40
Microstructural Characterization Microstructural Characterization of of Materials Materials Eun Eun Soo Soo Park Park Office: 33-316 Telephone: 880-7221 Email: [email protected] Office hours: by an appointment 2009 spring 04. 29. 2009

Microstructural Characterizationocw.snu.ac.kr/sites/default/files/NOTE/5284.pdfMicrostructural Characterization of Materials Eun Soo Park Office: 33-316 Telephone: 880-7221 Email:

  • Upload
    others

  • View
    0

  • Download
    0

Embed Size (px)

Citation preview

Page 1: Microstructural Characterizationocw.snu.ac.kr/sites/default/files/NOTE/5284.pdfMicrostructural Characterization of Materials Eun Soo Park Office: 33-316 Telephone: 880-7221 Email:

Microstructural CharacterizationMicrostructural Characterizationof of

MaterialsMaterials

EunEun SooSoo ParkPark

Office: 33-316 Telephone: 880-7221Email: [email protected] hours: by an appointment

2009 spring

04. 29. 2009

Page 2: Microstructural Characterizationocw.snu.ac.kr/sites/default/files/NOTE/5284.pdfMicrostructural Characterization of Materials Eun Soo Park Office: 33-316 Telephone: 880-7221 Email:

제동복사 [制動輻射]전자기 이론에 따르면 가속이나 감속되는 전자는 전자기파를 발생 시킨다. 빠르게 움직이던 전자가 금속 등에 부딛쳐 갑자기 멈추면감속이있다. 이처럼 빠르게 움직이던 전자가멈출 때 발생하는 복사가 제동복사이다.

Page 3: Microstructural Characterizationocw.snu.ac.kr/sites/default/files/NOTE/5284.pdfMicrostructural Characterization of Materials Eun Soo Park Office: 33-316 Telephone: 880-7221 Email:
Page 4: Microstructural Characterizationocw.snu.ac.kr/sites/default/files/NOTE/5284.pdfMicrostructural Characterization of Materials Eun Soo Park Office: 33-316 Telephone: 880-7221 Email:
Page 5: Microstructural Characterizationocw.snu.ac.kr/sites/default/files/NOTE/5284.pdfMicrostructural Characterization of Materials Eun Soo Park Office: 33-316 Telephone: 880-7221 Email:

TEM ConstructionCross-sectional view of CM12

Electron Source

High voltage insulation

Plus many moreElectromagnetic lens…Apertures...

Electro-magnetic lens

Sample loadlock

Image recording system

Energetic electron to visible light conversion

Page 6: Microstructural Characterizationocw.snu.ac.kr/sites/default/files/NOTE/5284.pdfMicrostructural Characterization of Materials Eun Soo Park Office: 33-316 Telephone: 880-7221 Email:

Functional Principle

Page 7: Microstructural Characterizationocw.snu.ac.kr/sites/default/files/NOTE/5284.pdfMicrostructural Characterization of Materials Eun Soo Park Office: 33-316 Telephone: 880-7221 Email:

Functional Principle

Page 8: Microstructural Characterizationocw.snu.ac.kr/sites/default/files/NOTE/5284.pdfMicrostructural Characterization of Materials Eun Soo Park Office: 33-316 Telephone: 880-7221 Email:

Functional Principle

Page 9: Microstructural Characterizationocw.snu.ac.kr/sites/default/files/NOTE/5284.pdfMicrostructural Characterization of Materials Eun Soo Park Office: 33-316 Telephone: 880-7221 Email:

Functional Principle

Page 10: Microstructural Characterizationocw.snu.ac.kr/sites/default/files/NOTE/5284.pdfMicrostructural Characterization of Materials Eun Soo Park Office: 33-316 Telephone: 880-7221 Email:

Image and Diffraction

Diffraction Pattern(Fourier transformation

of periodic object)

Image(Selected diffraction

planes)

degreewhere 5.0 ,sin2 <= BBd θθλ

• Diffraction occurs from the planes nearly parallel to the beam direction

Page 11: Microstructural Characterizationocw.snu.ac.kr/sites/default/files/NOTE/5284.pdfMicrostructural Characterization of Materials Eun Soo Park Office: 33-316 Telephone: 880-7221 Email:
Page 12: Microstructural Characterizationocw.snu.ac.kr/sites/default/files/NOTE/5284.pdfMicrostructural Characterization of Materials Eun Soo Park Office: 33-316 Telephone: 880-7221 Email:

Work Function: WFWork Function: WF

W.F 낮을 수록 전자방출이 쉽다

W.F 낮은 금속: 원자반경(atomic radius)이 크다

결정구조에서 원자간 간격이 크다

: 전자가 금속표면을 탈출할 때

넘어야 하는 potential energy(V)

04. 13. 2009

Page 13: Microstructural Characterizationocw.snu.ac.kr/sites/default/files/NOTE/5284.pdfMicrostructural Characterization of Materials Eun Soo Park Office: 33-316 Telephone: 880-7221 Email:
Page 14: Microstructural Characterizationocw.snu.ac.kr/sites/default/files/NOTE/5284.pdfMicrostructural Characterization of Materials Eun Soo Park Office: 33-316 Telephone: 880-7221 Email:
Page 15: Microstructural Characterizationocw.snu.ac.kr/sites/default/files/NOTE/5284.pdfMicrostructural Characterization of Materials Eun Soo Park Office: 33-316 Telephone: 880-7221 Email:
Page 16: Microstructural Characterizationocw.snu.ac.kr/sites/default/files/NOTE/5284.pdfMicrostructural Characterization of Materials Eun Soo Park Office: 33-316 Telephone: 880-7221 Email:
Page 17: Microstructural Characterizationocw.snu.ac.kr/sites/default/files/NOTE/5284.pdfMicrostructural Characterization of Materials Eun Soo Park Office: 33-316 Telephone: 880-7221 Email:
Page 18: Microstructural Characterizationocw.snu.ac.kr/sites/default/files/NOTE/5284.pdfMicrostructural Characterization of Materials Eun Soo Park Office: 33-316 Telephone: 880-7221 Email:

Field emission of electronField emission of electron

Schematic view

W 원자의 가장 높은 궤도의 전자들은 실온에서 energy barrier를 넘기 힘들다.

그러나 금속이 강한 전기장(electric field) 이 놓이면 궤도전자들은 potential barrier energy를 통해 tunneling해서 금속 표면에서 방출된다.

Page 19: Microstructural Characterizationocw.snu.ac.kr/sites/default/files/NOTE/5284.pdfMicrostructural Characterization of Materials Eun Soo Park Office: 33-316 Telephone: 880-7221 Email:

Flashing (burn out) 필요:

advantages: small spot size (1-2nm) high resolution

low ΔE improving of low volt. Operation.

tip 수명 단축

Page 20: Microstructural Characterizationocw.snu.ac.kr/sites/default/files/NOTE/5284.pdfMicrostructural Characterization of Materials Eun Soo Park Office: 33-316 Telephone: 880-7221 Email:

(larger ΔE)

: flat emitting area on <100> facet

advantages: No flashing, brightness is similar to cold FE

Page 21: Microstructural Characterizationocw.snu.ac.kr/sites/default/files/NOTE/5284.pdfMicrostructural Characterization of Materials Eun Soo Park Office: 33-316 Telephone: 880-7221 Email:

Electron sources

W

LaB6

FEG

Page 22: Microstructural Characterizationocw.snu.ac.kr/sites/default/files/NOTE/5284.pdfMicrostructural Characterization of Materials Eun Soo Park Office: 33-316 Telephone: 880-7221 Email:
Page 23: Microstructural Characterizationocw.snu.ac.kr/sites/default/files/NOTE/5284.pdfMicrostructural Characterization of Materials Eun Soo Park Office: 33-316 Telephone: 880-7221 Email:

(1)

(2)

(3)(4)

Page 24: Microstructural Characterizationocw.snu.ac.kr/sites/default/files/NOTE/5284.pdfMicrostructural Characterization of Materials Eun Soo Park Office: 33-316 Telephone: 880-7221 Email:

발산

수렴

Page 25: Microstructural Characterizationocw.snu.ac.kr/sites/default/files/NOTE/5284.pdfMicrostructural Characterization of Materials Eun Soo Park Office: 33-316 Telephone: 880-7221 Email:

(Electron Energy Loss Spectroscopy)

Page 26: Microstructural Characterizationocw.snu.ac.kr/sites/default/files/NOTE/5284.pdfMicrostructural Characterization of Materials Eun Soo Park Office: 33-316 Telephone: 880-7221 Email:
Page 27: Microstructural Characterizationocw.snu.ac.kr/sites/default/files/NOTE/5284.pdfMicrostructural Characterization of Materials Eun Soo Park Office: 33-316 Telephone: 880-7221 Email:
Page 28: Microstructural Characterizationocw.snu.ac.kr/sites/default/files/NOTE/5284.pdfMicrostructural Characterization of Materials Eun Soo Park Office: 33-316 Telephone: 880-7221 Email:
Page 29: Microstructural Characterizationocw.snu.ac.kr/sites/default/files/NOTE/5284.pdfMicrostructural Characterization of Materials Eun Soo Park Office: 33-316 Telephone: 880-7221 Email:

굴곡

Page 30: Microstructural Characterizationocw.snu.ac.kr/sites/default/files/NOTE/5284.pdfMicrostructural Characterization of Materials Eun Soo Park Office: 33-316 Telephone: 880-7221 Email:
Page 31: Microstructural Characterizationocw.snu.ac.kr/sites/default/files/NOTE/5284.pdfMicrostructural Characterization of Materials Eun Soo Park Office: 33-316 Telephone: 880-7221 Email:
Page 32: Microstructural Characterizationocw.snu.ac.kr/sites/default/files/NOTE/5284.pdfMicrostructural Characterization of Materials Eun Soo Park Office: 33-316 Telephone: 880-7221 Email:
Page 33: Microstructural Characterizationocw.snu.ac.kr/sites/default/files/NOTE/5284.pdfMicrostructural Characterization of Materials Eun Soo Park Office: 33-316 Telephone: 880-7221 Email:
Page 34: Microstructural Characterizationocw.snu.ac.kr/sites/default/files/NOTE/5284.pdfMicrostructural Characterization of Materials Eun Soo Park Office: 33-316 Telephone: 880-7221 Email:
Page 35: Microstructural Characterizationocw.snu.ac.kr/sites/default/files/NOTE/5284.pdfMicrostructural Characterization of Materials Eun Soo Park Office: 33-316 Telephone: 880-7221 Email:
Page 36: Microstructural Characterizationocw.snu.ac.kr/sites/default/files/NOTE/5284.pdfMicrostructural Characterization of Materials Eun Soo Park Office: 33-316 Telephone: 880-7221 Email:
Page 37: Microstructural Characterizationocw.snu.ac.kr/sites/default/files/NOTE/5284.pdfMicrostructural Characterization of Materials Eun Soo Park Office: 33-316 Telephone: 880-7221 Email:
Page 38: Microstructural Characterizationocw.snu.ac.kr/sites/default/files/NOTE/5284.pdfMicrostructural Characterization of Materials Eun Soo Park Office: 33-316 Telephone: 880-7221 Email:
Page 39: Microstructural Characterizationocw.snu.ac.kr/sites/default/files/NOTE/5284.pdfMicrostructural Characterization of Materials Eun Soo Park Office: 33-316 Telephone: 880-7221 Email:
Page 40: Microstructural Characterizationocw.snu.ac.kr/sites/default/files/NOTE/5284.pdfMicrostructural Characterization of Materials Eun Soo Park Office: 33-316 Telephone: 880-7221 Email: