X P S Auger I S S 1

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Presentación de la primera clase

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Caracterización de materiales

Espectroscopía de electrones

XPS y Auger

XPS = X-ray photoelectron spectroscopy

ESCA = Electron spectroscopy for chemical analysis

Efecto fotoeléctrico de un electrón de conducción:

Instrumentación

hEk

Región analizada

UHV = vacío ultra alto

10

AES = Auger electron spectroscopy

1s

ISS = Ion scattering spectroscopy

LEIS = Low energy ion scattering

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