Practica 4 Rayos Gamma

7/25/2019 Practica 4 Rayos Gamma

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INSTITUTO TECNOLOGICO DE TLALNEPANTLA

MATERIA: MECANICA DE MATERIALES 2PRACTICA: 4

RAYOS GAMMA

PROFESOR: ING. IGNACIO CEDILLO VILLAGRAN

ALUMNO: ZETINA MIRELES DIEGO IVAN.

NUMERO DE CONTROL: 11250487

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CARRERA PLAN DEESTUDIOSNOMBRE DE LA

ASIGNATURACLAVE DE LAASIGNATURA

PROFESOR:

INGENIERAMECNICA

COMPETENCIASMECNICA DEMATERIALES II

MED1021ING. IGNACIO

CEDILLOVILLAGRN

PRCTICA No. LABORATORIO DENOMBRE DE LA

PRCTICADURACIN

INGENIERAMECNICA

!RAYOS GAMMA"

INDICE

I.O#$ETIVO

II. CONSIDERACIONES TEORICAS 4

III. METODOLOGIA DEL ENSAYO 1

IV. RESULTADO 15

V. E%UIPO UTILIZADO 1&

VI. NORMA UTILIZADA 20

VII. CUESTIONARIO 22

VIII. CONCLUSIONES 2

I'. #I#LIOGRAFIA 24

2


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I. OBJETIVO

G()(*+,

C-)-(* /)+ ( ,+ */(3+)- (*/6+ *(+,++ + ,- +(*+,(+*+ ((+* (,+(*+, ( +)- - *(()+ -))/+(.

P+*/,+*

O3(*6+* ,+ *(+,+9) ( ,+ */(3+ /,*+9)+ /,+)- /) +,+-* )-*+, /) +,+-*+);/,+*

R(-)-(* ,+ +*+(*- (6()+?+ ( ,+ +,+9) ( /)+ */(3+ /,*+9)+.

II. CONSIDERACIONES TEORICAS

L+ +,+-)( ( ,+ *++-)( -)+)( () (, @3- )/*+, -) / )/(*-+ 6+*++. A


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L+ *)+,( /+,+( ( ,+ *++9) -)+)( ( /,+ +*+ / +,+9) () )/*+-):

Atraviesa!"eetra #a $ateria. L+ +++ ( ,+ *++-)( -)+)( +*++*+6(+* ,+ +(*+ 6+*


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E( /)+ 3/()+ *(,+9) -(3()(B-.

E) ,+ +3,+ ( /(*+) ,- )- ++*+- (()( ,+ +*+(*


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Uso &e ra&ia%ioes ioi,ates e &i-eretes ti"os &e $e&i&ores.

PROCESOS DE TRATAMIENTO: POLIMERIZACIJN Y ESTERILIZACIJN

L+ ()(*;


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Po#i$eri,a%i(

L- -,


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C-) ,+ -,(*+9) ( -);/() +(*+,( -) +-* *(()+ +, +,-* + ,+ -+9)-) (?-*( *-(+( ( -*( -) +-* (+3,+ (@)+.

L- )(/@- (=/- (,(*9)- /3(*


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A*+.

Materia#es +e "+e&e esteri#i,arse %o ra&ia%i( ioi,ate

E )((+*- +(;/*+* =/( ,+ - ( *++9) =/( ( +)*+ +, +(*+, =/( ( =/(*(((*,+* ( ,- /B()(()( +,+ -- +*+ (,)+* ,- *--*;+)- =/( /(+ +3(*.P+*+ (,,- ( /,+ (, *)- SAL HN6(, ( ;+*+)


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METODOLOGIA DEL ENSAYO

D(+**-,,- *@-

I)+-*( ( C+,+ ( +;() H()(*9(*-

L- )+-*( ( +,+ ( +;() -)() () +,+3*( - ,+=/(+ (+,-)++ (, - +(*+,=/( (, -3?(- + *+-;*+B+* /- @(*- - ((-*( *(*(()+) -* (?. E, 1 2 (, ((-*@- (, -3?(- (*()- (6+,/+* -* -+*+9) ,+ +,+ *+-;*@B+. E, )+-* ( -,-+ -3*(,+ +*+ (, -3?(- =/( ()B*()+ ,+ *++9) () ,+ +*( @ +,(?++ (, B, H-)+ ( +-* ((-* () ,+-9) ;(-*+()( @ (B+6-*+3,( -* (?(,- () (, (*(- @ +,(?+- *((- (, /)- ()=/( ,+ *++9) )( )-*+,()(.

E, ((-* (, ,- - (+,9) @ (,;+- =/( (+ 63,( () ,+ *+-;*+B2 H24

..

Estos ensayos se utilizan en industria para detectar defectos o detalles internos de lamuestra o material, por ejemplo, para verificar las uniones de soldadura en tuberas.

Los ensayos no destructivos se basan en el siguiente principio: Los materiales cuandoson irradiados absorben parte de la energa de radiacin de manera proporcional alespesor y densidad del material. As, cuanto ms denso y espeso sea el material, msenerga absorber y por tanto menos energa llegar a la placa fotogrfica dando unase!al ms clara "en una escala del blanco al negro#. $or el contrario cuando el color de

la placa fotogrfica es negro "o muy oscuro# indica que el material que %a atravesadola radiacin es de poco grosor o densidad, lo que sera indicativo de que el materialest desgastado y por tanto puede romperse.

&ependiendo del tipo de radiacin utilizada en el ensayo no destructivo, se %abla deradiografas "'ayos (#, gammagrafas "'ayos gamma# o neutrografas"neutrones#.

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Imgenes de algunos de los equipos utilizados en los ensayos no destructivosLos ensayos no destructivos permiten ver el interior de muc%os objetos o materiales,por lo que son t)cnicas muy valiosas para comprobar las soldaduras en tuberas"gaseoductos y oleoductos#, el control de calidad de piezas metlicas fundidas o piezascermicas, o para detectar %uecos o materiales de baja densidad dentro de materiales

de elevada densidad "combustibles slidos, circuitos impresos#.

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En la imagen se muestran tres radiografas %ec%as a tuberas. En la imagen de laizquierda puede observarse justo en el centro de la tubera una lnea negra "msoscura que el resto#, que indicara que en esa zona la tubera est desgastada y podraromperse. En la imagen de la derec%a se observan unos puntos muy oscuros, que

indicaran muy poco espesor de material en esa zona.

Neutrografas de distintos materiales y equipos.

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Los ensayos no destructivos tambi)n se utilizan en temas de seguridad y vigilancia.*odos los detectores de seguridad de aeropuertos, correos, edificios oficiales, etc.

utilizan los rayos ( para escanear bultos o personas.

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RESULTADOS

L+ )+ ( 3++ () ,+ )-*-*+9) ( 9-- *++6- H*+-)/,(- + ((*)+- +(*+,(-) (, -3?(6- ( (;/* (, /*- - -)-(* (, --*+()- ( - (+)( ,+ ((9) ( ,+*++-)( (+.

L- 9-- *++6- /,+- -- *++-*( ()() ,+ 6()+?+ ( =/( ( /(() )-*-*+* +/+,=/(* *-(- ) +,(*+*,-. A(@ ( /(() ((+* + +)+ () -)()*+-)( - 6(,-+( ( B,/- () /3(*


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Sondas neutrn-gamma

P-* ,- +)- ,+ -))/+ *(()( () (, +(*+, ( ()/()*+ + 0.707 () B-*+ -*-)+, +, +,+-* + 0.707 ( *-B/)+.

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U- +,+-)(

T*++-*(

L+ )/*+ =/( /,+) ,+ )+ (,- *++-*( +3+*+) /)+ +,+ ;++: QC+*39) QP(*9,(- ;+ (*-=/


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IV. NORMAS UTILIZADAS

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Desi)a%i( Tit+#o

E//0 1 /2 S+)+* P*+( B-* U,*+-) P/,(E- S*+;#(+ C-)+ T();E/34 1 /5 S+)+* P*+( B-* F+3*+-) +) C-)*-, -B A,/)/ A,,- U,*+-)

S+)+* R(B(*()( #,-E/60 1 /7 S+)+* P*+( B-* C-)+ U,*+-) T(); -B (,()E3/7 1 /0e/ S+)+* P*+( B-* U,*+-) T(); -B M(+, P( +) T/3);E347 1 /5 S+)+* P*+( B-* U,*+-) T(); -B ( (, Z-)( -B (,( P(

+) T/3);E7/4 1 // S+)+* P*+( B-* E6+,/+); P(*B-*+)( C+*+(* -B U,*+-)

P/,(E- T(); I)*/() +) S( -/ ( U( -B E,(*-)M(+/*(() I)*/()

E038 1 28932/7 S+)+* P*+( B-* F+3*+-) +) C-)*-, -B M(+, O(* +)

A,/)/ R(B(*()( #,- U( ) U,*+-) T();E0;0 1 /2 S+)+* P*+( B-* M(+/*); U,*+-) V(,- ) M+(*+,E584 1 /2 S+)+* P*+( B-* U,*+-) A);,(#(+ C-)+ T();E660 ! E660M 1/5

S+)+* P*+( B-* ( M(+/*(() -B ( A+*() A()/+-) -BL-);/)+, U,*+-) +6( 3 I(*-) M(-

E4;4 ! E4;4M 1/2

S+)+* P*+( B-* M(+/*); T)( 3 M+)/+, U,*+-) P/,(E- C-)+ M(-

E/22/ 1 // S+)+* P*+( B-* D((-) +) E6+,/+-) -B D-))/( 3 (I(*( P/,(E- U,*+-) M(- U); L-);/)+, +6(

E/265 !E/265M 1 /0

S+)+* G/( B-* E6+,/+); C+*+(* -B U,*+-) S(+* U)

E//58 1 /0 S+)+* G/( B-* M+(*+, S(,(-) +) F+3*+-) -B R(B(*()( #,-B-* ( P/,( L-);/)+, +6( U,*+-) T(); -B M(+, +) M(+, A,,-P*-/-) M+(*+,

E/730 1 // S+)+* G/( B-* M(+/*); S-( E,(*-) C+*+(* -B U,*+-)T(); I)*/()

E/440 1 /3 S+)+* G/( B-* E,(*-+;)( A-/ T*+)/(* HEMATE/8/6 1 /3 S+)+* P*+( B-* U,*+-) T(); U); E,(*-+;)( A-/

T*+)/(* HEMAT T()=/(E/;2/ 1 /7 S+)+* G/( B-* D((-) +) E6+,/+-) -B D-))/( 3 C-)+

P/,(E- S*+;#(+ U,*+-) M(-E/;6/ 1 // S+)+* P*+( B-* M(+)( U,*+-) T(); -B G* (, U);

Z-)+, D*)+-) F-/( S(+* U)E/;63 1 /0 S+)+* P*+( B-* U,*+-) S/*B+( T(); U); E,(*-+;)(A-/ T*+)/(* HEMAT T()=/(

E322/ 1 /7 S+)+* G/( B-* R(-)+) U,*+-/) S(*-- B-* D(B( D((-)) #- M(+,, +) N-)(+,, P+*

E3/;3 1 /7 S+)+* G/( B-* P,+)+* F,+ (; S); 3 U,*+-)E3337 1 /7 S+)+* P*+( B-* E+)+-) -B S(+,( G+F,,( S((, P*(/*(

V((, U); A);,( #(+ U,*+-)

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http://www.astm.org/Standards/E114.htmhttp://www.astm.org/Standards/E114.htmhttp://www.astm.org/Standards/E127.htmhttp://www.astm.org/Standards/E127.htmhttp://www.astm.org/Standards/E127.htmhttp://www.astm.org/Standards/E164.htmhttp://www.astm.org/Standards/E164.htmhttp://www.astm.org/Standards/E213.htmhttp://www.astm.org/Standards/E213.htmhttp://www.astm.org/Standards/E273.htmhttp://www.astm.org/Standards/E273.htmhttp://www.astm.org/Standards/E273.htmhttp://www.astm.org/Standards/E317.htmhttp://www.astm.org/Standards/E317.htmhttp://www.astm.org/Standards/E317.htmhttp://www.astm.org/Standards/E317.htmhttp://www.astm.org/Standards/E428.htmhttp://www.astm.org/Standards/E428.htmhttp://www.astm.org/Standards/E428.htmhttp://www.astm.org/Standards/E494.htmhttp://www.astm.org/Standards/E494.htmhttp://www.astm.org/Standards/E587.htmhttp://www.astm.org/Standards/E587.htmhttp://www.astm.org/Standards/E664.htmhttp://www.astm.org/Standards/E664.htmhttp://www.astm.org/Standards/E664.htmhttp://www.astm.org/Standards/E664.htmhttp://www.astm.org/Standards/E797.htmhttp://www.astm.org/Standards/E797.htmhttp://www.astm.org/Standards/E797.htmhttp://www.astm.org/Standards/E797.htmhttp://www.astm.org/Standards/E1001.htmhttp://www.astm.org/Standards/E1001.htmhttp://www.astm.org/Standards/E1001.htmhttp://www.astm.org/Standards/E1065.htmhttp://www.astm.org/Standards/E1065.htmhttp://www.astm.org/Standards/E1065.htmhttp://www.astm.org/Standards/E1158.htmhttp://www.astm.org/Standards/E1158.htmhttp://www.astm.org/Standards/E1158.htmhttp://www.astm.org/Standards/E1158.htmhttp://www.astm.org/Standards/E1324.htmhttp://www.astm.org/Standards/E1324.htmhttp://www.astm.org/Standards/E1324.htmhttp://www.astm.org/Standards/E1774.htmhttp://www.astm.org/Standards/E1774.htmhttp://www.astm.org/Standards/E1816.htmhttp://www.astm.org/Standards/E1816.htmhttp://www.astm.org/Standards/E1816.htmhttp://www.astm.org/Standards/E1901.htmhttp://www.astm.org/Standards/E1901.htmhttp://www.astm.org/Standards/E1901.htmhttp://www.astm.org/Standards/E1961.htmhttp://www.astm.org/Standards/E1961.htmhttp://www.astm.org/Standards/E1961.htmhttp://www.astm.org/Standards/E1962.htmhttp://www.astm.org/Standards/E1962.htmhttp://www.astm.org/Standards/E1962.htmhttp://www.astm.org/Standards/E2001.htmhttp://www.astm.org/Standards/E2001.htmhttp://www.astm.org/Standards/E2001.htmhttp://www.astm.org/Standards/E2192.htmhttp://www.astm.org/Standards/E2192.htmhttp://www.astm.org/Standards/E2223.htmhttp://www.astm.org/Standards/E2223.htmhttp://www.astm.org/Standards/E2223.htmhttp://www.astm.org/Standards/E114.htmhttp://www.astm.org/Standards/E114.htmhttp://www.astm.org/Standards/E127.htmhttp://www.astm.org/Standards/E127.htmhttp://www.astm.org/Standards/E127.htmhttp://www.astm.org/Standards/E164.htmhttp://www.astm.org/Standards/E164.htmhttp://www.astm.org/Standards/E213.htmhttp://www.astm.org/Standards/E213.htmhttp://www.astm.org/Standards/E273.htmhttp://www.astm.org/Standards/E273.htmhttp://www.astm.org/Standards/E273.htmhttp://www.astm.org/Standards/E317.htmhttp://www.astm.org/Standards/E317.htmhttp://www.astm.org/Standards/E317.htmhttp://www.astm.org/Standards/E317.htmhttp://www.astm.org/Standards/E428.htmhttp://www.astm.org/Standards/E428.htmhttp://www.astm.org/Standards/E428.htmhttp://www.astm.org/Standards/E494.htmhttp://www.astm.org/Standards/E494.htmhttp://www.astm.org/Standards/E587.htmhttp://www.astm.org/Standards/E587.htmhttp://www.astm.org/Standards/E664.htmhttp://www.astm.org/Standards/E664.htmhttp://www.astm.org/Standards/E664.htmhttp://www.astm.org/Standards/E664.htmhttp://www.astm.org/Standards/E797.htmhttp://www.astm.org/Standards/E797.htmhttp://www.astm.org/Standards/E797.htmhttp://www.astm.org/Standards/E797.htmhttp://www.astm.org/Standards/E1001.htmhttp://www.astm.org/Standards/E1001.htmhttp://www.astm.org/Standards/E1001.htmhttp://www.astm.org/Standards/E1065.htmhttp://www.astm.org/Standards/E1065.htmhttp://www.astm.org/Standards/E1065.htmhttp://www.astm.org/Standards/E1158.htmhttp://www.astm.org/Standards/E1158.htmhttp://www.astm.org/Standards/E1158.htmhttp://www.astm.org/Standards/E1158.htmhttp://www.astm.org/Standards/E1324.htmhttp://www.astm.org/Standards/E1324.htmhttp://www.astm.org/Standards/E1324.htmhttp://www.astm.org/Standards/E1774.htmhttp://www.astm.org/Standards/E1774.htmhttp://www.astm.org/Standards/E1816.htmhttp://www.astm.org/Standards/E1816.htmhttp://www.astm.org/Standards/E1816.htmhttp://www.astm.org/Standards/E1901.htmhttp://www.astm.org/Standards/E1901.htmhttp://www.astm.org/Standards/E1901.htmhttp://www.astm.org/Standards/E1961.htmhttp://www.astm.org/Standards/E1961.htmhttp://www.astm.org/Standards/E1961.htmhttp://www.astm.org/Standards/E1962.htmhttp://www.astm.org/Standards/E1962.htmhttp://www.astm.org/Standards/E1962.htmhttp://www.astm.org/Standards/E2001.htmhttp://www.astm.org/Standards/E2001.htmhttp://www.astm.org/Standards/E2001.htmhttp://www.astm.org/Standards/E2192.htmhttp://www.astm.org/Standards/E2192.htmhttp://www.astm.org/Standards/E2223.htmhttp://www.astm.org/Standards/E2223.htmhttp://www.astm.org/Standards/E2223.htm


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E3747 !E3747M 1 /0

S+)+* P*+( B-* U( -B ( U,*+-) T( -B F,; DBB*+-) HTOFDT()=/(

E3745 128932/7

S+)+* P*+( B-* U,*+-) T(); -B *-/; P*-/

E304; 1 // S+)+* P*+( B-* M(+/*); ( U,*+-) V(,- ) P-,(,()( T+)

+,, U); L+(*+, L-);/)+, HLCR +6(E30;/ 1 /7 S+)+* G/( B-* E6+,/+); P(*B-*+)( C+*+(* -B P+(A**+U,*+-) T(); I)*/() +) S(

E3570 1 /2 S+)+* P*+( B-* P*-( C-()+( R(-)+)( T(); V+ S(S)( I)/ B-* M(+,, +) N-)M(+,, P+*

E3582 1 /3 S+)+* P*+( B-* U,*+-) T(); -B F,+ P+)(, C--( +)S+) C-*( M+(*+, U( ) A(*-+( A,+-)

E3422 1 /0 S+)+* P*+( B-* C-)+ U,*+-) T(); -B (, U); P+(A**+

E3;20 1 /3 S+)+* P*+( B-* C+*+(*+-) +) V(*B+-) -B P+( A**+P*-3(

E3;85 !E3;85M 1 /0 S+)+* P*+( B-* D((*)+-) -B M(+, P/* #+( -) E,+C-)+) M(+/*(() D(*6( B*- R(-)+) U,*+-/) S(*--

19
http://www.astm.org/Standards/E2373.htmhttp://www.astm.org/Standards/E2373.htmhttp://www.astm.org/Standards/E2373.htmhttp://www.astm.org/Standards/E2373.htmhttp://www.astm.org/Standards/E2375.htmhttp://www.astm.org/Standards/E2375.htmhttp://www.astm.org/Standards/E2375.htmhttp://www.astm.org/Standards/E2479.htmhttp://www.astm.org/Standards/E2479.htmhttp://www.astm.org/Standards/E2479.htmhttp://www.astm.org/Standards/E2479.htmhttp://www.astm.org/Standards/E2479.htmhttp://www.astm.org/Standards/E2491.htmhttp://www.astm.org/Standards/E2491.htmhttp://www.astm.org/Standards/E2491.htmhttp://www.astm.org/Standards/E2534.htmhttp://www.astm.org/Standards/E2534.htmhttp://www.astm.org/Standards/E2534.htmhttp://www.astm.org/Standards/E2580.htmhttp://www.astm.org/Standards/E2580.htmhttp://www.astm.org/Standards/E2580.htmhttp://www.astm.org/Standards/E2700.htmhttp://www.astm.org/Standards/E2700.htmhttp://www.astm.org/Standards/E2700.htmhttp://www.astm.org/Standards/E2904.htmhttp://www.astm.org/Standards/E2904.htmhttp://www.astm.org/Standards/E2904.htmhttp://www.astm.org/Standards/E2985.htmhttp://www.astm.org/Standards/E2985.htmhttp://www.astm.org/Standards/E2985.htmhttp://www.astm.org/Standards/E2985.htmhttp://www.astm.org/Standards/E2373.htmhttp://www.astm.org/Standards/E2373.htmhttp://www.astm.org/Standards/E2373.htmhttp://www.astm.org/Standards/E2373.htmhttp://www.astm.org/Standards/E2375.htmhttp://www.astm.org/Standards/E2375.htmhttp://www.astm.org/Standards/E2375.htmhttp://www.astm.org/Standards/E2479.htmhttp://www.astm.org/Standards/E2479.htmhttp://www.astm.org/Standards/E2479.htmhttp://www.astm.org/Standards/E2491.htmhttp://www.astm.org/Standards/E2491.htmhttp://www.astm.org/Standards/E2491.htmhttp://www.astm.org/Standards/E2534.htmhttp://www.astm.org/Standards/E2534.htmhttp://www.astm.org/Standards/E2534.htmhttp://www.astm.org/Standards/E2580.htmhttp://www.astm.org/Standards/E2580.htmhttp://www.astm.org/Standards/E2580.htmhttp://www.astm.org/Standards/E2700.htmhttp://www.astm.org/Standards/E2700.htmhttp://www.astm.org/Standards/E2700.htmhttp://www.astm.org/Standards/E2904.htmhttp://www.astm.org/Standards/E2904.htmhttp://www.astm.org/Standards/E2904.htmhttp://www.astm.org/Standards/E2985.htmhttp://www.astm.org/Standards/E2985.htmhttp://www.astm.org/Standards/E2985.htmhttp://www.astm.org/Standards/E2985.htm


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V. CUESTIONARIO

INVESTIGAR: UNA FORMA DE GENERAR LA ONDA POR MEDIOS ELECTRNICOS OEL


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CONCLUSIONES

C-) (, (+**-,,- ( (+ *@+ ( /- -3(*6+* ,- ;/()(:

S( (/- -+ ,+ )B-*+9) (9*+ )((+*+ +(*+ ( ,+ */(3+ )- (*/6+ (/,*+-)-.

L+ */(3+ ( /,*+-)- ( *(+,++ (+)( ,+ (9) ( /) -)- ( +,+B*(/()+ =/( )- )+ ,- (B(- ( )/(*- +(*+, + *+6 ( ,+ +)+,,+ ( /)-,---.

A, (B(/+* ,+ */(3+ ( /,*+-)- + )/(*+ *-3(+ ( /- -3(*6+* B


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BIBLIOGRAFIA

1* ASM L+)3--R V-,/8() 17. N-)(*/6( E6+,/+-) +) %/+, C-)*-,

2. AS D1.1>D1.1M:2002 . S*//*+, (,); C-( S((,.

. :>>.,,-;+.-8>)/(6+(3>C()*-((+*;+>/,*+8,>/,*+

(-)7)(-)+11/,+)-/8;-/,*+,)R+;2.6(-

4. :>>.;(--,.-8>P*/(3+ )- (*/6+ /,*+-)-

G(-P-,.8

5. N-) (*/6( E6+,/+-). T(-* T()=/( +) A,+-)

P((* $. S/,, HE-*I. E. M+*(, D(RR(*. E.U.A. 2002

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