복합칩 (SIP, MCP, TSV)에서 의Test Challenge · 2009-06-30 · "복합칩(SIP, MCP,...

"복합칩 (SIP, MCP, TSV)에서의 Test Challenge"

Prepared by MY Cha

Date : 24.June.2009.

미래 사회는 ?어떤 사회 ?

What’s the complex Chip(SoC) ?

What’s the complex Package(SoP) ?

What is SOC and SOP ?

Why System on Package ?

What kind of SIP ?

Stacked or

Side-by-Side

Wirebond or

FlipChip

Package-in-Packageor

Package-on-Package

withDiscreet Passives & TSV

or Integrated Passive Devices

Focused on test solutions for Application complex's

How we Can test for SIP ?

• Increasing product complexity, integration & density challenges cost effective single tester platform capabilities– Mixed signal, RF, Mixed technology– Multi die (Logic,analog/digital/memory)– Higher frequency

• Cost reduction requirements dominate– Yield characterization / test time reduction– Test insertion elimination using advanced data collection

tools– Cheaper cost/unit ATE solution– Handler - multi-site (Mass parallel)

How we Can test for SIP ?

Application Conversion Status

Why we need the Challenge for SIP test ?

Why we need the Challenge for SIP test ?

1. Cost 증가2. Coverage rate 감소3. Higher cost due to multi

process.

1. Equipment cost increase2. Need 2 more test process3. Test time increasing to

multi die test with conversion application

Test process Flow

Fab Process

Wafer out

Optical Wafer inspection

Wafer Sort

Packing

To Assembly site

Ass’y

Logic test

Memory Test

E/L QA for Memory

Return to Ass’y

⊙ 100% testing

⊙ 100% Testing

⊙ Sample plan: AQL 0.1%, A/R=0/1

System Level Test ⊙ 100% Testing (Optional : Based on Customer requirement for Their SiP and SoP)

Package stacking

⊙ Return to assembly after Logic test & Memory test under each tester.⊙To stacking process between top and Bottom package.

To BackendProcess

Back End Process Flow

The “Backend” - after test, other processsteps may be required:

Lead Scan

Baking

Dry Pack

Tape & Reel (Optional)

Pack, Label & Ship

Finished Goods

Semiconductors

FVI (Optional)

FVI L/A

Thank you!