Pruebas Omicron Cmc Rele Ref615 51-51n

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Pruebas Omicron Cmc Rele Ref615 51-51n

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  • REPORTE DE PRUEBA

    RELE DE SOBRECORRIENTEABB REF615

    Proteccion : Sobrecorrientes de Fases y TierraIdentificacion del Rel : ABB REF615Fecha de Prueba : FechaFunciones Probadas : [50/51], [50G/51G]Estado de Prueba : Aprobado ________________________________________________________________________________

    Hardware Configuration

    Test EquipmentType Serial NumberCMC256-6 JG754S

    Hardware CheckPerformed At Result Details9/26/2015 2:33:27 PM Passed

  • 1) [INY] INYECCION INICIAL

    Test ModuleName: OMICRON QuickCMC Version: 3.00 Test Start: 26-Sep-2015 14:33:39 Test End: 26-Sep-2015 14:37:50User Name: Heriber Huerta Lopez Manager: Jose Aguila V.Company: INGELMEC S.A.

    Test Results

    Title: INYECCION INICIAL

    Fault Calculator:Table Inputmode Parameters (All values are secondary)Direct V L1-E 0.000 V 0.00 60.000 Hz

    V L2-E 0.000 V -120.00 60.000 HzV L3-E 0.000 V 120.00 60.000 HzI L1 1.000 A 0.00 60.000 HzI L2 1.000 A -120.00 60.000 HzI L3 1.000 A 120.00 60.000 Hz

    Generator SettingsV L1-E 0.000V 0.00 +90

    -90

    180 0

    1.0 A115.5 V

    I L3

    I L2

    I L1

    V L2-E 0.000V -120.00V L3-E 0.000V 120.00I L1 1.000A 0.00I L2 1.000A -120.00I L3 1.000A 120.00

    Binary InputsTrip Start Overload0 0 0

    Summary1 tests passed, 0 tests failed, 0 tests not assessed 100.00% passedTest passed

  • LECTURAS REGISTRADAS EN EL RELE

  • 2) [50/51] SOBRECORRIENTE DE FASES 13.8KV

    2.1) [50/51] Arranque L1L2L3:

    Ramp StatesRamp Ramp 1 Ramp 2V L1-E 0.000 V 0.000 V

    0.00 0.00 60.000 Hz 60.000 Hz

    V L2-E 0.000 V 0.000 V-120.00 -120.00 60.000 Hz 60.000 Hz

    V L3-E 0.000 V 0.000 V120.00 120.00 60.000 Hz 60.000 Hz

    I L1 2.800 A 3.200 A0.00 0.00 60.000 Hz 60.000 Hz

    I L2 2.800 A 3.200 A-120.00 -120.00 60.000 Hz 60.000 Hz

    I L3 2.800 A 3.200 A120.00 120.00 60.000 Hz 60.000 Hz

    Force abs. Phases Yes NoSig 1 From 2.800 A 3.200 ASig 1 To 3.200 A 2.800 ASig 1 Delta 5.000 mA -5.000 mASig 1 d/dt 50.00 mA/s -50.00 mA/sdt per Step 100.0 ms 100.0 msRamp Steps 81 81Ramp Time 8.100s 8.100sTrigger None NoneTrigger LogicTripStartStep back No NoDelay Time 0.000 s 0.000 s

    Test ModuleName: OMICRON Ramping Version: 3.00 Test Start: 26-Sep-2015 14:41:29 Test End: 26-Sep-2015 14:41:49User Name: Heriber Huerta Lopez Manager: Jose Aguila V.Company: INGELMEC S.A.

    Test Results

    Assessment ResultsName/ Exec. Ramp Condition Sig Nom. Act. Tol.- Tol.+ Dev. Assess TactPick-up Ramp 1 Start 0->1 I L1, L2,

    L33.000 A 2.995 A 100.0 mA 100.0 mA -5.000 mA + 28.70 ms

    Drop-off Ramp 2 Start 1->0 I L1, L2, L3

    2.850 A 2.875 A 100.0 mA 100.0 mA 25.00 mA + 26.60 ms

    Assess: + .. Passed x .. Failed o .. Not assessed

  • Ramp 2Ramp 1

    I L1, L2, L3

    t/s2 4 6 8 10 12 14

    Sig 1/A

    2.80

    2.85

    2.90

    2.95

    3.00

    3.05

    3.10

    3.15

    t/s2 4 6 8 10 12 14

    StartTrip

    Test State:Test passed

  • 2.2) [50/51] Tiempos de Operacion L1L2L3:Test Object - Overcurrent Parameters

    General - Values:TimeTolAbs: 0.10 s VT connection: At protected objectTimeTolRel: 10.00 % CT starpoint connection: To protected objectCurrentTolAbs: 0.10 IrefCurrentTolRel: 5.00 %Directional: No

    Elements - Phase:Active Name Tripping characteristic I Pick-up Time Reset Ratio DirectionYes I> IEC Very Inverse 0.60 Iref 0.20 0.95 Non Directional

    Elements - Residual:Active Name Tripping characteristic I Pick-up Time Reset Ratio DirectionYes I #1 Residual IEC Normal Inverse 0.20 Iref 0.10 0.95 Non Directional

    Elements - Zero Sequence:Active Name Tripping characteristic I Pick-up Time Reset Ratio DirectionYes I #1 Zero sequence IEC Normal Inverse 0.20 Iref 0.10 0.95 Non Directional

    Test ModuleName: OMICRON Overcurrent Version: 3.00 Test Start: 26-Sep-2015 14:46:48 Test End: 26-Sep-2015 14:47:11User Name: Heriber Huerta Lopez Manager: Jose Aguila V.Company: INGELMEC S.A.

    Shot Test Results:Type Relative To Factor Magnitude Angle tnom tact Overload ResultL1-L2-L3 (---) n/a 4.00 A n/a 8.100 s 8.033 s No PassedL1-L2-L3 (---) n/a 8.00 A n/a 1.620 s 1.621 s No PassedL1-L2-L3 (---) n/a 12.00 A n/a 900.0 ms 905.1 ms No PassedL1-L2-L3 (---) n/a 16.00 A n/a 623.1 ms 630.8 ms No PassedL1-L2-L3 (---) n/a 20.00 A n/a 476.5 ms 486.6 ms No PassedL1-L2-L3 (---) n/a 24.00 A n/a 385.7 ms 395.7 ms No Passed

    Charts for Fault Types:Type Angle L1-L2-L3 n/a

    I/A

    3 4 5 6 7 8 9 10 20 30 40 50 60

    t/s

    0.10

    1.00

    10.00

    100.00

    1000.00

    10000.00

    State:6 out of 6 points tested.6 points passed.0 points failed.

    General Assessment: Test passed!

  • 2.3) [50/51] Tiempos de Operacion L1L2:Test Object - Overcurrent Parameters

    General - Values:TimeTolAbs: 0.10 s VT connection: At protected objectTimeTolRel: 10.00 % CT starpoint connection: To protected objectCurrentTolAbs: 0.10 IrefCurrentTolRel: 5.00 %Directional: No

    Elements - Phase:Active Name Tripping characteristic I Pick-up Time Reset Ratio DirectionYes I> IEC Very Inverse 0.60 Iref 0.20 0.95 Non Directional

    Elements - Residual:Active Name Tripping characteristic I Pick-up Time Reset Ratio DirectionYes I #1 Residual IEC Normal Inverse 0.20 Iref 0.10 0.95 Non Directional

    Elements - Zero Sequence:Active Name Tripping characteristic I Pick-up Time Reset Ratio DirectionYes I #1 Zero sequence IEC Normal Inverse 0.20 Iref 0.10 0.95 Non Directional

    Test ModuleName: OMICRON Overcurrent Version: 3.00 Test Start: 26-Sep-2015 14:47:17 Test End: 26-Sep-2015 14:47:41User Name: Heriber Huerta Lopez Manager: Jose Aguila V.Company: INGELMEC S.A.

    Shot Test Results:Type Relative To Factor Magnitude Angle tnom tact Overload ResultL1-L2 (---) n/a 4.00 A n/a 8.100 s 8.045 s No PassedL1-L2 (---) n/a 8.00 A n/a 1.620 s 1.621 s No PassedL1-L2 (---) n/a 12.00 A n/a 900.0 ms 903.8 ms No PassedL1-L2 (---) n/a 16.00 A n/a 623.1 ms 634.4 ms No PassedL1-L2 (---) n/a 20.00 A n/a 476.5 ms 488.5 ms No PassedL1-L2 (---) n/a 24.00 A n/a 385.7 ms 398.0 ms No Passed

    Charts for Fault Types:Type Angle L1-L2 n/a

    I/A

    3 4 5 6 7 8 9 10 20 30 40 50 60

    t/s

    0.10

    1.00

    10.00

    100.00

    1000.00

    10000.00

    State:6 out of 6 points tested.6 points passed.0 points failed.

    General Assessment: Test passed!

  • 2.4) [50/51] Tiempos de Operacion L2L3:Test Object - Overcurrent Parameters

    General - Values:TimeTolAbs: 0.10 s VT connection: At protected objectTimeTolRel: 10.00 % CT starpoint connection: To protected objectCurrentTolAbs: 0.10 IrefCurrentTolRel: 5.00 %Directional: No

    Elements - Phase:Active Name Tripping characteristic I Pick-up Time Reset Ratio DirectionYes I> IEC Very Inverse 0.60 Iref 0.20 0.95 Non Directional

    Elements - Residual:Active Name Tripping characteristic I Pick-up Time Reset Ratio DirectionYes I #1 Residual IEC Normal Inverse 0.20 Iref 0.10 0.95 Non Directional

    Elements - Zero Sequence:Active Name Tripping characteristic I Pick-up Time Reset Ratio DirectionYes I #1 Zero sequence IEC Normal Inverse 0.20 Iref 0.10 0.95 Non Directional

    Test ModuleName: OMICRON Overcurrent Version: 3.00 Test Start: 26-Sep-2015 14:47:48 Test End: 26-Sep-2015 14:48:11User Name: Heriber Huerta Lopez Manager: Jose Aguila V.Company: INGELMEC S.A.

    Shot Test Results:Type Relative To Factor Magnitude Angle tnom tact Overload ResultL2-L3 (---) n/a 4.00 A n/a 8.100 s 8.050 s No PassedL2-L3 (---) n/a 8.00 A n/a 1.620 s 1.621 s No PassedL2-L3 (---) n/a 12.00 A n/a 900.0 ms 905.0 ms No PassedL2-L3 (---) n/a 16.00 A n/a 623.1 ms 636.0 ms No PassedL2-L3 (---) n/a 20.00 A n/a 476.5 ms 484.5 ms No PassedL2-L3 (---) n/a 24.00 A n/a 385.7 ms 395.6 ms No Passed

    Charts for Fault Types:Type Angle L2-L3 n/a

    I/A

    3 4 5 6 7 8 9 10 20 30 40 50 60

    t/s

    0.10

    1.00

    10.00

    100.00

    1000.00

    10000.00

    State:6 out of 6 points tested.6 points passed.0 points failed.

    General Assessment: Test passed!

  • 2.5) [50/51] Tiempos de Operacion L3L1:Test Object - Overcurrent Parameters

    General - Values:TimeTolAbs: 0.10 s VT connection: At protected objectTimeTolRel: 10.00 % CT starpoint connection: To protected objectCurrentTolAbs: 0.10 IrefCurrentTolRel: 5.00 %Directional: No

    Elements - Phase:Active Name Tripping characteristic I Pick-up Time Reset Ratio DirectionYes I> IEC Very Inverse 0.60 Iref 0.20 0.95 Non Directional

    Elements - Residual:Active Name Tripping characteristic I Pick-up Time Reset Ratio DirectionYes I #1 Residual IEC Normal Inverse 0.20 Iref 0.10 0.95 Non Directional

    Elements - Zero Sequence:Active Name Tripping characteristic I Pick-up Time Reset Ratio DirectionYes I #1 Zero sequence IEC Normal Inverse 0.20 Iref 0.10 0.95 Non Directional

    Test ModuleName: OMICRON Overcurrent Version: 3.00 Test Start: 26-Sep-2015 14:48:18 Test End: 26-Sep-2015 14:48:41User Name: Heriber Huerta Lopez Manager: Jose Aguila V.Company: INGELMEC S.A.

    Shot Test Results:Type Relative To Factor Magnitude Angle tnom tact Overload ResultL3-L1 (---) n/a 4.00 A n/a 8.100 s 8.043 s No PassedL3-L1 (---) n/a 8.00 A n/a 1.620 s 1.622 s No PassedL3-L1 (---) n/a 12.00 A n/a 900.0 ms 905.5 ms No PassedL3-L1 (---) n/a 16.00 A n/a 623.1 ms 632.9 ms No PassedL3-L1 (---) n/a 20.00 A n/a 476.5 ms 486.1 ms No PassedL3-L1 (---) n/a 24.00 A n/a 385.7 ms 392.4 ms No Passed

    Charts for Fault Types:Type Angle L3-L1 n/a

    I/A

    3 4 5 6 7 8 9 10 20 30 40 50 60

    t/s

    0.10

    1.00

    10.00

    100.00

    1000.00

    10000.00

    State:6 out of 6 points tested.6 points passed.0 points failed.

    General Assessment: Test passed!

  • 3) [50G/51G] SOBRECORRIENTE DE TIERRA 13.8KV

    3.1) [50G/51G] Arranque L1-E:

    Ramp StatesRamp Ramp 1 Ramp 2V L1-E 0.000 V 0.000 V

    0.00 0.00 60.000 Hz 60.000 Hz

    V L2-E 0.000 V 0.000 V-120.00 -120.00 60.000 Hz 60.000 Hz

    V L3-E 0.000 V 0.000 V120.00 120.00 60.000 Hz 60.000 Hz

    I L1 800.0 mA 1.100 A0.00 0.00 60.000 Hz 60.000 Hz

    I L2 0.000 A 0.000 A-120.00 -120.00 60.000 Hz 60.000 Hz

    I L3 0.000 A 0.000 A120.00 120.00 60.000 Hz 60.000 Hz

    Force abs. Phases Yes NoSig 1 From 800.0 mA 1.100 ASig 1 To 1.100 A 800.0 mASig 1 Delta 5.000 mA -5.000 mASig 1 d/dt 50.00 mA/s -50.00 mA/sdt per Step 100.0 ms 100.0 msRamp Steps 61 61Ramp Time 6.100s 6.100sTrigger None NoneTrigger LogicTripStartStep back No NoDelay Time 0.000 s 0.000 s

    Test ModuleName: OMICRON Ramping Version: 3.00 Test Start: 26-Sep-2015 14:50:05 Test End: 26-Sep-2015 14:50:22User Name: Heriber Huerta Lopez Manager: Jose Aguila V.Company: INGELMEC S.A.

    Test Results

    Assessment ResultsName/ Exec. Ramp Condition Sig Nom. Act. Tol.- Tol.+ Dev. Assess TactPick-up Ramp 1 Start 0->1 I L1 1.000 A 1.000 A 50.00 mA 50.00 mA 0.000 A + 29.60 msDrop-off Ramp 2 Start 1->0 I L1 950.0 mA 955.0 mA 50.00 mA 50.00 mA 5.000 mA + 8.600 msAssess: + .. Passed x .. Failed o .. Not assessed

  • Ramp 2Ramp 1

    I L1

    t/s1 2 3 4 5 6 7 8 9 10 11

    Sig 1/A

    0.8000.8250.8500.8750.9000.9250.9500.9751.0001.0251.050

    t/s1 2 3 4 5 6 7 8 9 10 11

    StartTrip

    Test State:Test passed

  • 3.2) [50G/51G] Tiempos de Operacion L1-E:Test Object - Overcurrent Parameters

    General - Values:TimeTolAbs: 0.10 s VT connection: At protected objectTimeTolRel: 10.00 % CT starpoint connection: To protected objectCurrentTolAbs: 0.10 IrefCurrentTolRel: 5.00 %Directional: No

    Elements - Phase:Active Name Tripping characteristic I Pick-up Time Reset Ratio DirectionYes I> IEC Very Inverse 0.60 Iref 0.20 0.95 Non Directional

    Elements - Residual:Active Name Tripping characteristic I Pick-up Time Reset Ratio DirectionYes I #1 Residual IEC Normal Inverse 0.20 Iref 0.10 0.95 Non Directional

    Elements - Zero Sequence:Active Name Tripping characteristic I Pick-up Time Reset Ratio DirectionYes I #1 Zero sequence IEC Normal Inverse 0.20 Iref 0.10 0.95 Non Directional

    Test ModuleName: OMICRON Overcurrent Version: 3.00 Test Start: 26-Sep-2015 14:58:09 Test End: 26-Sep-2015 14:58:26User Name: Heriber Huerta Lopez Manager: Jose Aguila V.Company: INGELMEC S.A.

    Shot Test Results:Type Relative To Factor Magnitude Angle tnom tact Overload ResultL1-E (---) n/a 1.20 A n/a 3.832 s 3.825 s No PassedL1-E (---) n/a 2.40 A n/a 792.6 ms 803.4 ms No PassedL1-E (---) n/a 3.60 A n/a 539.5 ms 547.4 ms No PassedL1-E (---) n/a 4.80 A n/a 439.3 ms 448.3 ms No PassedL1-E (---) n/a 6.00 A n/a 383.7 ms 391.4 ms No PassedL1-E (---) n/a 7.20 A n/a 347.6 ms 352.7 ms No PassedL1-E (---) n/a 8.40 A n/a 322.0 ms 332.4 ms No Passed

    Charts for Fault Types:Type Angle L1-E n/a

    I/A

    0.5 0.7 1.0 2.0 3.0 5.0 7.0 10.0

    t/s

    0.10

    1.00

    10.00

    100.00

    1000.00

    10000.00

    State:7 out of 7 points tested.7 points passed.0 points failed.

    General Assessment: Test passed!

  • 3.3) [50G/51G] Tiempos de Operacion L2-E:Test Object - Overcurrent Parameters

    General - Values:TimeTolAbs: 0.10 s VT connection: At protected objectTimeTolRel: 10.00 % CT starpoint connection: To protected objectCurrentTolAbs: 0.10 IrefCurrentTolRel: 5.00 %Directional: No

    Elements - Phase:Active Name Tripping characteristic I Pick-up Time Reset Ratio DirectionYes I> IEC Very Inverse 0.60 Iref 0.20 0.95 Non Directional

    Elements - Residual:Active Name Tripping characteristic I Pick-up Time Reset Ratio DirectionYes I #1 Residual IEC Normal Inverse 0.20 Iref 0.10 0.95 Non Directional

    Elements - Zero Sequence:Active Name Tripping characteristic I Pick-up Time Reset Ratio DirectionYes I #1 Zero sequence IEC Normal Inverse 0.20 Iref 0.10 0.95 Non Directional

    Test ModuleName: OMICRON Overcurrent Version: 3.00 Test Start: 26-Sep-2015 14:58:33 Test End: 26-Sep-2015 14:58:51User Name: Heriber Huerta Lopez Manager: Jose Aguila V.Company: INGELMEC S.A.

    Shot Test Results:Type Relative To Factor Magnitude Angle tnom tact Overload ResultL2-E (---) n/a 1.20 A n/a 3.832 s 3.830 s No PassedL2-E (---) n/a 2.40 A n/a 792.6 ms 803.1 ms No PassedL2-E (---) n/a 3.60 A n/a 539.5 ms 549.7 ms No PassedL2-E (---) n/a 4.80 A n/a 439.3 ms 446.7 ms No PassedL2-E (---) n/a 6.00 A n/a 383.7 ms 390.7 ms No PassedL2-E (---) n/a 7.20 A n/a 347.6 ms 355.1 ms No PassedL2-E (---) n/a 8.40 A n/a 322.0 ms 330.4 ms No Passed

    Charts for Fault Types:Type Angle L2-E n/a

    I/A

    0.5 0.7 1.0 2.0 3.0 5.0 7.0 10.0

    t/s

    0.10

    1.00

    10.00

    100.00

    1000.00

    10000.00

    State:7 out of 7 points tested.7 points passed.0 points failed.

    General Assessment: Test passed!

  • 3.4) [50G/51G] Tiempos de Operacion L3-E:Test Object - Overcurrent Parameters

    General - Values:TimeTolAbs: 0.10 s VT connection: At protected objectTimeTolRel: 10.00 % CT starpoint connection: To protected objectCurrentTolAbs: 0.10 IrefCurrentTolRel: 5.00 %Directional: No

    Elements - Phase:Active Name Tripping characteristic I Pick-up Time Reset Ratio DirectionYes I> IEC Very Inverse 0.60 Iref 0.20 0.95 Non Directional

    Elements - Residual:Active Name Tripping characteristic I Pick-up Time Reset Ratio DirectionYes I #1 Residual IEC Normal Inverse 0.20 Iref 0.10 0.95 Non Directional

    Elements - Zero Sequence:Active Name Tripping characteristic I Pick-up Time Reset Ratio DirectionYes I #1 Zero sequence IEC Normal Inverse 0.20 Iref 0.10 0.95 Non Directional

    Test ModuleName: OMICRON Overcurrent Version: 3.00 Test Start: 26-Sep-2015 14:58:57 Test End: 26-Sep-2015 14:59:15User Name: Heriber Huerta Lopez Manager: Jose Aguila V.Company: INGELMEC S.A.

    Shot Test Results:Type Relative To Factor Magnitude Angle tnom tact Overload ResultL3-E (---) n/a 1.20 A n/a 3.832 s 3.825 s No PassedL3-E (---) n/a 2.40 A n/a 792.6 ms 804.8 ms No PassedL3-E (---) n/a 3.60 A n/a 539.5 ms 547.5 ms No PassedL3-E (---) n/a 4.80 A n/a 439.3 ms 449.4 ms No PassedL3-E (---) n/a 6.00 A n/a 383.7 ms 392.1 ms No PassedL3-E (---) n/a 7.20 A n/a 347.6 ms 357.1 ms No PassedL3-E (---) n/a 8.40 A n/a 322.0 ms 330.7 ms No Passed

    Charts for Fault Types:Type Angle L3-E n/a

    I/A

    0.5 0.7 1.0 2.0 3.0 5.0 7.0 10.0

    t/s

    0.10

    1.00

    10.00

    100.00

    1000.00

    10000.00

    State:7 out of 7 points tested.7 points passed.0 points failed.

    General Assessment: Test passed!