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UNIVERSITASNEGERI JAKARTA
Pertemuan 14
FISIKA ZAT PADATINTERAKSI ELEKTRON
Iwan Sugihartono, M.SiJurusan FisikaFakultas Matematika dan Ilmu Pengetahuan Alam
OUTLINE Interaksi Elektron
• Inelastic• Elastic
•03/05/23 •© 2010 Universitas Negeri Jakarta | www.unj.ac.id | • 2
Electron InteractionsInelastic collisions1. atomic electrons (ionization & excitation)2. nuclei (bremsstrahlung)
Elastic collisions1. w/ atomic electrons2. w/ nuclei
•03/05/23 •© 2010 Universitas Negeri Jakarta | www.unj.ac.id | •3
Electron Interactions
Collisional (ionization and excitation)• Energy loss electron density (Z/A)
Radiation losses (bremsstrahlung)• Energy loss Energy & Z2
•03/05/23 •© 2010 Universitas Negeri Jakarta | www.unj.ac.id | •4
Electron Interactions
• Mass Stopping Power (S/):
• Rate of energy loss (units: Mev-cm2/g)
• Collision losses (ionization and excitation) & radiation losses (bremsstrahlung):
ρdldΕ ρ
S
rct )ρS( )ρ
S( ) ρS(
•03/05/23 •© 2010 Universitas Negeri Jakarta | www.unj.ac.id | •5
Electron Interactions
• Restricted Mass Stopping Power (L/:
• AKA LET (linear energy transfer) or energy loss per unit path length (for local absorption not radiated away)
ρdldE
ρL
Δ
E
•03/05/23 •© 2010 Universitas Negeri Jakarta | www.unj.ac.id | •6
Electron interactionsAbsorbed dose Fluence
Dose
dE (E) ρL (E)
E D 0
Δ
dEEd
E
)(
•03/05/23 •© 2010 Universitas Negeri Jakarta | www.unj.ac.id | •7
Electron beam characteristics• Rapid rise to 100%• Region of uniform dose (proximal 90% to distal
90%)
• Rapid dose fall-off
• High surface dose
• Clinically useful range 5-6 cm depth
•03/05/23 •© 2010 Universitas Negeri Jakarta | www.unj.ac.id | •8
Electron Energy Specification
(the average energy of the spectrum)
(most probable energy @ surface)
(average energy at depth z)
•03/05/23 •© 2010 Universitas Negeri Jakarta | www.unj.ac.id | •9
Electron Energy Specification
Energy specification:• R50 - depth of the
50% dose• Rp - maximum
range of electrons
•03/05/23 •© 2010 Universitas Negeri Jakarta | www.unj.ac.id | •10
Electron Energy Specification
500 332 ) R. (Ε
– Average Energy (E0):
– Most Probable Energy (Ep0):
– Energy (Ez) at depth z
2002509812200, pp R.R.. E p
MDACC 21EX
AAPM TG-25 Med Phys 18(1), 73-109 (1991)
)Rz- (E E
pz 10
•03/05/23 •© 2010 Universitas Negeri Jakarta | www.unj.ac.id | •11
Determination of Absorbed Dose Calibration in water with ion chambers
• ADCL-calibrated system• Cylindrical-chamber reference point located
upstream of the chamber center by 0.5 rcav
• Reference conditions 100 cm SSD for a 1010 cm2 field
• Formalism:
N CowD
60
,kM D QQw
1.06.0 50 Rd ref
•03/05/23 •© 2010 Universitas Negeri Jakarta | www.unj.ac.id | •12
Depth-Dose DistributionDose is calculated from ionization measurements:
• M is ionization• is the ratio of water-to-air mean restricted
stopping powers• is the ratio of water-to-air fluence
• Prepl is a chamber replacement correction
100
}{
}{
%max
numerator
PρLM
Drepl
W
air
W
airW
W
airρL
W
air
•03/05/23 •© 2010 Universitas Negeri Jakarta | www.unj.ac.id | •13
Characteristics of clinical electron beams
X-Ray Contamination
SurfaceDose
Depth of 80% Dose
Depth of 50 % dose
Depth of 90% Dose
•03/05/23 •© 2010 Universitas Negeri Jakarta | www.unj.ac.id | •14
Characteristics of Clinical Electron Beams Surface Dose:
• Surface dose increases with increasing electron energy
•03/05/23 •© 2010 Universitas Negeri Jakarta | www.unj.ac.id | •15
Characteristics of Clinical Electron Beams Depth of the 80% Dose:
• Equal to approximately Enom/2.8 :
• Depth of 90% is approximately Enom/3.2 MDACC 21EX
•03/05/23 •© 2010 Universitas Negeri Jakarta | www.unj.ac.id | •16
Characteristics of clinical electron beams Practical Range:
• Equal to approximately 1/2 nominal energy
• Energy loss is about 2 MeV / cm
•03/05/23 •© 2010 Universitas Negeri Jakarta | www.unj.ac.id | •17
Characteristics of clinical electron beams
• X-Ray Contamination:– Increases with energy:– Varies with accelerator design – Defined as RP+2 cm
MDACC 21EX
•03/05/23 •© 2010 Universitas Negeri Jakarta | www.unj.ac.id | •18
Characteristics of clinical electron beams
• Accelerator design variations– Penumbra– X-ray
Contamination
•03/05/23 •© 2010 Universitas Negeri Jakarta | www.unj.ac.id | •19
Characteristics of clinical electron beams
Penumbral Effects:
• Low energies show expansion of isodose values
• High energies show constriction of high isodose values with bowing of low values.
•03/05/23 •© 2010 Universitas Negeri Jakarta | www.unj.ac.id | •20
Electron Beam DosimetryIsodoses (6 MeV)
•03/05/23 •© 2010 Universitas Negeri Jakarta | www.unj.ac.id | •21
Electron Beam DosimetryIsodoses (20 MeV)
•03/05/23 •© 2010 Universitas Negeri Jakarta | www.unj.ac.id | •22
Electron Beam DosimetryPDD- effect of field size (6 MeV)
•03/05/23 •© 2010 Universitas Negeri Jakarta | www.unj.ac.id | •23
Electron Beam DosimetryPDD- effect of field size (20 MeV)
•03/05/23 •© 2010 Universitas Negeri Jakarta | www.unj.ac.id | •24
Electron Beam DosimetryBeam abutment
•03/05/23 •© 2010 Universitas Negeri Jakarta | www.unj.ac.id | •25
Electron Beam DosimetryBeam abutment- electrons (6 & 20 MeV)
•03/05/23 •© 2010 Universitas Negeri Jakarta | www.unj.ac.id | •26
Electron Beam DosimetryBeam abutment- electrons (6 & 12 MeV)
•03/05/23 •© 2010 Universitas Negeri Jakarta | www.unj.ac.id | •27
Electron Beam DosimetryBeam abutment- electrons
•03/05/23 •© 2010 Universitas Negeri Jakarta | www.unj.ac.id | •28
Electron Beam DosimetryBeam abutment- photon & electron (6 MeV & 6 MV)
•03/05/23 •© 2010 Universitas Negeri Jakarta | www.unj.ac.id | •29
Electron Beam DosimetryBeam abutment- photon & electron (6 MeV & 18 MV)
•03/05/23 •© 2010 Universitas Negeri Jakarta | www.unj.ac.id | •30
Electron Beam DosimetryBeam abutment- photon & electron (IMC & tangents)
•03/05/23 •© 2010 Universitas Negeri Jakarta | www.unj.ac.id | •31
Electron Beam Dosimetry
Obliquity Effects• Oblique incidence results in
pdd shifts
From: Khan
•03/05/23 •© 2010 Universitas Negeri Jakarta | www.unj.ac.id | •32
Electron Beam DosimetryObliquity effects
•03/05/23 •© 2010 Universitas Negeri Jakarta | www.unj.ac.id | •33
Electron Beam Dosimetry
• Field Shaping:– Lead and/or Cerrobend is normally used– Thickness should be sufficient to stop electrons:
12E 0 t
t = mm PbE0 = Nom E (MeV)
•03/05/23 •© 2010 Universitas Negeri Jakarta | www.unj.ac.id | •34
Electron Beam Dosimetry
• Contour Irregularities:– Sharp contour
irregularities result in hot and cold spots
• Bolus:– Place as close to skin
as possible– Use tissue-equivalent
material– Bevel bolus to
smooth sharp edges
From: Khan
•03/05/23 •© 2010 Universitas Negeri Jakarta | www.unj.ac.id | •35
Electron Beam Dosimetry
Effects of inhomogeneities:• CET - coefficient of equivalent thickness• The CET of a material is approximately equal to its
electron density relative to water CET)- (1 z- d deff
•03/05/23 •© 2010 Universitas Negeri Jakarta | www.unj.ac.id | •36
Electron Beam Dosimetry
CET:• Sample calculation
CET)- (1 z- d deff
1 cmcm 2.25 0.25)- (1 1- 3 deff
cm 3.65 1.65)- (1 1- 3 deff
For Lung:
For Bone:
3 cm
•03/05/23 •© 2010 Universitas Negeri Jakarta | www.unj.ac.id | •37
Electron Beam Dosimetry
Internal Shielding:• Used to protect
tissues beyond treatment volume
• Backscattered electrons produce “dose enhancement”
A dose enhancement of about 50% could be expected in a 6-MeV electron beam
•03/05/23 •© 2010 Universitas Negeri Jakarta | www.unj.ac.id | •38
Electron Beam Dosimetry
• Internal Shielding:– Reduce the
intensity of backscatter by introducing a tissue-equivalent absorber upstream from the shield
Electron energy at the scatterer
•03/05/23 •© 2010 Universitas Negeri Jakarta | www.unj.ac.id | •39
Electron BeamMonitor-Unit Calculations
%DDD Rxdmax
• Electron-beam monitor units (MU) are normally calculated to a point at dmax along the central axis
• A dose DRx that is prescribed to a point other than dmax, can be related to the dmax dose Ddmax through the precription isodose level %D:
•03/05/23 •© 2010 Universitas Negeri Jakarta | www.unj.ac.id | •40
Electron BeamMonitor-Unit Calculations
SSDFS,
dmaxO
DMU
• The MU setting (MU) that is necessary to deliver a dose Ddmax is a function of the electron beam’s “output” (in cGy per MU) at the calculation point:
• Here OFS,SSD is the dose output as a function of field size (FS) and distance (SSD)
•03/05/23 •© 2010 Universitas Negeri Jakarta | www.unj.ac.id | •41
Electron BeamMonitor-Unit Calculations For an electron beam calibrated such that 1 MU
= 1 cGy at 100 cm SSD for a 1010 field at dmax:
Calibrated output for a 10X10 cm field at 100
cm SSD
Output factor for field size FS relative to field
size 10X10
Distance-correction factor for distance SSD relative
to 100 cm SSD
Electron-beam output for a field size FS at a distance SSD
)(F)(OF)(OO SSDFS10,100SSDFS,
•03/05/23 •© 2010 Universitas Negeri Jakarta | www.unj.ac.id | •42
Monitor-Unit Calculations
Field-Size Corrections OFFS:• Field-size corrections generally account for the
aperture produced by two devices:• Cones or Applicators, and Customized Inserts
• The field-size dependent output factor OFFS can then be thought to consist of cone and insert output factors, OFCS and OFIS:
•03/05/23 •© 2010 Universitas Negeri Jakarta | www.unj.ac.id | •43
Monitor-Unit Calculations
ISCSISCSFS OFOFOFOF ,
• Field-Size Corrections - OFCS, IS :– When used separately, cone factors, OFCS, are normalized to
the 1010 (or 1515) cone, and insert factors, OFIS, are normalized to the open cone into which inserts are placed
– Alternatively, they can be combined into a single factor, OFCS, IS , that is normalized to the open 1010 (or to the 1515) cone :
•03/05/23 •© 2010 Universitas Negeri Jakarta | www.unj.ac.id | •44
Monitor-Unit Calculations
WxWLxLLxW OFOFOF
• Field-Size Corrections - OFLW :– For rectangular fields, the field-size dependent output factor, OFFS, is determined
from square-field output factors using the “square root method”. Thus, for a rectangular field LW:
– For example, the 412 output factor OF412 is the square-root of the product of the 44 output factor, OF44, and the 1212 output factor, OF1212
•03/05/23 •© 2010 Universitas Negeri Jakarta | www.unj.ac.id | •45
Monitor-Unit Calculations Distance (SSD) Corrections FSSD:
• The variation of electron-beam output with distance does not follow a simple conventional inverse-square relationship
• Due to attenuation and scattering in air and in beam collimation and shaping devices
• Distance corrections take two forms:• Use of an “effective SSD” that can be used in an inverse-
square fashion• Use of an “air-gap factor” that can be used in addition to a
conventional inverse-square factor
•03/05/23 •© 2010 Universitas Negeri Jakarta | www.unj.ac.id | •46
Monitor-Unit Calculations
2
gdSSDdSSDISFF
m
meffSSDSSD
eff
EFF
Distance Corrections - SSDeff:• Assuming that an inverse-square relationship exists in which a reduced distance
to a “virtual” source of electrons exists, then the distance correction, FSSD is:
• where SSDeff is the effective (or virtual) SSD and g is the distance (gap) between the
“nominal” SSD (100 cm) and the actual SSD; dm is the dmax depth
•03/05/23 •© 2010 Universitas Negeri Jakarta | www.unj.ac.id | •47
Monitor-Unit Calculations
• Distance Corrections - SSDeff :– The “effective SSD” is a virtual distance that is utilized
so that an inverse-square approximation can be used• Effective SSDs vary with energy and field size as well as
with electron collimation design
•03/05/23 •© 2010 Universitas Negeri Jakarta | www.unj.ac.id | •48
Monitor-Unit Calculations
airmnom
mnomgSSDSSD f
gdSSDdSSDISFF nom
2
• Distance Corrections - fair :– An alternative method of applying distance
corrections utilizes a conventional inverse-square correction and an air gap factor, fair , that accounts for the further reduction in output that is unaccounted-for by the inverse-square correction alone:
• SSDnom is the nominal (100 cm) SSD
•03/05/23 •© 2010 Universitas Negeri Jakarta | www.unj.ac.id | •49
Monitor-Unit Calculations
WxWLxLLxW airairair fff
• Distance Corrections - fair:– fair also varies with energy and field size (it is derived from
the same data set that can be used to also determine SSDeff)
– For rectangular fields, as with any electron field-size correction, the square-root method is used:
•03/05/23 •© 2010 Universitas Negeri Jakarta | www.unj.ac.id | •50
Monitor-Unit Calculations
2, bdSSDdSSDOO
mSSDbSSD m
• Use of Bolus:– When bolus is used, the depth-dose curve shifts
“upstream” by a distance equal to the bolus thickness (e.g. if 1 cm bolus is used, the depth of dmax shifts by a distance of 1 cm toward the skin surface)
– The output at this shorter distance is:
• where b is the bolus thickness in cm, and SSD is the nominal SSD
•03/05/23 •© 2010 Universitas Negeri Jakarta | www.unj.ac.id | •51
Electron Monitor-Unit Calculations - Sample Problems
•03/05/23 •© 2010 Universitas Negeri Jakarta | www.unj.ac.id | •52
Electron Monitor-Unit Calculations - Sample Problems
3 . R o u g h l y , w h a t i s t h e e n e r g y o f a 1 2 M e V e l e c t r o nb e a m a t a d e p t h o f 5 c m ?
MeVEEE lostinit ialleft 21012
MeVdcmMevE cmlost 1052/2
•03/05/23 •© 2010 Universitas Negeri Jakarta | www.unj.ac.id | •53
Electron Monitor-Unit Calculations - Sample Problems
•03/05/23 •© 2010 Universitas Negeri Jakarta | www.unj.ac.id | •54
Electron Monitor-Unit Calculations - Sample Problems
5 . W h a t i s t h e m o n i t o r - u n i t s e t t i n g n e c e s s a r y t o d e l i v e ra d o s e o f 2 0 0 c G y p e r f r a c t i o n t o d m a x u s i n g 9 M e Ve l e c t r o n s , 6 x 1 0 f i e l d i n a 1 0 x 1 0 c o n e , a t 1 0 0 c m S S D ?
WxWLxLLxW OFOFOF 002.10.1003.1101066106 xxx OFOFOF
2006.199200
1.0(1.002)(1.0)UM
•03/05/23 •© 2010 Universitas Negeri Jakarta | www.unj.ac.id | •55
Electron MU Sample Problems
6 . W h a t i s t h e m o n i t o r - u n i t s e t t i n g n e c e s s a r y t o d e l i v e r ad o s e o f 2 0 0 c G y p e r f r a c t i o n t o t h e 9 0 % i s o d o s e u s i n g 9M e V e l e c t r o n s , 6 x 1 0 f i e l d i n a 1 5 x 1 5 c o n e , a t 1 0 5 c m S S D ?
airmnom
mnomgSSDSSD f
gdSSDdSSDISFF nom
2
892.0981.0909.0984.0978.053.2100
3.2100 2
SSDF
0.1003.1997.010106615
106 xxCone
x OFOFOF
2491.249
892.02.222
892.00.10.110090
200
MU
•03/05/23 •© 2010 Universitas Negeri Jakarta | www.unj.ac.id | •56
THANK YOU
•03/05/23 •© 2010 Universitas Negeri Jakarta | www.unj.ac.id | •57