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Agilent 8960 User Club---程式化應用技術研討會
2006 年 1 月 16-18 日
研討會時程
13:00-13:30 來賓報到 享用小茶點
13:30-14:00 What’s new for the Agilent 8960 (E5515C) Wireless Communications Test Set
14:00-15:00 Agilent E1963A W-CDMA Test Application Programming
15:00-15:20 午茶時間 輕鬆一下
15:20-16:20 Mobile Calibration and Multiple-Instance Testing Concept
16:20-17:20 New Calibration Techniques (PAvT & DPOW)
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Wireless Division
What’s for the 8960 (E5515C)
Wireless Communications Test Set !!!!!!
Dec 2005
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One agile platform, many optimized solutions
HSDPA
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Agilent’s 8960
GSM/GPRS
IS-95/AMPS
cdma2000
TIA/EIA-136
1xEV-DO
EGPRS
W-CDMA
HSDPA
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Basics of the 8960
E5515C chassis Firmware:•Test Applications•Lab Applications
Hardware options:•002 Second RF Source•003 Link subsystem•004 Digital Bus (Fading)
Related PC Software:•Wireless Test Manager•Wireless Protocol Advisor•Baseband Studio
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Latest 8960 Updates
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Latest Features of 8960Latest Features of 8960’’s Features s Features (including (including Two Cells Testing using Two 8960 test setsTwo Cells Testing using Two 8960 test sets))
HSDPA – Latest technology is now available !!GSM/GPRS/EGPRS –
(a) Digital ORFS for faster speed(b) Demonstrating how voice and data work at the same
time. (DTM-Dual transfer mode).(c) Demonstrating a handover from CELL to CELL
(Using two 8960s)EGPRS – Phase and Amplitude vs. Time (Polar Cal)
W-CDMA – Demonstrating connection of one video phone to another video phone through an emulated network (lots of interoperability issues between phones – mostly caused by protocol problems)(Using two 8960s) {Note: was first released in late 2004}
cdma2000/1x-EVDO – (a) Demonstrating the test for handover from cdma2000 to 1x-EVDO (hybrid mode) (Using two 8960s)
(b) Authentication & Advanced AMPS (c) Vocoder aimed at OnStar application(d) MEID & BC0 added
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Products OverviewAGENDA:• GSM/ (E)GPRS products• cdma2000 products • W-CDMA/HSDPA products• Wireless Test Manager• Agilent/Anite Conformance test• Online Resources• Q&A
Test ApplicationsTest ApplicationsE1962B cdma2000 – enhanced
Opt 401 -- (1x Rel. A)Opt 402 -- (Advanced AMPS) -NEWOpt 403 -- (Authentication) -NEW
E1963A W-CDMA – enhancedOpt 401 -- (Video Testing)Opt 403 -- (HSDPA) -NEW
E1968A GSM/(E) GPRS – enhancedOpt 410 -- (PAvT) -NEW
E1987A Fast Switch TAE1991B TA SuiteE1993A UMTS TA SuiteE1996A - cdma2000/1xEV-DO TA suite -NEW
Lab ApplicationsLab ApplicationsE6701D GSM/GPRSE6704A EGPRS - enhancedE6702B cdma2000 – enhancedE6703C W-CDMA/ HSDPA – enhanced & NEWE6706A 1xEV-DOE6719B LA SuiteE6717A UMTS LA SuiteE6785C Fast Switch LAE6716A - cdma2000/1xEV-DO LA suite -NEW
Wireless Test ManagerWireless Test ManagerE6560C cdma2000/IS95/AMPN5880A cdma2000/IS95/AMPS (enhanced) -NEWE6562C W-CDMA N5882A W-CDMA (enhanced) -NEWE6566C GSM/GPRS/EGPRS E6568C GSM/GPRS/EGPRS/W-CDMA -NEWE6564C 1xEV-DO -NEWN5884C 1xEV-DO (enhanced) -NEWE6569C WTM SuiteE6571C Run-time license
Overview of 8960 GSM/(E) GPRS Enhancements
E1968A GSM/GPRS/EGPRS Test Application
E6701D GSM/GPRS Lab Application
E6704A EGPRS Lab Application
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Summary of latest Features of GSM/GPRS/EGPRS Summary of latest Features of GSM/GPRS/EGPRS
GSM/GPRS/EGPRS –(a) Digital ORFS for faster speed(b) DTM-Dual transfer mode(c) Handover from CELL to CELL
EGPRS –(a) Phase and Amplitude vs. Time (PAvT)
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Digital ORFS (Output RF Spectrum) measurement
Key Signal Processing Steps:1) 30 kHz bandwidth filtering2) Power detection3) Logging
Implementation: hardware
Speed: Influenced by receiver hardware retuning for each ORFS frequency offset
Dynamic range:• Expected power > 10dBm Better• Expected power ~ Low Good
Key Signal Processing Steps:1) 30 kHz bandwidth filtering2) Power detection3) Logging
Implementation: software
Speed: No receiver retuning - all ORFS offset freqs computed w/single acquisition
Dynamic range:• Expected power > 10dBm Good• Expected power ~ Low Better
Value: Provides speed-optimized alternative ORFS measurement
SAME
Existing Analogue ORFS Meas NEW Digital ORFS Meas
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Speed Improvements - Modulation
ORFS due to Modulation test time is reduced with both old and new measurement HWBiggest improvement will be with high offset count and new instrument HW
Old HW with SN < GB45070000
New HW with SN => GB45070000
Test Time (Modulation)
0
0.2
0.4
0.6
0.8
1
1.2
1.4
1.6
2 4 6 8 10 12 14 16 18 20 22
Number of Offsets
Tim
e (s
) 20
burs
t Avg
Analog ModulationDigital Mod (old HW)Digital Mod (new HW)
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Speed Improvements - Switching
ORFS due to Switching test time is dramatically reduced with new measurement HWWith Digital ORFS and OLD HW some combinations of offsets and burst averaging can result in slightly longer test times.
Old HW with SN < GB45070000
New HW with SN => GB45070000
Test Time (Switching)
0
0.2
0.4
0.6
0.8
1
1.2
2 4 6 8
Number of Offsets
Tim
e (s
) 20
burs
t Avg
Analog SwitchDig Switch (Old HW)Dig Switch (New HW)
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Additional Speed Information
Digital ORFS Switching speed can be further improved by averaging 2 contiguous uplink bursts (further 30% faster)Recommended only with most recent HW, or old HW with upgrades
Simultaneous Modulation and Switching testingValues below assume 20 burst average
7.5x2.0x228
4.0x1.3x442.5x1.1x22
New HardwareOld HardwareModulation offsetsSwitching offsetsTest time improvement
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Instrument Hardware Requirements
Digital ORFS will work with all instruments which are already E1968A capable Fastest measurement speed will be with most recent HW (installed as standard from SN GB45070000)Older instruments can be upgraded with E5515CU-185 or E5515CU-285
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Release Information
The first revision of E1968A which supports Digital ORFS is A.06.xx released End Aug 2005Existing E1968A license holders can download A.06.xx and obtain Digital ORFS for FREE. A.06.xx also includes a new optional PAvT measurement. An additional E1968A-410 license to use PAvT is available to purchaseDefault operation for A.06.xx will be Analogue ORFS, one additional GPIB command will enable Digital ORFSBoth Analogue and Digital options are selectable along with AUTOAUTO will select the most suitable (fastest) test method based on offset/average count and hardware installed.Digital ORFS will be added to E6701D in January 2006 and E6701E (pre-releases) from September 2005
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Dual Transfer Mode (DTM)
DTM = Simultaneous GSM Voice + (E)GPRS DataPS and CS connections must both be on the same ARFCN and in contiguous timeslots in both uplink and downlinkNo requests for single slot operation - Standards allow for Half rate voice and data sharing a single slot
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DTM in E6701EDTM ON/OFF• With DTM on, test:
Correct implementation of additional/new signallingDifferent RF conditions
• Force DTM off to test:Suspend/Resume when the MS is in a non-DTM
supported cellInteraction with other Services/Features• DTM can be used with all existing Speech Codecs - AFS,
FR, EFR, AHS, HR• SMS, MMS, Wap-Push etc.
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DTM in E6701E – Connection types
Connection Type AutoPRBS GSM voice + Real life IP data to/from external serversPRBS GSM voice + PING
Connection Type ETSI-A, B (Ack and Un-Ack), SRBPRBS GSM voice + continuous manufacturing style
connection (8PSK or GMSK)Connection Type BLER
PBRS GSM Voice + BLER Ack/Nack’s (GMSK only)Available even when no manufacturing connection types are
supported by the mobile22
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Two-Cell Handover (Handoff) and Cell Reselection
E6701E pre-release GSM/GPRS Lab ApplicationJune 2005
Also applies to E6704A EGPRS LA extension if installed
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Two-Cell Handover and Cell Reselection• One of the most common cause of “dropped” mobile voice calls and data
connections is while transitioning between two cells resulting in:
• Reduced revenue for networks
• Customer dissatisfaction and frustration
• Valuable network resources are required
• Multiple handovers = poor network efficiency
• The only current method for testing Handovers and Cell Reselection is with costly conformance test systems
• Significant number of conformance tests require more than 1 cell
• Bench-top 8960 pre-conformance will free up valuable conformance system resources
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Two-Cell test scenarios• Idle mode cell selection
• Idle mode cell reselection – MS initiated
• Idle mode cell reselection – Network initiated
• (E)GPRS packet transfer mode cell reselection – MS initiated
• (E)GPRS packet transfer mode cell reselection – Network initiated
• GSM dedicated voice handover – Network initiated
Unsynchronised, Synchronised, Pseudo – Synchronised
• GSM Circuit Switched Data (CSD) handover – Network initiated
• Dual Transfer Mode (DTM) handover – Network initiated
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Measurements Reports and ThroughputMeasurement Reports• Measurement reports are available for
whichever instrument the device is camped/attached to
• Report values will not be used by the system to initiate handovers
RF Measurements• All RF measurements (inc spectrum monitor)
will be available in both instruments• Measurements (if selected) will trigger and
run automatically on the instrument to which the device is currently connected
Throughput and IP counters• Run and record independent Throughput
Monitor and IP counters on both instruments
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Two-Cell FW and HW requirements
• Both Instruments must have E6701EMust have same FW revision on both
instruments• If testing EGPRS, both instruments must
have E6704A (and necessary EGPRS HW)EGPRS throughput testing requires latest
HW or upgrade• Both instruments must be connected via
LAN, hub or crossover cableProtocol Logging and data transfers to
external servers will not be possible with a crossover cable
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Phase & Amplitude vs. Time (PAvT) Measurement
16 August 2005Rev 5.1
Time
Pow
er
0 t0 t1 t2 t3 t4 t5 t6 t7 t9t8 t10
u0
u1
u2 u3
u4 u7 u9
u5
u6
u8
u10
TriggerLevel
p0
p4
p7p9
p1
p2
p5
p6
p8
p10
p3
User Provided
Agilent Returned
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Flexibility FeaturesSupports Variable Pulse Widths
Improves accuracyReduces measurement time
Supports User-Selectable Measurement IntervalsCan be offset from center of pulse widthAvoid edge transientsMultiple measurements on a single pulse
Supports Aperiodic Return to Reference LevelReduces measurement timeAllows user to optimize against LO instability
User Defines Computation of Final ResultsAllows user to optimize for their situation
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Key PAvT Capabilities• Measurement Intervals
• Count – 512 max, 1 min• Width – 400 msec max, 100 usec min• Center – 400 msec max, 50 usec min
• Trigger• Threshold – 30 dB max, 0 dB min• Source – RF Rise, Immediate, External• Delay – 10 msec max, 0 sec min
• Dynamic Range - -20 dBm to +35 dBm• Reference Power must be within 3 dB of Expected Power• Operation is only available over remote user interface
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PAvT Availability
• PAvT will be implemented in the GSM/GPRS/EGPRS technologies –E1968A-101, 102, 103, 201, and 202
• Available as an option to the E1968A test application:E1968A-410
• Available as included feature of the E6701D/E lab applications• First commercial release will be end of Aug ‘05 (firmware download
available via web) on the E1968A• Available as a pre-release on the E6701D/E in Oct ‘05• Available on new factory shipped instruments as part of E1968A and
E6701D with final specs from Jan ’06• E5515C with 4.5 HW is required (please check with your local rep.)
Overview of W-CDMA Enhancements
E1963A W-CDMA Test Application with HSDPA• E6703C W-CDMA/ HSDPA Lab Application
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Summary of new HSDPA TA functionalitySource –QPSK and 16QAMFRC H-Sets 1 through 512.2k W-CDMA + HSDPA
Signaling –FDD Test Mode RB Test ModeFully functional MAC-hs• Ack, nAck, and CQI analysis
Measurements –HSDPA BLER• Ack/nAck count• statDTX count• BLER and Throughput• Median CQITransmitter tests• Channel Power• ACLR• SEM• DPOW• Flexible HSDPA triggering
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3-slide summary of E6703C LA features – Slide 1
Connection types available:Or, HOW the 8960 and UE communicate
For Real-User testing:• Packet data (PS)• 3G.H324 Video conferencing• SMS/MMS• Circuit data (CS)• AMR Voice Echo
For RF and Signaling test:• Non-signaling FDD Test Mode• Radio Bearer Test Mode
Bearer types available:Or, WHAT the 8960 and UE communicate
• PS data Up to 384kbps• 3G.H324 64kbps UDI• SMS/MMS CS or PS domain• CS data Up to 57.6kbps• AMR Voice 4.75k to 12.2kFDD and RB test modes• W-CDMA RMC’s up to 384kbps• HSDPA FRC H-Sets 1 thru 5 New
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3-slide summary of E6703C LA features – Slide 2Core network environment• Frequency bands I thru VI• ARFCN hard handover• Variable closed loop power control• Authentication and Integrity Protection• In-box AWGN• OCNS for W-CDMA and HSDPA• Configurable MAC-hs parameters
Mobility emulation• 2nd cell soft handoff• Compressed mode• InterRAT handovers• Transport channel reconfigurations• Optional RF fading from digital IQ
Additional analysis features• PC-based protocol logging• UE measurement reports• Fully flexible Beta and Delta values• In-box Ping function• Calling party number• SIB 11 neighbor list construction
New
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3-slide summary of E6703C LA features – Slide 3 RF measurements• Thermal power• Channel power• Adjacent channel leakage*• Waveform quality• Spectrum emission mask*• Occupied bandwidth• Code domain power*• IQ constellation*• Spectrum analysis*• Dynamic power analysis* • Frequency stability• Inner loop power*• PRACH Tx On/Off• Phase discontinuity*
More measurementsLoopback BER w/ confidenceBLER – loopback and Ack/nAckChange of TFCOut of Sync power signaling and triggerTx dynamic powerHSDPA BLER
* = graphics
Mobile HS-DPCCH response to FRC H-Set5 with ½ slot DPCH offset New
New
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Ordering Info :
E1963A Test ApplicationE1963A-401 Video TestE1963A-403 HSDPA Test ModesE6703C Lab ApplicationE6703CU-001 E1963A to E6703CE6703CU-002 E6703A to E6703CE6703CU-003 E6703B to E6703CE6720A-003 Annual Upgrade Contract
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Overview of Wireless Test Manager (WTM)(If needed, please request from your local representative for mo(If needed, please request from your local representative for more detailed re detailed presentation slides).presentation slides).
Family of Windows© test
automation software products
useful for UE calibration,
regression test, final test, etc.
8960 Wireless Test Set
E1852B Bluetooth™ Test Set
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Agilent WTM Family *Microsoft® Visual Basic.NET® development platform
E6560C* cdma2000/ IS-95/AMPS N5880A* cdma2000/IS95/AMPS (enhanced**) -NEW
E6562C* W-CDMAN5882A* W-CDMA (enhanced**) -NEW
E6564A/U 1xEV-DO (discontinuing soon)E6564C* 1xEV-DO -NEWN5884C* 1xEV-DO (enhanced**) -NEW
E6566C* GSM/GPRS/EGPRSE6568C* GSM/GPRS/EGPRS/W-CDMA -NEW
E6569C* SUITE (cdma2000, IS-95, 1xEV-DO, GSM, GPRS, W-CDMA, TDMA, AMPS)E6571C* Run-time
N4019A Bluetooth™N4018A Bluetooth Run-Time License
Features include:
• ready-to-use tests• test plans• test sequencing
** “enhanced” includes:
• Fading support• WPA support• soft/softer handoff, etc
For Conformance Test and Network Simulation
Agilent / Anite PartnershipIn June 2003, Agilent and Anite
announced a partnership to collaborate on a series of products to improve
development cycles for mobile handsets. The first test solutions offered in
November 2003 were GSM, GPRS, EDGE.
We have developed a new solution that has extended this collaboration
into the W-CDMA and HSDPA spaces, providing full support for Release 5.0.
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Agilent-Anite Protocol Test, Conformance Test,and Network Simulation Functionality Summary
Shipping Nov 2003:(Anite GSM/GPRS/EGPRS SAT and SAS with Agilent 8960)
GSM, GPRS and EGPRS formats in the Agilent 8960 are incorporated into the Anite SAT Development and Conformance Test Solution and the Anite SAS Network Simulator
Shipping Jul 2005:(Anite W-CDMA/HSDPA test solution with Agilent 8960 and Anite BasebandProcessor)
Agilent 8960 with option 004, Digital Bus, is used with Anite W-CDMA/HSDPA hardware and software to provide an integrated test solution
Shipping Feb 2005:Application-enabler testing offered by Anite using the 8960 test set
Application-enabler Conformance Test PlatformMMS & WAP application-enabler test as per OMA guidelinesExtension of the SAS network simulator
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AMERICAS
Mario [email protected]
+81 45 849 2161
EUROPEDominic Rowles – EMEA Sales Manager
[email protected]+44 1252 775200
ASIA/PACIFIC
• Wansup Baek (Korea)•[email protected]
• Barry Yi (Taiwan)•[email protected]•+ 886 (0)2 2722 6890
• Mike Bradley – A/P Sales Manager•[email protected]•+ 86 10 8519 2190
e-mail – [email protected] - +44 1252 775200
Americas - +1 847 437 9010Japan - +81 45 849 2161
China - +86 10 8519 2190Taiwan - +886 (0)2 2722 6890
Vincent Caffrey – A/P Operations [email protected]
•+ 86 10 8519 2190
Scott Sullivan – Country [email protected]
+1 847 437 9010
JAPAN
Anite Contacts
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On-Line Resources:
Agilent 8960 Home Page:
www.agilent.com/find/8960
Agilent Network in a Box Home Page:See the new Network in a Box videos!!
www.agilent.com/find/networkinabox
• On-line manuals, technical literature, latest revision downloads and much more!
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On-Line Resources (continue !!) :GSM/GPRS/EGPRS Products Pagewww.agilent.com/find/e1968awww.agilent.com/find/e6701dwww.agilent.com/find/e6704a
W-CDMA/HSDPA Product Pagewww.agilent.com/find/e1963awww.agilent.com/find/e6703cwww.agilent.com/find/hsdpa
1xEV-DO Product Pagewww.agilent.com/find/e6706aCDMA2000 Product Pagewww.agilent.com/find/e6702b
Baseband Studio Product Pagewww.agilent.com/find/basebandstudioWireless Test Managers Product Pagewww.agilent.com/find/wtmanagers
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Thank you for your time
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Q and A
E1963A Programming Training Rev 09/13/01
1000xxxx-E1963A_PU2.ppt 1
Programming TrainingE1963A W-CDMA Test Application
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Intended Audience
• Understand W-CDMA technology and UE test.• Proficient in at least one programming language.• Helpful: Have completed 8960 programming training.
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Objectives
• Learn how to program the E1963A W-CDMA TA• Key programming steps• GPIB commands
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Agenda
• Programming Flowchart Review• Programming Flowchart Details
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Programming Flowchart ReviewStep 1
Set up the test set.
Step 2Configure test set and mobile station parameters.
Step 3Set measurement parameters.
Step 4Make a connection.
Step 5INITiate and FETCh measurements.
Step 6Reconfigure test set and mobile station
connection parameters.
Step 7End the connection.
Test new conditions?
Yes
No
6
Step 1: Set Up the Test Set• Initialize the Test Set
• *CLS• *RST
• Turn Debugger On (turn this off after code is complete)• SYST:COMM:GPIB:DEB ON
• Set Operating Mode• CALL:OPER:MODE CALL
• Set Amplitude Offsets• SYST:CORR:FREQ <>
• Freeze the front panel display (do this after code is complete)• DISP:MODE FAST
Example 1
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Step 2: Configure Test Set andMobile Station Parameters• Set Up The Cell Parameters
• Set cell parameters like the MCC, MNC, and LAC • Specify whether single or repeat paging should be used when paging
the UE.
8
Programming ConceptsImportant 8960 Cell Parameters Setting
BCCH Update Page:
“Auto”--- When you change a parameter that causes a BCCH Update, the test set updates its BCCH information and sends a Paging Type I message to the UE telling it to re-read the BCCH.
“Inhibit”---When you change a parameter that causes a BCCH Update, the test set updates its BCCH information but does NOT send a Paging Type I message to the UE.If your UE does not support the BCCH Update procedure, set this field to Inhibit.
CALL:BCCH:UPDA
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Programming ConceptsImportant 8960 Cell Parameters Setting
ATT Flag State(IMSI Attach Flag) in BCCH:
“Set”--- After UE camps a network, UE will always register and update IMEI/IMSI via location update procedure.
“Not Set” --- After UE camps a network, UE will only register when it determines that it has camped an a new cell, UE uses the MNC,MCC and LAC to determine if the cell is new
CALL:ATTFlag[:STATe]
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Programming ConceptsImportant 8960 Cell Parameters Setting
Uplink Parameters>Maximum Uplink Transmit Power Level:
Power Class 1: 33 dB is default setting
Power Class 3: 24 dB, Qualcomm UE
Power Class 4: 21 dB, Nokia UE
Note: Must set up this parameter correctly with the UE you want to test before set up call connection, otherwise UE can not pass open loop power and Transmit On/Off Power measurement
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OR
Step 2: Configure Test Set andMobile Station Parameters
Set DOWNLINK Parameters:• CALL:POW <>
• CALL:CHAN <>• CALL:CONT:DOWN:FREQ:AUTO OFF
CALL:RFG:FREQ <>
• CALL:SCOD <>
⇒Sets downlink power (cell power)
⇒Sets downlink channel⇒Sets downlink frequency control to
manual and then sets downlink frequency
⇒Sets downlink primary scrambling code
12
Step 2: Configure Test Set andMobile Station Parameters
Set DOWNLINK Parameters:• CALL:DPCH:TYP RMC12• CALL:DTCH:DATA <>
<PRBS15, PRBS9, ZER, ONES>• CALL:DPCH:RMC12:CCOD <>• CALL:DPCH <>• CALL:CPIC <>• CALL:CCPC:PRIM <>
⇒Sets downlink DPCH type to 12.2k RMC⇒Sets downlink DPCH data type⇒Data type options⇒Sets downlink DPCH channelization code⇒Sets downlink DPCH power level⇒Sets CPICH power level⇒Sets P-CCPCH power level
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Step 2: Configure Test Set andMobile Station ParametersSet DOWNLINK Parameters:• CALL:PICH:CCOD <>• CALL:PICH <>
• CALL:AWGN:POW:AMPL <>
⇒Sets PICH channelization code⇒Sets PICH power level
⇒Sets AWGN power level
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Step 2: Configure Test Set andMobile Station Parameters
SET UPLINK Parameters:• CALL:MS:POW:TARG <>
• RFAN:CONT:POW:AUTO OFFRFAN:MAN:POW:FDD <>
• CALL:FDDT:CLPC:UPL:MODE <>
<ACT,UDOW, UP, DOWN, UDOW10>
⇒Sets MS Target Power and expected power.
⇒Sets RF analyzer expected power control to manual and then sets expected uplink power
⇒Sets which closed loop power control bits to send to UE on downlink DPCCH
⇒Bit sequence options
OR
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OR
Step 2: Configure Test Set andMobile Station ParametersSET UPLINK Parameters:
• CALL:UPL:CHAN <>• RFAN:CONT:UPL:FREQ:AUTO OFF
RFAN:MAN:UPL:FREQ <>
• RFAN:CONT:MEAS:FREQ:AUTO OFFRFAN:MAN:MEAS:FREQ <>
• CALL:UPL:DPCH:SCOD <>
⇒Sets expected uplink channel⇒Sets RF analyzer uplink frequency
control to manual and then sets expected uplink frequency
⇒Sets RF analyzer measurement frequency control to manual and then sets measurement frequency
⇒Sets expected uplink primary scrambling code
Example 2
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Step 3: Set Measurement Parameters
• SET:CONT:OFF ⇒Sets triggering for all measurements to single
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Step 3: Set Measurement Parameters -Thermal Power• SET:WTP:TIM <>• SET:WTP:COUN <>
⇒Sets measurement timeout time⇒Sets measurement count
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Step 3: Set Measurement Parameters -Channel Power
• SET:WCP:TIM <>• SET:WCP:COUN <>• SET:WCP:TRIG:SOUR <>
<IMM, PROT, RISE, AUTO>• SET:WCP:TRIG:DEL <>
• SET:WCP:INT:TIME <>
⇒Sets measurement timeout time⇒Sets measurement count⇒Sets trigger source⇒Trigger source options⇒Sets trigger delay
⇒Sets measurement interval
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Step 3: Set Measurement Parameters -Waveform Quality
• SET:WWQ:TIM <>• SET:WWQ:COUN <>
• SET:WWQ:TSL <>
⇒Sets measurement timeout time⇒Sets measurement count
⇒Selects which timeslot to measure
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Step 3: Set Measurement Parameters -Adjacent Channel Leakage Ratio (ACLR)• SET:WACL:TIM <>• SET:WACL:COUN <>• SET:WACL:TRIG:SOUR <>
<IMM, PROT, AUTO>• SET:WACL:TRIG:DEL <>
• SET:WACL:LOW:STAT <>• SET:WACL:LOW2:STAT <>• SET:WACL:UPP:STAT <>• SET:WACL:UPP2:STAT <>
⇒Sets measurement timeout time⇒Sets measurement count⇒Sets trigger source⇒Trigger source options⇒Sets trigger delay
⇒Turns measurement off/on for various offsets
E1963A Programming Training Rev 09/13/01
1000xxxx-E1963A_PU2.ppt 11
21
Step 3: Set Measurement Parameters -Loopback Bit Error Ratio (BER)• SET:WBER:TIM <>• SET:WBER:COUN <>
⇒Sets measurement timeout time⇒Sets number of bits to test
Example 3
22
Step 4: Make a Connection
• Include “PAUSE” in program to wait for UE to get configured and begin transmitting in FDD mode.
• With no signaling from 8960, UE must begin transmitting uplink DPCH (12.2k RMC).
• At proper power level, frequency, and primary scrambling code.• Synchronized to the 8960 for Waveform Quality.• Loopback Mode 1 for BER.
• 8960 scans for and automatically detects the uplink signal.
Example 4
E1963A Programming Training Rev 09/13/01
1000xxxx-E1963A_PU2.ppt 12
23
Step 5: INITiate and FETCh Measurements
INITiate Measurements
Meas Name
NONE
WAITINIT:DONE?
≠ 0
Integrity Indicator
ContinueProgram
Invoke ErrorHandler
0FETChMeasurement
INIT:WBER;WTP;WWQ;WACL
FETC:WTP
Example 5
24
Programming ConceptsConcurrent Measurements•Transmitter and Receiver Tests can be made concurrently
•Results are available as soon as possible
INIT:WACL;WTP;WWQINIT:DONE?
•Implementation
E1963A Programming Training Rev 09/13/01
1000xxxx-E1963A_PU2.ppt 13
25
Programming ConceptsIntegrity Indicators of Measurements•Test Set evaluate conditions surrounding a measurement
•Equals 0 if conditions are normal
•Recommended use:Check value
IF
Programproceeds
Equal to 0
Program must determine action
Not Equal to 0
26
Step 6: Reconfigure Test Set andMobile Station Connection Parameters• Reconfigure the Connection when using Active Cell
• Physical Channel Reconfig• CALL:SET:CHAN:DOWN <>• CALL:SET:CHAN:UPL:CHAN <>OR• CALL:SET:CHAN:UPL:CONT:AUTO• CALL:SET:CHAN:UPL:SEP <>
CALL:HAND:PCR ! Executes the handoff
• Transport Channel Reconfig• CALL:SETup:TCReconfig:RBTest:RAB <><RMC12,RMC64,RMC144,RMC384,RMC33NC>
CALL:HAND:TCR ! Executes the handoff
• System Handoff• CALL:SET:SYST:GSM:ALER [ON|OFF]
CALL:SET:SYST:[FDD|GSM] ! Executes the handoff
Example6-1
Example6-2
E1963A Programming Training Rev 09/13/01
1000xxxx-E1963A_PU2.ppt 14
27
Step 7: End the Connection
• End UE transmission.• SYST:PRES3 ⇒Partially presets the 8960 in preparation for testing
next UE. Does not reset parameters to defaults.
28
Review Questions
• Question 1: What are two things that can be done to improve program execution speed once code development is complete?
• Question 2: How can you determine if a measurement result is valid?
Mobile Phone Calibration Concept
1
Page 1
Mobile Calibration and Multiple-Devices Testing Concept
Agilent TechnologiesJanuary 16-18, 2006
Page 2
Agenda
•Introduction to Mobile Phone Calibration
•Equipment and Phone Requirements
•Typical Calibration Procedures
•Multiple Devices Testing Concept
•Q & A
Mobile Phone Calibration Concept
2
Page 3
Board Test/Mobile Adjustment Final Test ShipPhone
AssemblyBoard
AssemblySMT
Visual Inspection/Keypad testing
•Essential part of Manufacturing•Performed at Board Level•Automated
Introduction to Mobile Phone Calibration: Typical Line Layout
Page 4
Introduction to Mobile Phone Calibration: Why Calibrate?Meet Specifications Exactly
Ensure Data Quality
Share Network Resources
Conserve Battery Power
Mobile Phone Calibration Concept
3
Page 5
Speech & Chan
Coders
Modulator & ChannelSynthesizer
PAD
up
lexer
Antenna
BatteryKeypad &Display
Mobile PhoneSubscriber
Down-converter &Demodulator
LNA
Micro-controller / EEPROMS
I/QFreq TXPower
RXPower
BatteryIndicator
Intro to Mobile Phone Calibration:What Needs Adjustment?
Page 6
RS-232 / USB
Equipment and Phone Requirements:The Test BusLevel-shifted RS-232 Protocol or USB
Proprietary Command Set
In CALIBRATION:• Test Mode Setup• Continuous Transmit• Query Received Level• Program Calibration FactorsIn FINAL TEST:• Keypad Emulation• Audio Loopback• Set/Query Serial Number• Establish a Call
Mobile Phone Calibration Concept
4
Page 7
8960 Wireless Comm. Test Set
RS-232 Port or USB Interface
PC Controller
Digital I/O, Fixture Control
Power Supplies
RF Isolated Fixture
Equipment and Phone Requirements:Test Equipment Needs
Page 8
ONE SHOT ITERATIVE
Typical Calibration Procedures:Two Types of Calibration
Measure
Program Correction Factor
Verify
DONE!
Typically used for receiver, frequency or battery calibration
Measure
Program Correction Factor
Re-Measure
Check against limits
Loop until within limits or timeout
DONE!
Typically used for modulator or power amplifiers
Mobile Phone Calibration Concept
5
Page 9
Typical Calibration Procedures:Two Stages of CalibrationPre-Production Calibration
Usually take very long timeGood uniformity between PCBsUsually need to be done if key component changed
Production Calibration
RF Related CalibrationCalibrate on production line with RF Test SetMay vary a lot between PCBs
Non-RF Related CalibrationSometimes calibrate on different Test BayMay reduce the RF Test Set using time if calibrate on the same Test Bay
Page 10
I/Q Modulator Adjustment
Chan Center 0’s1’s
Spurs
Typical Calibration Procedures:Measurements
Use an RF Test Set, Spectrum Analyzer, or Vector Signal Analyzer
Example: Transmit Continuous 1’s and Adjust Spectrum Spurs. Repeat with Continuous 0’s.
Calibration Time can be Quite Long!!
Usually I/Q Adjustment is Designed Out
Mobile Phone Calibration Concept
6
Page 11
Frequency Correction
Typical Calibration Procedures:Measurements
Use RF Test Set or Universal Counter
Important for Precise Timing and Channel Synthesizing
Measure Absolute Frequency, or Modulation Frequency Error
One-shot or Iterative
8-bitDAC
TCXO(VCO)
Freq Error
DAC Input
Page 12
Typical Calibration Procedures:Measurements Example – VCTCXO Curve Fitting
Looking for zero error pointLooking for zero error point
Mobile Phone Calibration Concept
7
Page 13
Transmit Power
Typical Calibration Procedures:Measurements
Use 8960 RF Test Set or Power Meter & Power Sensor• Measure Power Ramp Values• Correct for Well-Shaped Power Burst• Measure All Power Levels and Many Channels• Variations: Average Burst Power Only, or Fewer Levels & Channels
Page 14
Receive Power
Typical Calibration Procedures:Measurements
Both GSM and CDMA
RF Test Set (or Signal Generator) Transmits Various Power Levels and Frequencies to Phone
Phone Reports Received Level on Test Bus
Example: RxLevel = Receiver DAC Value – AGC Gain + RxOffset
Mobile Phone Calibration Concept
8
Page 15
Typical Calibration Procedures:Measurements Example – Transmit Power Curve
Low Power part
High Power partPiecewise-Linear
Page 16
Other Considerations
Typical Calibration Procedures:Measurements
Battery Indicator: Power Supply Sources a Range of Voltages. Phone Reports Indicator Level
A/D Converters: DC Voltage Measurements
After All Adjustments: Write Calibration After All Adjustments: Write Calibration Values to memory over Test BusValues to memory over Test Bus
Mobile Phone Calibration Concept
9
Page 17
Modular Code, Callable from Many Environments (C is a good choice)Use any COM PortR&D Usually Delivers to Manufacturing - but Not Always!
Test Tips and Tricks:Test BusWrite a Phone Communication Driver - Example Functions:• phoneTestMode();
• phoneContinuousTransmit(int channel, int power);
• phoneQuerySerialNumber(char *serialNumber);
Page 18
long CalibrateRXLevel(double baseStationLevel){
long phoneReceiveLevel;long correctionFactor;int num_tries = 0;
// First, configure the Base Station to the right levelhp8922_confRFGLevel(baseStationLevel);// Wait for the phone to settleSleep(100);// fetch RX report from Test BusPhoneQueryRXLevel (&phoneReceiveLevel);
// Calibrate if out of limits.while((phoneReceiveLevel < lowLimit) || (phoneReceiveLevel > highLimit)){
// Quit if too many attempts.if(num_tries = 10)
return PHONE_NOT_CALIBRATED;correctionFactor = CalculateRXCorrectionFactor (phoneReceiveLevel);PhoneProgramRXCorrectionFactor (correctionFactor)// Another reading after correction is made.PhoneQueryRXLevel (&phoneReceiveLevel);num_tries++;
}
return PHONE_CALIBRATED;}
Test Tips and Tricks:Calibration Code Example (Iterative)
Mobile Phone Calibration Concept
10
Page 19
Test Tips and Tricks:Choosing Correction FactorsMost Difficult Part of Calibration!Most Difficult Part of Calibration!
correctionFactor = CalculateRXCorrectionFactor (phoneReceiveLevel);
•Check for Maximum Attempts or Timeout
•Remember Previous Attempts
•Do not Repeat, and Fail if Oscillating
•May not be Linear! Try Curve Fitting
•Know the Shape of Correction Factors vs. Measurements
Page 20
Test Tips and Tricks:Curve Fitting and Interpolation
Calibration Factors(DAC Values)
PowerMeasurement
•Measure power for many calibration factors, on one channel & power level.
•Store table of calibration factors & slopes
•Use this table for interpolation on every other channel & power level.
Example: Transmit Power Calibration
Mobile Phone Calibration Concept
11
Page 21
How Can Manufacturing Shorten the Time?Experiment with Good and Bad PhonesAdd Intelligence to Iterative Procedures - Curve Fitting / Interpolation / LearningKnow your RF Path LossesGive Feedback to R&D
Test Tips and Tricks:Calibration TimePhone Design Chooses:• Overall Calibration Algorithms• Number of Test Points
Page 22
Tester Architecture
Mobile Phone Test PlatformPhone Calibration
Algorithms
Phone Test Plans
Phone Communication
Phone CommandsCustomer Unique
MeasurementsPCTest ExecutiveIntegrationTest Head
Chipset Unique
Mobile Phone Calibration Concept
12
Page 23
Summary
Calibration/Adjustment of Phone is Essential in Manufacturing
Algorithms and Test Points Vary Due to Phone Design
You Can Quickly Produce Quality Phones:• Use the Right Equipment• Keep Code Maintenance in Mind• Experiment with Correction Factors and
Algorithms
Page 24
Multiple Devices Testing ConceptOne-Up with Multiple Devices!•Switching test solution
•Test multiple devices sequentially
•Using single set of test equipments but multiple fixtures
•One PC controlled by one operator
•ONE Software Instances
•Load/Unload time saved
Mobile Phone Calibration Concept
13
Page 25
Multiple Devices Testing ConceptOne-Up with Multiple Devices!
。。。
UUT1
UUT2
Switching system will test two UUTs in parallel to improve major RF box efficiency:。。。
。。。
Typical test system tests each UUT in sequence
。。。
。。。
。。。
UUT1
Use instrument sharing technology to improve asset utilization and reduce cost.
RF Test Time
Non-RF Test Time
Operator Loading Time
DescriptionLegend
Page 26
Multiple Devices Testing ConceptOne-Up with Multiple Devices!Possible Issues
•Error handling
•Switching for RF is easy but how about DC Power and Control Interfaces (RS-232 & USB)
•RF Calibration
•Need special defined SOP
Mobile Phone Calibration Concept
14
Page 27
Multiple Devices Testing ConceptMulti-Up with Multiple Devices!•Test multiple devices simultaneously
•Using multiple sets of test equipments and fixtures
•One PC controlled by one operator
•ONE or TWO Software Instances and parallel testing
•Higher throughput per floor area
•Can further combine switching test solution
Page 28
Multiple Devices Testing ConceptSystem Architecture
Agilent 66321B Power Supply
Agilent 66321B Power Supply
Agilent 8960GSM Test set
Agilent 8960GSM Test set
Level Converter
Level Converter
HP-IB
I(H
P-IB II) Power Line
Power Line
RF Signal
RF Signal
RS-232C
RS-232C
Shield Box
Shield Box
PC
Test System Test Fixture
Mobile Phone Calibration Concept
15
Page 29
Multiple Devices Testing ConceptMulti-Up with Multiple Devices!Possible Issues
•RACING condition
•Interface sharing. E.g. GPIB interface
•Interface Bus resource issue
•May need advanced software programming skills like Multi-Thread Programming
Page 30
Agilent TestExec SL PlatformSupport both Multiple Devices Testing Concept
Mobile Phone Calibration Concept
16
Page 31
Agilent TestExec SL PlatformSupport both Multiple Devices Testing Concept
Page 32
Agilent Wireless Test Manager PlatformSupport both Multiple Devices Testing Concept
Mobile Phone Calibration Concept
17
Page 33
Agilent Wireless Test Manager PlatformSupport both Multiple Devices Testing Concept
Page 34
SummaryMultiple Devices Testing •May enhance test efficiency
•May enhance test throughput
Lower Cost of TestLower Cost of Test
•May increase maintenance difficulties
•May need advanced test platform or better programming skills
Trade Off !!Trade Off !!
1
Phase & Amplitude vs Time Measurement
Agilent Confidential Page 2
GSM/EDGE
GSM EDGEModulation GMSK 3PI/8 8PSK
Bits/Symbol 1 3
Data Bits per Burst 114 342
Symbol Rate 270.833k 270.833k
Filter 0.3 Gaussian Linearized Gaussian
2
Agilent Confidential Page 3
EDGE vs GSM Vector (Constellation) Diagrams
Agilent Confidential Page 4
Power Amplifier Characterization
The Phase & Amplitude vs Time measurement provides a means to characterize the phase and magnitude errors introduced by the non-linearity of power amplifiers operating over a wide dynamic range. By measuring the errors in phase, amplitude and frequency as a function of output level it is possible to pre-distort the input signal to the power amplifier to create a more accurate output signal.
Bias
Fixed input level, vary frequency
Characterize gain and phase vs bias and frequency
3
Agilent Confidential Page 5
Characterization SolutionsBias
IN OUT
Network Analyzer OUT/IN
Classic Solution
LO
UE…. 8960 Wireless Test Set
Measurement Subsystem
8960-based Solution
Agilent Confidential Page 6
8960 Wireless Test Set Phase & Amplitude vsTime Measurement Solution• Agilent has taken a very flexible approach to the Phase & Amplitude
vs Time Measurement• Agilent’s solution provides the user with either :
• Raw magnitude/phase waveform samples, or• Flexible measurement to provide high accuracy amplitude, phase
and frequency information over wide dynamic range
4
Agilent Confidential Page 7
Flexibility FeaturesSupports Variable Pulse Widths
Improves accuracyReduces measurement time
Supports User-Selectable Measurement IntervalsCan be offset from center of pulse widthAvoid edge transientsMultiple measurements on a single pulse
Supports Aperiodic Return to Reference LevelReduces measurement timeAllows user to optimize against LO instability
User Defines Computation of Final ResultsAllows user to optimize for their situation
Agilent Confidential Page 8
Flexible Phase & Amplitude vs Time Measurement
User Provides:• Power Level of Largest Pulse in
Sequence• Expected Frequency• Trigger Level• Temporal location of center of
the measurement interval in each pulse to be analyzed
• Measurement interval within each pulse to be analyzed
Time
Pow
er
0 t0 t1 t2 t3 t4 t5 t6 t7 t9t8 t10
u0
u1
u2 u3
u4 u7 u9
u5
u6
u8
u10
TriggerLevel
p0
p4
p7p9
p1
p2
p5
p6
p8
p10
p3
User Provided
Agilent ReturnedProvided by Handset DeveloperData Returned by Agilent 8960
Test waveform returns to reference level to mitigate instabilities in the UE local oscillator.User selects measurement duration and center to improve accuracy and avoid transients at pulse edges.
5
Agilent Confidential Page 9
Measuring the Waveform
ti tjui ujti,j =center of
measurement intervals (not
pulse centered)
ui,j =width of
measurement intervals (vary due
to pulse level)
j does not need to be sequential to i
Agilent Confidential Page 10
Time
Phas
e
0t0 t1 t2 t3 t4 t5 t6 t7 t9t8 t10
a4
a7
a10
a1
a2
a5
a6a8
a9
a3
d1,0
d2,0
d3,4d5,4
d6,7 d8,7
d10,9
w9
w7
w4
w0
( ), 360n r n r r n rd a a F t t= − + −⎡ ⎤⎣ ⎦
Customer Provided
Agilent Returned
Customer Calculated
Flexible Phase & Amplitude vs Time MeasurementExample of User Computation of UE Phase Shift vs Level
Results Returned for Initial ‘Reference’Pulse (first measurement requested):• Power, estimated power of pulse in dBm• Phase, of pulse at specific time in
degrees (0 deg for initial pulse)• Frequency, delta frequency from
expected input frequency
Results Returned for Each Pulse (after initial ‘Reference’ pulse):
• Power, delta power of pulse from 1st
reference pulse (dB)• Phase, delta phase of pulse from 1st
reference pulse (degrees)• Frequency, delta frequency from delta
frequency of 1st reference pulse (Hz)
Use multiple reference pulses to compute UE phase shift using interpolation ( e.g. Quadratic, Spline)
Provided by Handset DeveloperData Returned by Agilent 8960Data calculated by user
Extrapolation
6
Agilent Confidential Page 11
Key PAvT Capability• Measurement Intervals
• Count – 512 max, 1 min• Width – 400 msec max, 100 usec min• Center – 400 msec max, 50 usec min
• Trigger• Threshold – 30 dB max, 0 dB min• Source – RF Rise, Immediate, External• Delay – 10 msec max, 0 sec min
• Dynamic Range - -20 dBm to +35 dBm• Reference Power must be within 3 dB of Expected Power• Operation is only available over remote user interface
www.agilent.com.tw
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