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1IEEE C37.94 Module

IEEE C37.94TM

Module forthe MTT and xDSL Familyof Products

MAN-22454-001 Rev. B00

302 Enzo Drive San Jose, CA 95138

Tel: 1-408-363-8000 Fax: 1-408-363-8313

Users ManualSSMTT-45M

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2 SSMTT-45

WarningUsing the supplied equipment in a manner not specied by SunriseTelecom may impair the protection provided by the equipment.

CAUTIONS! Do not remove or insert the module while the test set is on. Inserting or re -

moving a module with the power on may damage the module. Do not remove or insert the software cartridge while the test set is on. Oth -

erwise, damage could occur to the car tridge.

End of Life Recycling and Disposal InformationDO NOT dispose of Waste Electrical and Electronic Equipment(WEEE) as unsorted municipal waste. For proper disposal returnthe product to Sunrise Telecom. Please contact our local ofcesor service centers for information on how to arrange the returnand recycling of any of our products.

EC Directive on Waste Electrical and Electronic Equip-ment (WEEE)

The Waste Electrical and Electronic Equipment Directive aims tominimize the impact of the disposal of electrical and electronicequipment on the environment. It encourages and sets criteriafor the collection, treatment, recycling, recovery, and disposal ofwaste electrical and electronic equipment.

2010 Sunrise Telecom Incorporated. All rights reserved.

Disclaimer: Contents subject to change without notice and arenot guaranteed for accuracy.

Note : C37.94 is a trademark of IEEE.

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3IEEE C37.94 Module

IEEE C37.94 Module

1 IEEE C37.94 Module ......................................... 5

1.1 Module Layout .................................................................. 5

1.2 Test Set LEDs ................................................................... 6

1.3 Keys .................................................................................. 8

2 Menus ................................................................ 9

2.1 Test Conguration ........................................................... 10

2.2 Send Test Pattern ........................................................... 11

2.3 Measurement Results ..................................................... 12

2.4 Propagation Delay .......................................................... 172.5 View Received Data ....................................................... 18

2.6 View/Store/Print .............................................................. 192.6.1 Saving a Test ............................................................... 202.6.2 Viewing a Stored Test .................................................. 202.6.3 Printing a Stored Test .................................................. 212.6.4 Deleting a Stored Test ................................................. 212.6.5 Locking and Unlocking a Stored Test........................... 212.6.6 Renaming a Stored Test .............................................. 21

2.7 Proles ............................................................................ 22

3 Applications .................................................... 23

3.1 Accept a New Circuit ...................................................... 23

3.2 Checking for Frequency Synchronization ....................... 24

3.3 Measuring Signal Level .................................................. 25

3.4 Measuring Round Trip Circuit Delay ............................... 25

3.5 Observing Header, Overhead Data, and Channel Data . 26

4 Reference ........................................................ 27

4.1 Handling of Optical Fiber ................................................ 274.2 Fiber Optic Connectors ................................................... 284.3 Cleaning Optical Fiber .................................................... 294.4 Eye Safety ...................................................................... 294.5 Express Limited Warranty ............................................... 30

Index ..................................................................... 31

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4 SSMTT-45

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5IEEE C37.94 Module

1 IEEE C37.94 Module

1.1 Module Layout

Figure 1 Module Top and Connector Side Views

The module has two ST TM optical connector ports: Rx is the receive port. Tx is the transmit port.

The module contains two LEDs: RX glows green when a signal is detected. TX ON glows yellow when the laser is on. Turn the laser off by

turning the MODULE LED off on the chassis.

Note : ST is a trademark of AT&T.

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1.2 Test Set LEDs

SSMTT-ACM, -ACM+, -EX

SSMTT-B, -C

Figure 2 Test Set LED Panels

The following test set LEDs shown in the previous gure are used.Note if an LED is blinking, press HISTORY to clear.

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7IEEE C37.94 Module

MODULE Green: Indicates that the test set is in module mode. Red: An error in recognizing module has occurred.

SIGNALDisplays the status of the received signal.

Green: Test set is receiving a signal. Red: Loss of signal per IEEE C37.94.

LP1 SYNC Green: The test set has achieved pattern synchronization with

a received pattern that matches the pattern selected in theSEND TEST PATTERN screen.

Red: Pattern received by the test set does not match the pat -tern selected in the SEND TEST PATTERN screen.

BIT ERR

Red: The test set is currently detecting bit errors. Blinking Red: The test set previously detected bit errors, but

they are no longer present.

AIS Red: Indicates an Alarm Indication Signal is detected. Blinking Red: An AIS was detected, but it is no longer present.

ALARM Red: The test set is detecting an alarm. It is inactive when no

alarms are detected. Blinking Red: An alarm was detected, but it is no longer pres -

ent.

FRAME Green: Indicates that the test set has achieved frame sync and

the framing found on the received signal matches the framingset in Test Conguration.

Red: Indicates that the con gured framing type is not found onthe received signal. This could indicate either a loss of framingon the received signal or a framing mismatch.

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1.3 Keys

Figure 3 Test Set Keypad

In addition to the ENTER, ESC, and keys, the moduleuses the following keys:

HISTORY : Like other modules, this key clears the ashing historycondition of the LEDs. It does not clear the results.

ERR INJ : Press to inject one bit error into the transmit signal.AUTO : Press to auto-congure to the received test pattern. Thetest set begins to transmit this test pattern and the setting is up-dated in the SEND TEST PATTERN screen. If the test set cannotdetect the received test pattern, it will continue transmitting theoriginal pattern.

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9IEEE C37.94 Module

2 Menus

Press MODULE to access the module main menu. The menu

tree shown in the following gure outlines the functions of thismodule.

MODULEKey

IEEE C37.94 MAIN MENU2.1TEST CONFIGURATION

2.3

MEASUREMENT RESULTS2.4PROPAGATION DELAY2.5VIEW RECEIVED DATA 2.6VIEW/STORE/PRINT

2.2SEND TEST PATTERN

2.7PROFILES

Figure 4 Module Menu Tree

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2.1 Test Conguration

INC DEC 1x64K

11:50:45

TEST CONFIGURATION

TEST RATE : 1x64 Kbit/sTx DATA : TEST PATTERNCLOCK : INTERNAL

Figure 5 Test Conguration Screen

Con gure the following:

TEST RATEOptions: 1x64 through 12x64 Kbit/s via INC (F1) and DEC (F2),or use the default of 1x64 Kbit/s (F3)

Set the testing rate.

Tx DATAOptions: TESTPAT (F1), LOOP (F2)

TESTPAT: In this, a test pattern that is selected in the SENDTEST PATTERN screen is transmitted.

LOOP: In this, the signal received on the RX port will be trans -mitted out the TX port.

CLOCKOptions: INTERNL (F1), RECEIVE (F2)

INTERNL: Use the internal timing of the test set. This timing isnot synchronized to the network. Use internal timing in loopbacktesting where synchronization is not required.

RECEIVE: The test set uses the timing from the signal receivedon the Rx port from the line as the clock source.

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11IEEE C37.94 Module

2.2 Send Test PatternUse this screen to select a normal (F1) or inverted (F2) test pat -tern to transmit. The state and type of currently transmitted test

pattern is indicated at the bottom of the screen.

NORMAL INVERT

11:50:45

SEND TEST PATTERN

63 127 511 2047 2e15 2e20 2e23 QRSS 1-8 ALL 1 ALL 0 1010

TEST PATTERN : 63PAT INVERSION: NORMAL

Figure 6 Send Test Pattern Screen

Use the keys to select a pattern. As soon as a patternis selected, it is transmitted. The available patterns are:511 , 127 , 63 : Industry-standard bit codes used for DDS applica-tions.2047 : Industry-standard 2047 bit code used for DDS applications.2e15 : Industry-standard 2e 15-1 pseudo random bit sequence. It isformed from a 15 stage shift register and is not zero-constrained.2e20 : Industry-standard 2e 20-1 pseudo random bit sequence. It isformed from a 20 stage shift register and is not zero-constrained.2e23 : Industry-standard 2e 23-1 pseudo random bit sequence. It isformed from a 23 stage shift register and is not zero-constrained.QRSS : Industry-standard Quasi Random Signal. It is formed froma 20 stage shift register and is zero-constrained for a maximumof 14 consecutive zeros.1-8 : Industry-standard pattern that is used for stress testing. Itis also called 1:7 in older literature. It is frame aligned (f is theframing bit) as shown in its binary form: f 0100 0000.ALL 1 : Industry-standard all ones pattern is used for stress testing.If sent unframed, it will be interpreted as an AIS (Alarm IndicationSignal). This is it in its binary form: 1111.

ALL 0 : Industry-standard all zeros pattern. It is often used to makesure that clear-channel lines have been properly provisioned forduring circuit turn-up. The pattern is: 0000.1010 : Industry-standard alternating ones and zeros pattern. It isframe aligned with f showing the location of the framing bit. Thepattern is: f 0101 0101.

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2.3 Measurement Results

To observe results:1. From the module main menu, select MEASUREMENT RESULT

and press START (F1).2. Scroll through screens via . The relative screen is indicated

by the scroll bar on the right of the screen.3. Press STOP (F1) when nished.Once started, the test set continuously performs measurementson a received signal. This is indicated by MEAS. When the mea -surement is stopped, MEAS is no longer displayed.You do not need to access MEASUREMENT RESULT for resultsto be compiled. Measurements are automatically restarted everytime the conguration is signicantly changed. The MEASURE-MENT RESULT screens allow viewing the accumulated measure -ments and restarting the measurement process.

Measurements often have a count number displayed on the left-hand side and the corresponding rate or percentage displayedon the right-hand side of the same line.A key concept is G.821 availability. A circuit is available for useonly when the bit error rate is low enough that the signal can getthrough and be understood. A circuit is said to be unavailable at thebeginning of 10 consecutive severely errored seconds. Errors, er-rored seconds, and severely errored seconds are not accumulatedwhen the circuit is unavailable. Therefore, if you start continuouslyinjecting errors from the test set at a 2x10 -3 error rate, you will seeincreasing bit errors, errored seconds, and severely errored sec-onds for the rst 9 seconds. At the tenth second, all the counts willdecrease back to the values they had before the error injection was

started, and the unavailable counter will increase by 10.Once a circuit is unavailable, it becomes available only after 10 con -secutive seconds without severe errors. To continue the previousexample, if you turn the severe error injection off, and then insert 1 or2 errors during the next 5 seconds, you will observe that the unavail -able second counter continues to increase for the rst 9 secondswhile the error counter does not change. Then at the tenth second,the unavailable second counter suddenly decreases by 10 and theerror counter increases by the 1 or 2 errors that you inserted.The following F-keys are common to all result screens:START / STOP (F1): Press to start the measurement, press againto stop the measurement. Note that once the measurement is

stopped, a time stamp screen is available. This screen displaysthe start time, stop time and elapsed time of the measurement.CONFIG (F2): Press to access the TEST CONFIGURATIONscreen. Press ESC to return to the previous result screen.

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PRINT (F3): Press to send all result screens to the serial port.For details, refer to the Serial Port Conguration section of yourchassis Users Manual.

STORE (F4): Press to store all results screens. For details, referto Section 2.6.In addition to the actual measurement data, the following informa -tion is displayed in the upper portion of these screens:ET: Elapsed Time is the time that has passed since the test wasstarted or restarted.RT : Remaining Time in this case is CONTINUETxHZ : Transmit frequencyTxPAT : Transmitted test pattern

Summary Screens

STOP CONFIG

11:50:45 MEASET: 000:00:30 RT: CONTINUETxHz: 1x64K TxPAT:127

SUMMARY

NO ERROR

POWER: -20 dBm FREQ:2048000bps

PRINT STORE STOP CONFIG


SUMMARY

SIGNAL LOSSLOSS: 30 UAS : 30

POWER: -20 dBm FREQ:2048000bps

PRINT STORE

Figure 7 Summary Screens

These screens display a summary of the condition of the line. Ifthere are no errors, the screen on the left in Figure 7 is displayed.If there are errors, the screen on the right in Figure 7 is displayedwith any errors or alarms.

In both screens, POWER in dBm and FREQ (frequency) in bpsis displayed at the bottom of the screens. These readings arederived from the signal received on the RX por t.

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G.821 Bit Error Screen

STOP CONFIG PRINT STORE

11:50:45 MEAS

ET: 000:00:30 RT: CONTINUE

TxHz: 1x64K TxPAT:127

BIT ERROR - G.821

RxHz: 64K RxPAT: 127

BIT : 0 ERR : 0.0e-06ES : 0 %ES : 0.00SES : 0 %SES : 0.00EFS : 0 %EFS : 0.00AS : 0 %AS : 0.00UAS : 0 %UAS : 0.00

Figure 8 G.821 Bit Error ScreenThis screen measures Bit Errors according to ITU G.821. Thefollowing is reported:RxHz : Currently received data rate in Kbps.RxPAT : Currently received pattern.BIT: Count of bit errors that have occurred since the start of thetest. Bit errors are not counted during unavailable time.ERR : Error Rate since the start of the test.ES : Count of the number of Errored Seconds that have occurredsince the start of the test. An ES is any second with at least onebit error. An ES is not counted during an Unavailable Second.

%ES : Percentage of errored seconds that have occurred sincethe start of the test.SES : Count of Severely Errored Seconds since the start of thetest. An SES has an error rate of >10 -3. SES is not counted duringunavailable time.%SES : Percentage of seconds since the start of the test that areSeverely Errored Seconds.EFS : Count of number of Error Free Seconds since the start ofthe test.%EFS : Percentage of summary Error Free Seconds since the startof the test. A summary Error Free Second is a second in which thesignal is properly synchronized and no errors or defects occur.

AS : Count of Available Seconds since the start of the test. AS equalsthe length of the total test time minus any Unavailable Seconds.%AS : Percentage of Available Seconds since the start of thetest.UAS : Count of Unavailable Seconds that have occurred sincethe start of the test. Unavailable time begins at the onset of 10

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consecutive severely errored seconds. The displayed value ofUAS updates after the tenth consecutive severely errored secondoccurs. Unavailable time also begins at a LOS or LOF.

%UAS : Percentage of unavailable seconds since the start of thetest.

Alarm/Defect Screen



ALARM/DEFECT

LOS : 0 LOSS : 0LOF : 0 LOFS : 0AIS : 0 AISS : 0YEL : 0 YELS : 0PATL: 0 PATLS: 0

Figure 9 Alarm/Defect Screen

The following alarms and defects are reported:LOS : Count of the number of occurrences of Loss Of Signal sincethe start of the test.LOSS : Loss Of Signal Seconds is a count of the number of sec -onds during which the signal has been lost during the test.LOF : Count of the number of occurrences of Loss Of Frame sincethe start of the test.LOFS : Loss Of Frame Seconds is a count of seconds since thestart of the test that have experienced a loss of frame.AIS : Number of occurrences of Alarm Indication Signal.AISS : Alarm Indication Signal Seconds is a count of the numberof seconds in which AIS was detected.YEL: Count of the number of occurrences of Yellow alarm (alsoknown as far end alarm) since the star t of the test.YELS : Count of Yellow alarm Seconds since the start of the

test.PATL : Count of the number of occurrences of Pattern Loss sincethe start of the test.PATLS : Count of Pattern Loss Seconds since the start of thetest.

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Optical Power Measurement Screen


10:50:10 MeasET: 000:00:30 RT: CONTINUE

TxHz: 1x64K TxPAT:127

OPTICAL POWER MEASUREMENT

POWER:-20.0 dBmMIN: -30.0 dBm MAX: -10.0 dBm LOS SATURAT

-32 -11

Figure 10 Optical Power Measurement Screen

This screen reports the received optical power at the Rx port. AtPOWER this is the current power. At MIN, this is the minimumreceived power since the start of the test. At MAX, this is themaximum received power since the start of the test. Note if thepower exceeds speci cations, the screen displays OOR (Out OfRange). The reporting range is from -32 to -11 dBm (accordingto IEEE) at a wavelength of 83040 nm.

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2.4 Propagation Delay

RESTART PRINT STORE

11:50:45 MEAS

ET: 000:00:30 RT: CONTINUTxHz:1x64K TxPATL: 127

PROPAGATION DELAY

ROUND TRIP TIME 4880 ms 10000 UI

Figure 11 Propagation Delay Screen

Use this screen to measure the round trip time for transmit (Tx)port signal to return to receive (Rx) port. This test requires aloopback at the far end. If no loopback is detected, the screenindicates this by displaying NO LOOPBACK DETECTED. Themeasurement begins as soon as this screen is displayed.

The following F-keys are available:

RESTART (F1): Press to restate the measurement, resetting allcounters.

PRINT (F2): Press to send this result screen to the serial port.For details, refer to the Serial Port Conguration section of yourchassis Users Manual.

STORE (F3): Press to store all results screens. For details, referto Section 2.6.

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2.5 View Received Data

RESUME PRINT STORE

11:50:45 MEAS

VIEW RECEIVED DATAPage 1NO 76543210 HEX NO 76543210 HEX

01 10011011 9B 09 10010101 802 00001111 0F 10 10011001 A03 01010110 1 11 10101010 F04 01010101 0 12 10101010 F05 01010101 0 13 10101010 F06 01010101 0 14 10101010 F07 01010101 0 15 10101010 F08 01010101 0 16 10101010 F

Figure 12 View Received Data Screen

Use this screen to display data received at the Rx port in binaryand hex. In this screen:

Timeslot 12 is header of each frame. Timeslot 38 is overhead data. Timeslot 932, is channel data. Timeslot 332, each data bit is followed by its complement. To show Data bits clearly, all complement bits are not included

in HEX decode (HEX is not printed in this release).

The page number is indicated at the Page line. To view otherpages press .

The following F-keys are available:PAUSE/RESUME (F1): Press to pause the live presentation ofthe received data. Press again to resume.

PRINT (F2): Press to send all of these result screens to the serialport. For details, refer to the Serial Port Conguration section ofyour chassis Users Manual.

STORE (F3): Press to store all results screens. For details, referto Section 2.6

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2.6 View/Store/Print

Use this screen to store different results to view or print at a latertime. To store results, use the procedure in Section 2.6.1 .

RENAME DELETE moreUN/LOCK

VIEW PRINT moreSAVE

11:50:45

VIEW/STORE/PRINT Free space: 17658 Kbyte NAME TYPE LOCK 1. MEAS0001 IEE 2. MEAS0002 IEE 3. 4. 5. 6. 7. 8. 9.10.

Figure 13 View/Store/Print List Screen


VIEW (F1): View a selected le. See Section 2.6.2 .SAVE (F2): Select a blank line and press this key to save thecurrent measurement results. See Section 2.6.1 .

PRINT (F3): Print a selected le. See Section 2.6.3 .

RENAME (more, F1): Rename a selected le, unless locked. SeeSection 2.6.6 .

DELETE (more, F2): Delete a selected le, unless locked. SeeSection 2.6.4 .

UN/LOCK (more, F3): Protect a selected le from changes ordeleting. See Section 2.6.5 .

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2.6.1 Saving a Test

1. From any screen that contains a STORE F-key, press it andrefer to the previous gure.

2. Use to select an empty line and press SAVE (F4). Alename character screen is displayed as in the following

gure:

INSERT DELETE INPUT SAVE

11:50:45

VIEW/STORE/PRINT

FILENAME:

A a B b C c D d E e F f G g H h I i J j K k L l

M m N n O o P p Q q R r S s T t U u V v W w X x Y y Z z 0 1 2 3 4 5 6 7 8 9 - _ @ ! # $ % &

Figure 14 Character Entry Screen

3. Use to move the cursor to the desired character.Press ENTER to place the desired character on the label. Youmay enter up to 15 characters.

4. Continue this process until the label is complete. Press SAVE(F4) to escape the character grid and return to the STORERESULTS screen.

If a mistake is made in the entry:- Use CLEAR (F1) to clear the entire entry.- Use BACK-SP (F2) to move the insertion point to the left,

along with deleting the character along the way.

2.6.2 Viewing a Stored Test

1. From the module main menu, select VIEW/STORE/PRINT andrefer to Figure 13.

2. Select the desired le by pressing .3. Press VIEW (F1) and the stored screen will appear.

4. When nished, press ESC.

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2.6.3 Printing a Stored Test

1. Connect a SunSet printer to the serial port of the test set. For other types of printers or more information, refer to the

Storing and Printing chapter in the test set chassis UsersManual.


3. Select the desired le by pressing .4. Press PRINT (F3) and the le will begin printing.5. When nished, press ESC.

2.6.4 Deleting a Stored Test


2. Select the desired le by pressing .3. Press DELETE (more, F2) and the le is deleted.

2.6.5 Locking and Unlocking a Stored Test


2. Select the desired le by pressing .3. Press UN/LOCK (more, F3) and the le is locked or unlocked

as indicated to the right of the lename as in Figure 13.

2.6.6 Renaming a Stored Test


2. Select the desired le by pressing .3. Press RENAME (more, F2) and a character screen is displayed

like in Figure 14. Note if the le is locked the screen will notappear.

4. There will be a blinking insertion point after the lename. Youmay do the following to the lename:

Press CLEAR (F1) to erase the lename. Press BACK-SP (F2) to erase the character to the left of the

insertion point. Do nothing to the lename but add characters.

5. Once the lename is edited as in step 4, use tomove the cursor to the desired character in the grid. PressENTER to place the desired character on the label. You mayenter up to 15 characters.

6. Continue this process until the label is complete. Press SAVE(F4) to escape the character grid and return to the VIEW/ STORE/PRINT screen.

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2.7 Proles

Use the Prole function to store commonly used module congu-ration settings.

The following screen contains a DEFAULT pro le. This pro le isbased on the factory standard conguration of this module. Tocreate other proles, change the conguration settings in anyavailable screen. Once all con guration screens are as desired,select PROFILES from the module main menu and select a blankline. Press STORE (F2) and the settings are saved with a genericlename. Use this screen to manage proles. The screen and itsfunctions are as follows:

LOAD RENAME more

DELETE LOCK more

STORE

Note : The DEFAULT file cantbe deleted or unlocked.

11:50:45

PROFILE LIST Free space: 17660 kbyte FILENAME LOADED MODULE LOCK 1.DEFAULT NO IEE

2.P00001 NO IEE 3. SANTA ROSA YES IEE 4. 5. 6. 7. 8. 9.10.

Figure 15 Prole List Screen


LOAD (F1): Press to change all con guration settings of the mod -ule to match the selected pro le. The LOADED column changesfrom NO to YES.

STORE (F2): Press to save all current con guration screens witha generic lename. Currently 10 proles can be saved. The typeof module is indicated in the MODULE column.

RENAME (F3): Select a lename and press F3 to change itsname. A character entry screen is displayed. Use the procedurein Section 2.6.6 to edit the name from step 4.

DELETE (more, F1): Press to delete a selected unlocked pro -le.

LOCK/UNLOCK (more, F2): Press to lock or unlock a selectedprole. Lock a prole to prevent changes. The proles status isindicated by a lock icon in the LOCK column. In the previous gureDEFAULT is locked.

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3 Applications

CAUTION : Plugging into a live circuit may cause a loss of service.

Be sure you are properly trained before proceeding with the fol -lowing application procedures.

3.1 Accept a New Circuit

Loopback

Device

TeleprotectionEquipment

RX

TX

Figure 16 Accept a New Span

1. Verify that the span is not in service. This acceptance test willdisrupt service. Ensure that there is a loopback device at thefar end of the span.

2. From the module main menu, select TEST CONFIGURATIONand con gure as follows:

TEST RATE: as specied by the circuit designTx DATA: TEST PATTERNCLOCK: INTERNAL

When nished, press ESC.

3. Select TEST PATTERN, choose a test pattern, and press ESC.4. Connect the test set to the circuit, as shown in Figure 16.5. Press HISTORY to clear any ashing LEDs.6. Verify that the PAT SYNC LED is green.7. From the module main menu, select MEASUREMENT RE-

SULTS and press START (F3).

8. Verify that the circuit performs to the customers requirementsfor the service delivered by viewing each measurement screen.Use to view the screens.

9. When nished, press STOP (F1) and remove the loop at thefar end of the circuit.

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3.2 Checking for Frequency Synchronization

TX OUT

Equipment

RX IN

TX OUT

Equipment

RX IN

TerminalEquipment

RX

Disconnect

Figure 17 Frequency Synch & Signal Level Connection

Frequency synchronization problems result in bit slips, a majorsource of service impairment.


TEST RATE: as specied by the circuit designTx DATA: not applicableCLOCK: INTERNAL


2. Connect the test set to the circuit as shown in the previousgure.

3. Press HISTORY to clear any ashing LEDs.4. From the module main menu, select MEASUREMENT RE-

SULTS and observe if the FREQ (frequency) value varies fromthe 2.048 Mbps reference frequency.

5. When nished, press STOP (F1).

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3.3 Measuring Signal Level

A signal level measurement can be performed by itself or in con- junction with one of the other tests.

1. Verify that the span is not in service.2. From the module main menu, select TEST CONFIGURATION

and con gure as follows:

TEST RATE: as specied by the circuit designTx DATA: not applicableCLOCK: RECEIVE


3. Plug the test set into the circuit as shown in the previous g -ure.

4. Press HISTORY to clear any ashing LEDs.5. From the module main menu, select MEASUREMENT RE-

SULTS and press until the OPTICAL POWER MEASURE -MENT screen is displayed. Observe the signal level and notethat separate readings are given the MIN (minimum) and MAX(maximum) levels.

3.4 Measuring Round Trip Circuit Delay

Note : This measurement requires a loopback at the far end ofthe circuit.


TEST RATE: as specied by the circuit designTx DATA: TEST PATTERNCLOCK: INTERNAL


2. Connect the test set to the circuit as shown in Figure 16.3. Press HISTORY to clear any ashing LEDs.4. From the module main menu, select PROPAGATION DELAY

and press ENTER to start. Observe the value of the circuit delayreported in both UI (Unit Intervals) and mS (micro seconds).

Note : 1 mS = 1/1,000,000 second5. When nished, press ESC.

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3.5 Observing Header, Overhead Data, and Channel Data

Observe the live data in binary and hexadecimal translations.Decode network overhead codes that are in use and verify the

content of individual channels.1. From the module main menu, select TEST CONFIGURATION

and congure the interface.2. Connect the test set to the circuit as shown in the following

gure:

RX

Line

Figure 18 In Service Monitoring

3. Press HISTORY to clear any ashing LEDs.4. Press ESC to display the module main menu and select VIEW

RECEIVED DATA. The test set will now display data as in thesample screen shown in the previous gure. Scroll throughthe pages of information by using .

Review the data as it is displayed. When codes of interestappear, press PAUSE (F1) to trap all pages of data and viewcode.

The code is presented as it appears in the bit stream andis broken out into timeslots. Timeslot 0102 is the header,0308 is the overhead data, and 0932 is the channel data(test pattern). Each data bit follows by its complement in timeslot 0332.

Note : HEX decode does not apply to complement bits.5. When nished, press ESC.

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4 Reference

4.1 Handling of Optical FiberProper handling of optical ber cables, connectors, and equipmentis important in obtaining accurate measurements and prevent-ing potential transmission problems. This section reviews properhandling procedures for optical ber.

SC Connector Bulkhead Adapter FC Connector

Key

Alignment SleeveKey

Barrel

Ferrule

Figure 19 Optical Connectors and Adapters

Fiber Optic Patch Cord BasicsFiber optic patch cords come in two categories: Single-mode,which are yellow and Multi-mode, which are orange. The termssingle-mode and multi-mode describe physical transmissionmechanisms of the ber and do not refer to the quality of the ber.

Single-mode and multi-mode transmission equipment are notusually interconnected. Multi-mode is used for shorter transmis-sion distance and in general is less expensive than single-mode.For testing and analysis purposes, single-mode and multi-modemay be mixed.

Considering the fact that an optical ber is a strand of glass aboutthe same diameter as a human hair, ber optic patch cords andconnectors are remarkably durable. However, careful handling willensure continued high performance and long life. Do not pull orkink patch cords, as the glass strand in the middle might becomedamaged or broken.

Even if the ber is not permanently damaged, a sharp bend will

cause excessive signal loss. Fiber optic cables work by bendingthe light signal as it travels. But, the light can only tolerate so muchbending. Keep patch cord bend radii to no less than an inch. Usespecialized optical cable raceways and plenums whenever avail -able. Never use tie wraps as you would with electrical cables.

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4.2 Fiber Optic Connectors

Alignment Sleeve Ferrule of Connector B

Ferrule of Connector A Alignment SleeveFiberFiber End Faces Touch

Figure 20 Cross-Sectional View of Connectors

In the electrical world, female connectors are mated to maleconnectors. In the optical world, the connection mechanism isaltogether different. Fiber optic connector systems are designed toalign two ber ends so that the light signal will pass between them;imagine trying to align two hairs end to end. Modern ber opticconnector systems solve this nearly impossible task. There areseveral types of optical connectors in use today. Figure 19 showsthe two most popular, SC and FC. In this example, an SC to FCbulkhead adapter is used to connect the two bers together.In Figure 20, a schematic of the connector cross section demon-strates the details of the connection mechanism. Ceramic ferruleson the connector ends are kept in alignment by a sleeve in theconnector bulkhead adapter. The ber itself is mounted in theexact center of the ferrule. When the ferrules are aligned by thesleeve, so are the bers. Springs in the connector bodies provide

consistent pressure so that the two connector end faces are as -sured to be in contact with each other. Since all tolerances mustbe kept extremely tight, it is amazing that the typical connectorsignal loss is usually less than a couple tenths of a dB.When using optical connectors, insert or remove the ferrulestraight into the sleeve. Try to minimize wiggling the connector asthis may loosen the tight t between the ferrule and sleeve. ForSC connectors, orient the prominent key on the connector body(Figure 19) with the slot in the bulkhead adapter. Push the con -nector until it clicks. To remove, pinch the connector body betweenyour thumb and nger, and gently pull straight out.FC connectors require more care. Find the small key and orient itwith the equally small slot in the threaded section of the bulkheadadapter. Even in Figure 19, this key is not very visible. Thread theouter barrel only lightly nger tight. Never use pliers! Over tight -ening the barrel will not improve signal transmission and couldcause permanent damage. To remove, unthread the barrel, andgently pull straight out.

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Most problems with FC connectors are due to key misalignment.This is dif cult to detect since even when the key is misaligned, thebarrel can be threaded, which then hides the misaligned key. A hint

is when the barrel only catches the rst one or two threads. Also, theconnector will not be completely seated in the bulkhead adapter.

4.3 Cleaning Optical FiberFiber optic connectors must be kept clean to ensure long life andto minimize transmission loss at the connection point. When not inuse, always replace dust covers and caps to prevent deposits and

lms from airborne particles. A single dust particle caught betweentwo connectors will cause signi cant signal loss. Even worse, dustparticles can scratch the polished ber end, resulting in permanentdamage. Do not touch the connector end or the ferrules, since thiswill leave an oily deposit from your ngers. Likewise, do not allowuncapped connectors to drop on the oor.Should a ber connector become dir ty or exhibit high loss, care-fully clean the entire ferrule and end face. Special lint-free padsshould be used with isopropyl alcohol. Even though not very ac -cessible, the end face in a bulkhead adapter on test equipmentcan be cleaned by using a special lint-free swab, again withisopropyl alcohol. In extreme cases, test equipment may requiremore thorough cleaning at the factory.Cotton, paper, or solvents should never be used for cleaning sincethey may leave behind particles or residues. Use a ber opticcleaning kit especially made for cleaning optical connectors, andfollow the directions. Some kits come with canned air to blow anydust out of the bulkhead adapters. Be cautious, as canned air cando more harm than good if not used properly. Again, follow thedirections that come with the kit.

4.4 Eye Safety

It is good safety practice to never look directly into the end of aber or bulkhead adapter. You may be working with equipment that

transmits at high power and are not eye-safe. For added safety, turnthe laser off when not in use. In any case, the wavelengths used intelecommunications are not visible, so the presence of an opticalsignal cannot be determined by looking into the ber end.

Summary

Take care of your ber. Always replace dust covers. Keep opticalconnectors clean and make a practice of not looking into berends.

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30 SSMTT-45

4.5 Express Limited Warranty

This Sunrise Telecom product is warranted against defects inmaterials and workmanship during its warranty period. The war -

ranty period for this product is contained in the warranty page onhttp://www.sunrisetelecom.com.

Sunrise Telecom agrees to repair or replace any assembly orcompo nent found to be defective under normal use during thisperiod. The obligation under this warranty is limited solely to re -pairing or replacing the product that proves to be defective withinthe scope of the warranty when returned to the factory. This war -ranty does not apply under certain conditions, as set forth on thewarranty page on http://www.sunrisetelecom.com.

Please refer to the website for speci c details.THIS IS A LIMITED WARRANTY AND THE ONLY WARRANTYMADE BY SUNRISE TELECOM. SUNRISE TELECOM MAKES

NO OTHER WARRANTY, REPR SENTATION OR CONDITION,EXPRESS OR IMPLIED, AND EXPRESSLY DISCLAIMS THEIMPLIED WARRANTIES OF MERCHANTABILITY, FITNESSFOR A PARTICULAR PURPOSE AND NON-INFRINGEMENTOF THIRD PARTY RIGHTS.

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Index

AApplicationsAccept a New Circuit; 23Checking for Frequency Synchronization; 24Measuring Round Trip Circuit Delay; 25Measuring Signal Level; 25Observing Header, Overhead Data, and Channel Data; 26

CCautions; 2

FFiber Optic

Cleaning Optical Fiber and Connectors; 29Connectors; 28Eye Safety; 29Patch Cord Basics; 27

Figures01 Module Top and Connector Side Views; 502 Test Set LED Panels; 603 Test Set Keypad; 804 SSMTT-45 Menu Tree; 905 Test Con guration Screen; 1006 Send Test Pattern Screen; 1107 Summary Screens; 1308 G.821 Bit Error Screen; 1409 Alarm/Defect Screen; 1510 Optical Power Measurement Screen; 1611 Propagation Delay Screen; 1712 View Received Data Screen; 1813 View/Store/Print List Screen; 1914 Character Entry Screen; 2015 Pro le List Screen; 2216 Accept a New Span; 2317 Frequency Synch & Signal Level Connection; 2418 In Service Monitoring; 2619 Optical Connectors and Adapters; 2720 Cross-Sectional View of Connectors; 28

HHandling of Optical Fiber; 27

KKeys used by the module; 8

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32 SSMTT-45

MMeasurement Results

Alarm/Defect Screen; 15

G.821 Bit Error Screen; 14Optical Power Measurement Screen; 16Summary Screens; 13

Measurement Result DenitionsET; 13PATT; 13RT; 13TxCK; 13

Module Layout; 5Module Menu Tree; 9

PPro les; 22

Propagation Delay; 17

TTest Conguration Screen

CLOCKINTERNL & RECEIVE; 10

TEST RATE; 10Tx DATA

TESTPAT & LOOP; 10Test Patterns; 11Test Set LEDs; 6

MODULE (SSMTT) or xDSL (SSxDSL); 7

VView/Store/Print

Deleting; 21Locking and Unlocking; 21Printing; 21Renaming; 21Saving; 20Viewing; 20

View Received Data; 18

WWarnings; 2Warranty; 30

Documents

MAN-22454-001_B00_SSMTT-45_MMD