Agenda

• LTE market update

• How to verify the LTE efficiently in DVT stage

• Manufacturing perspective of LTE Carrier Aggregation

•1

Main LTE Markets

• The Unites States is top national user country base for LTE subscribers with 47% of total subscriptions worldwide.

• Japan ranks in second place with around 33 million LTE subscribers.

2

Main LTE Markets

3

Taiwan LTE Frequency Deployment

• 1800 MHz, 900 MHz and 700 MHz is current Taiwan LTE bands.- B3 for 中華電信, B8 for 台灣之星, B28 for 台哥大, 遠傳, 亞太和國碁

• Detail bidding listing

•4

Taiwan LTE Frequency Deployment

• How about 2600MHz deployment in Taiwan?- NCC suggests to have B7 for FDD and B38 for TDD- Totally 190Mhz bandwidth release, 140Mhz for B7 FDD-LTE, and 50MHz for

B38 TDD-LTE

• TDD• FDD • FDD

•5

Band 7 UL

• 2500MHz • 2690MHz• 2570 • 2620

Band 7 DLBand 38

L i teP o i n t C on f i d e n t i a l© 2013 L i t eP o in t , A Te r ad yn e C om pan y. A l l r i gh t s r e se r ved .

LTE Test Challenges

OFDMA Highlights

LTE uses OFDMA for the downlink • Uses a large number of narrow sub-carriers for

multi-carrier transmission

• Robustness to multipath fading and interference

• “Resource blocks” and “elements”- Each resource block and element is defined in “frequency” - Each resource block and element is defined in “frequency”

and “time” (1 block = 180 kHz; 0.5 ms)

- Dynamically assigns these resource blocks to LTE users, thus improving spectrum utilization

- Subcarrier spacing – 15 kHz compared to 312.5 kHz for WLAN

•7

The basic LTE physical resource can be seen as a time-frequency grid:

New Challenges in LTE – More Bands

• More bands to test: > 40 bands

Band Frequency Range

ChannelBandwidths

Mode

1 to 17 < 2.7 GHz1.4, 3, 5, 10, 15, 20 MHz

FDD1 to 17 < 2.7 GHz15, 20 MHz

FDD

33 to 43 <3.8 GHz1.4, 3, 5, 10, 15, 20 MHz

TDD

More bands means more test time

•8

New Challenges in LTE – More Configurations

• LTE has many configurations to test – more test time- Per channel…

Modulation RB Config PWR Levels

QPSK 50,0 4

QPSK 12,0 4

QPSK 12,38 2

QPSK 1,0 1

QPSK 1,24 1

•9

LTE threatens to reduce test throughput… Higher cost test?

QPSK 1,24 1

QPSK 1,49 1

16 QAM 50,0 2

16 QAM 12,38 2

16 QAM 12,0 2

16 QAM 50,0 1

64 QAM 50,0 1

6.5.2.1 EVMTest Parameters for Channel Bandwidths

Downlink Configuration Uplink ConfigurationCh BW N/A for PUSCH EVM testing Mod'n RB allocation

FDD TDD1.4MHz QPSK 6 61.4MHz QPSK 1 11.4MHz 16QAM 6 61.4MHz 16QAM 1 13MHz QPSK 15 153MHz QPSK 4 43MHz 16QAM 15 153MHz 16QAM 4 45MHz QPSK 25 255MHz QPSK 8 85MHz 16QAM 25 255MHz 16QAM 8 8

10MHz QPSK 50 5010MHz QPSK 12 12

10MHz 16QAM50

(Note 3)50

(Note 3)10MHz 16QAM 12 1215MHz QPSK 75 75

10

Target power 24 -36.8 24 -36.8 24 -36.8 24 -36.8 24 -36.8 24 36 .8

Modulation QPSK QPSK 16QAM16QAM QPSK QPSK 16QAM16QAM QPSK Q PSK 16QAM16QAM

number RB 50 50 50 50 12 12 12 12 12 12 12 12

RB offset 0 0 0 0 0 0 0 0 38 38 38 38

15MHz QPSK 75 7515MHz QPSK 16 16

15MHz 16QAM75

(Note 3)75

(Note 3)15MHz 16QAM 16 1620MHz QPSK 100 10020MHz QPSK 18 18

20MHz 16QAM100

(Note 3)100

(Note 3)20MHz 16QAM 18 18

Building a LTE Verification PlanVerification Plan

(Take 3GPP as an example)

LTE TX Verification Test Plan AnalysisHow well did we do?

Test Configuration

• Provides good test coverage

- Min / max RB allocations

- Min / max modulation rates

- Min / max power

- Checks variation across the channel

•12

Parameters 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21TX Power +23 +23 +23 +23 +3.2 -30 -40 +23 +3.2 -30 -40 +23 -40 +6.4 -5.6 +23 -40 +23 -40 +23 -40Modulation QPSK QPSK QPSK QPSK QPSK QPSK QPSK QPSK QPSK QPSK QPSK QPSK QPSK QPSK QPSK 16QAM 16QAM 16QAM 16QAM 16QAM 16QAMRB 1 1 1 1 12 12 12 12 12 12 12 50 50 50 50 12 12 12 12 50 50RB Offset 0 24 49 0 0 0 0 38 38 38 38 0 0 0 0 0 0 38 38 0 0DL Power -57 -57 -57 -57 -57 -57 -57 -57 -57 -57 -57 -57 -57 -57 -57 -57 -57 -57 -57 -57 -57Measurements 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21PowerEVMEVM FlatnessFrequency AccuracyCarrier FeedthroughTX Time MaskOccupied BandwidthACLRSEMIn-Band Emissions for Non-Allocated RBs

Test Configuration

L i teP o i n t C on f i d e n t i a l© 2013 L i t eP o in t , A Te r ad yn e C om pan y. A l l r i gh t s r e se r ved .

LitePoint Multi-DUT DVT Verification Solution

LitePoint Delivers Complete ODM/OEM Test Solutions for System Level Test

• Chipset tool for Cal+Ver• IQVector DVT + IQRamp

Cellular DVT

• IQeasyRF

Debugging

ODM/OEM R&D Tool

141

• IQVector + IQRampSample

Run

• IQVector / chipset multi-dut test

Mass Production

Manufacturing Tool

Cellular R&D Development Cycle Time Improvement•Full technologies

•Full channel / power level testing

•High / normal / low voltage

•High / low temperature

•Serial Tester •GSM/EDGE •WCDMA

•LTE•LTE

GPS/GNSSGPS/GNSS

•GSM•GSM

•Serial testing requires long test times•WCDMA•WCDMA

•Traditional approaches test multiple radios

serially (“one at a time”)

•LTE •GPS/GNSS

4 ~ 8 wks DVT testing

(Signaling tester)

15

•Serial Tester •GSM/EDGE

•Test time

•WCDMA

•Non-signaling +Multi-Dut + IQRamp

•Significantly reduces test time

•- up to 50% (1 ~2 wks DVT testing )

•Test time

•LTE•LTE

•GPS/GNSS•GPS/GNSS

•GSM•GSM

•WCDMA®•WCDMA®

IQxtream offers multi-Dut testing

of multiple radios

•LTE •GPS/GNSS

•GSM/EDGE •WCDMA •LTE •GPS/GNSS X 4

Next build

Next build

•IQvector Test Plan Editor

•IQvector Multi-DUT Verification TEST

•Use IQRamp to Quickly Analyze and

Plot Data

IQVector Speed up Design Validation and Test Engineering

16

•LitePoint provides the most integrated, simplest, rugged multi-DUT solutions available

IQeasy enables Fastest to do RF measurement for Different Chipset Solutions

•Providing the Simple instrument settingsChipset toolsQualcomm QRCT

MTK Meta Maui

•Use our test instruments without any efforts to understand other

•17

IQeasy Test _ Modules Dut _ Controls

understand other chipset solutions.

LTE Carrier Aggregation Test(what does this mean for Test)(what does this mean for Test)

• Intra-band, contiguous channels:

• Intra-band, non-contiguous channels:

Types of LTE Carrier Aggregation

• Carrier 1• Carrier 2

• Inter-band, non-contiguous channels:

• Carrier 1 • Carrier 2

• 1st Band • 2nd Band• …

• Carrier 1 • Carrier 2

LTE Carrier Aggregation Deployments

• Deployments planned for Inter-band, Intra-band contiguous, & Intra-band non-contiguous carrier aggregation:- Varies by cellular carrier and spectrum availability

• Source: Qualcomm, Feb 2014, “LTE Advanced-Evolving and expanding into new frontiers”

LTE Categories, Carrier Aggregation, & MIMO

• Multiple dimensions to achieve LTE UE category data rates:• Inter-band Carrier Aggregation (bandwidth)

• Pro: Typically easier for carrier to deploy

• Con: More complexity for the UE

• MIMO (spatial multiplexing)

• Pro: Re-uses existing spectrum

• Con: Physical limitations to max MIMO due to UE size

Example:150.8 Mbps DL can be achieved with:• One 20 MHz carrier, or• Inter-band Carrier Aggregation

(10 MHz + 10 MHz)

3GPP Release

UE Category

Max DL Data Rate

Max UL Data Rate

Max DL MIMO

Carrier Aggregation?

Release 8 Cat 1 10.3 Mbps 5.2 Mbps 1 None

Release 8 Cat 2 51 Mbps 25.5 Mbps 2 None

Release 8 Cat 3 102 Mbps 51 Mbps 2 None

Release 8 Cat 4 150.8 Mbps 51 Mbps 2 None or Inter-band

Release 8 Cat 5 299.6 Mbps 75.4 Mbps 4 Inter-band or Intra-band

Release 10 Cat 6 301.5 Mbps 51 Mbps 2 or 4 Inter-band or Intra-band

Release 10 Cat 7 301.5 Mbps 102 Mbps 2 or 4 Inter-band or Intra-band

Release 10 Cat 8 2998.6 Mbps 1497.8 Mbps 8 Inter-band or Intra-band

Release 11 Cat 9 452 Mbpbs 51 Mbps 2 or 4 Inter-band or Intra-band

Carrier Aggregation and Chipsets

• Multiple chipset companies have products (or product announcements) for carrier aggregation:

• LTE Category 6:

• MDM9x35 • XMM7260

• LTE Category 4:

• FourGee-3802

• GDM7243Q

� Data as of May 2014

• i500 SDR

Carrier Aggregation: What Does this Mean for Test?

• Carrier aggregation is primarily a downlink discussion

- UE data traffic tends to be dominated by the downlink

- Spectrum availability limits intra-band deployment, particularly for non-contiguousparticularly for non-contiguous

- Multiple, simultaneous uplinks would requiremultiple power amplifiers (reducing battery life)

• Result is that, today, carrier aggregation drives additional RX testing , little change to TX testing

• DL1

• DL2

• UL

Carrier Aggregation Test Requirements:

• Uses standard multi-DUT Test Configuration• Requirements:

- Up to 100 MHz VSA / VSG bandwidth- LTE-Advanced signal generation & analysis

• Minimal impact to overall test time (dictated by # of test configurations)

• Case #1: Intra-Band Carrier Aggregation (Contiguous & Non-Contiguous)

• IQxstream LTE-Advanced Analysis Module • Standard Multi-DUT Test Configuration

• 20 MHz + 20 MHz

• 10 MHz + 10 MHz

• Contiguous

• Non-contiguous

Carrier Aggregation Test Requirements:

• Inter-band Configuration #1:- Use standard LTE Test Configuration

- Serially test two DL streams- Test time impact: longer RX test times

• Inter-band Configuration #2:

• Case #2: Inter-Band Carrier Aggregation

• Standard Multi-DUT Test Configuration

• Inter-band Configuration #2:

- Use parallel RX Configuration

- Test two DL streams in parallel (requires non-signaling chipset driver support)

- Test time impact: minimal impact, same asbefore carrier aggregation

• “Parallel RX” Multi-DUT Test Configuration

• 1st Band • 2nd Band• …

Carrier Aggregation Summary

• Chipset companies are developing for all carrier aggregation types:- Inter-band, Intra-band contiguous, Intra-band non-contiguous

• There are multiple methods for LTE to achieve UE categories:- Channel bandwidth, Carrier Aggregation, MIMO- Actual deployment depends on cellular carrier and spectrum availability

• Today, the biggest impact on test is on the UE downlink, primarily driven by inter-band carrier aggregation:- Board level (PCBA) test:

Today, limited capability in non-signaling chipset drivers – serial inter-band CA testParallel RX test would shorten inter-band carrier aggregation test times

- End-product level test:Requires a “user experience” check to verify end-to-end data throughput

Thank You!

271qwern b `

Thank You!