Functional & AC Testing Test Frequency Pin Level Timings & Signal formats Vector

Functional & AC Testing

• Test Frequency

• Pin

• Level

• Timings & Signal formats

• Vector

與開發程式有關的 item

• VDD min/max• VIL/VIH• VOL/VOH• IOL/IOH• Test Frequency• Input signal timings• Input signal formats• Out put timings• Vector sequencing

Input data

• Test vector data– instructions or stimuli to the DUT

• Input signal timing – signal transition points

• Input signal formats – wave shapes

• Input levels– VIL/VIH

• Time set selections– if more than one time set is used

Output data

• Test vector data– expected logic states from the DUT

• Output strobe timing– when to sample outputs within the test cycle

• VOL/VOH– expected output levels from DUT

• IOL/IOH – output current loading

• Time set selections – if more than one time set is used

Testing output

Vector data

Functional testing

Executing a Functional test

• Define VDD level• Define input and output levels• Define output current loading • Define test cycle time• Define input timings and formats for all input pins• Define output strobe timings for all output pins• Define start and stop locations for vector memory• Execute the test

Relaxed parameters

• VIL↓ 、 VIH↑

• VOL=VOH=1.5v

• Period↑(Freq↓)

• setup & hold time↑

• output propagation delay↑

VIL/VIH test

• VIL=0.1*VDD， VIH=0.9*VDD

VOL/IOL VOH/IOH test

• VOL=0.4*VDD， VOH=0.6*VDD

Functional IOZ