V AC; 200 to 250 V AC (±10%)(Specify at time of order.)Single-phase, 50/60 Hz
Power consumption: Max. 1 kVA(in full scanner board configuration)
DimensionsWeight
::
200 (W) × 298 (D) × 325 (H) mmApprox. 10 kg(in standard configuration with 2 scanner boards)Approx. 12 kg(in full relay board configuration)
Instruction manual × 1, test lead × 1, 1220 system disk (CompactFlash) × 1
Scanner cable × 5, 1220 Computer Application (CD-ROM) × 1
HiTESTER
Power cable × 1
Comparison with value acquired from reference boardPASS judgment region: X ±(3s + a) X = Average value acquired from reference board3s = 3 × standard deviation (statistical tolerance) a = Coefficient reflecting measurement accuracy
0.2 to 0.5 V rms in 0.1 V steps (during testing of ATG step)0.2 to 2.0 V rms in 0.1 V steps (during testing of specified pin pairs)Frequency: 1.6 kHz
Data: Max. 2,176 steps
Impedance: 1 Ω to 10 MΩ
Ammeter: 10 μ/100 μ/1 m/10 mA rms (4 ranges)
From 2.0 ms/step
3 points/step (for tests of specified pin pairs only)
Automatic generation with ATG function or manual creation of specified pin pairs
Data: Max. 256 steps
DC voltage, DC high-voltage measurement*, AC voltage, timer, interval, frequency, waveform check, discharge
External DC stabilized power supply
1.Digital multimeter 2.Universal counter 3.Digital oscilloscope
1912-01 Expansion I/O Board (32 sink input points, 32 open collector output points)
1936 GP-IB communications function (enables control of up to 14 external measuring instruments or other devices)
External judgment result retrieval function, slave function (Other tests and shared functionality depend on the 1220 HiTESTER model.)
Digital output (CMOS level)LVDS output (differential signal) Analog output Expansion open collector output Digital power supply (+5 V)
1.2.3.4.5.
:::::
16 channels4 channels4 channels; 0 to 5 V (0.1 V resolution)4 channels1 channel
Dedicated board
0 to 20 V / 0 to 36 V / 0 to 60 V / 0 to 120 V(max. 4 channels)External electronic load (max. 4 channels)
DC voltmeterDC voltmeterInternal discharge
:::
800 μV fs to 25 V fs, 8 ranges25 mV fs to 250 V fs, 5 ranges (with optional 1131-03 and 1937 installed)Up to 15 V (use external electronic load for 15 V and greater)
1220 HiTESTER
External measuring instruments
I/O
GP-IB
StandardMax.
Max.
::
:
320 pins320 pins (with standard HiTESTER)
(Can be expanded in 64-pin blocks.)2,176 pins(Supports up to 3 extension racks.)
StandardMax.
Max.
::
:
320 pins320 pins (with standard HiTESTER)
(Can be expanded in 64-pin blocks.)1,536 pins (with 2 extension racks)
StandardMax.
Max.
::
:
320 pins320 pins (with standard HiTESTER)
(Can be expanded in 64-pin blocks.)1,156 pins (with 2 extension racks)
HiTESTER
100 to 120 V AC; 200 to 250 V AC (±10%)(Specify at time of order.)Single-phase, 50/60 Hz
Power consumption: Max. 1 kVA(in full scanner board configuration)
HiTESTER
100 to 120 V AC; 200 to 250 V AC (±10%)(Specify at time of order.)Single-phase, 50/60 Hz
Power consumption: Max. 1 kVA(in full scanner board configuration)
DimensionsWeight
::
200 (W) × 298 (D) × 325 (H) mmApprox. 10 kg(in standard configuration with 2 scanner boards)Approx. 12 kg(in full relay board configuration)
Expansion box
DimensionsWeight
::
1030 (W) × 710 (D) × 1470 (H) mmApprox. 240 kg
HiTESTERDimensionsWeight
::
670 (W) × 710 (D) × 1600 (H) mmApprox. 220 kg
HiTESTERDimensionsWeight
::
800 (W) × 960 (D) × 2150 (H) mmApprox. 290 kg
HiTESTER
HEAD OFFICE : 81 Koizumi, Ueda, Nagano, 386-1192, JapanTEL +81-268-28-0562 / FAX +81-268-28-0568 E-mail: [email protected]
HIOKI USA CORPORATION :6 Corporate Drive, Cranbury, NJ 08512 USATEL +1-609-409-9109 / FAX +1-609-409-9108E-mail: [email protected]
TKK HIOKI CO.,LTD :NO.66-8,Sec.2,Nan Kan Road,Lu-chu,Taoyuan,TaiwanTEL +886-3-311-7260 / FAX +886-3-311-8236
HIOKI E.E.CORPORATION Singapore Representative Office :12 New Industrial Road,#02-04 Thoren Technocentre,Singapore 536202TEL +65-6288-0050 / FAX +65-6282-2283E-mail: [email protected]
Inquiries
HIOKI ONLINEWebsite http://www.hioki.com
Email [email protected]
HIOKI is ISO 14001 certified.All of HIOKI’s domestic and overseas facilities have been certified compliant with ISO 14001, an international standard governing environmental management systems.
1220E5-84BCAUTION To ensure safe and proper operation, be sure to read this product’s Instruction Manual before attempting to use it.
All information correct as of Apr. 9, 2008. All specifications are subject to change without notice.
n Japan Sales Network
Headquarters, Factory, and Nagano Sales Office(Nagano, Niigata, Gumma, Yamanashi, Toyama, Ishikawa, Fukui)
Osaka Sales Office(Osaka, Kyoto, Nara, Shiga, Wakayama,
Hyogo, Tottori)
Hiroshima Sales Office(Chugoku region except Tottori, Shikoku)
Fukuoka Sales Office(Kyushu, Okinawa)
Tohoku Sales Office(Hokkaido and six Tohoku prefectures)
Northern Kanto Sales Office(Saitama, Ibaraki, Tochigi)
Tokyo Sales Office(Tokyo, Chiba)
Yokohama Sales Office(Kanagawa)
Shizuoka Sales Office(Shizuoka)
Osaka Sales Office(Osaka, Kyoto, Nara, Shiga, Wakayama, Hyogo, Tottori)
HIKING TECHNOLOGY CO.,LTD : 81,Su Hong Xi Road,Suzhou Industrial Park,Suzhou,P.R.CHINATEL+86-512-62560393 / FAX+86-512-62560390
BBT
n Worldwide HIOKI Network
SEIKA GermanyWKK China
(Beijing)
WKK China(Chengdu)
WKK (THAILAND)
WKK (MALAYSIA
Penang)
WKK (SINGAPORE)
TAISHIN
HIOKI
TKK
WKK PHILIPPINESWKK China(Shenzhen)WKK ESWKK PCB
WKK (MALAYSIA
Kuala Lumpur)
SEIKA(LA)
HUSA
SEIKA(Atlanta)
HIOKI-trained distributors provide local technical support. HIOKI is proud to maintain a growing network of distributors and product support offices in four overseas regions (North America, China, Southeast Asia, and Europe).
HikingTKKEWKK China
HDIS
Le Champ
HIOKI (Shanghai) Sales & Trading Co., Ltd. :1904 Shanghai Times Square Office, 93 Huai Hai Zhong RoadShanghai, P.R.China POSTCODE: 200021TEL +86-21-6391-0090/0092 FAX +86-21-6391-0360E-mail: [email protected]
Beijing Office :A-2602 Freetown, 58 Dong San Huan Nan RoadBeijing, P.R.China POSTCODE: 100022TEL +86-10-5867-4080/4081 FAX +86-10-5867-4090E-mail: [email protected]
Guangzhou Office :Room 303, Profit Plaza, No.76, West Huangpu RoadGuangzhou, P.R.China POSTCODE: 510623TEL +86-20-38392673/2676 FAX +86-20-38392679E-mail: [email protected]
