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SCANNING ELECTRON MICROSCOPE WITH ENERGY DISPERSIVE X-RAY SPECTROMETER (SEM-EDAX)

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SCANNING ELECTRON MICROSCOPE WITH ENERGY DISPERSIVE X-RAY SPECTROMETER (SEM-EDAX)

... ..

.

...

(SEM/EDAX)

/ I.

1.

(Scanning Electron Microscopy, SEM) .

1000x 0.2 m. 30 (, .) 10,000 x. . (TEM, Transmission Electron Microscope) (SEM, Scanning Electron Microscope).

, . (.. ). . . (secondary) (backscattered) . . SEM . , . SEM .2.

. , .

4 .

1) (emission current)

2) (spot size)

3) / (accelerating voltage)

4) ( )

2 :

1) (Charging) ( )2) ( , )

3)

( , )

4)

2.1

(Elastically scattered primary electrons) . (Backscattered Electrons) 30 KeV . . ( ) ( 50 80% ). 180 (Backscattered electrons, BSE). .

, . ~6% ~50%. S . . .

(solid state semiconductor) donut, . .

2.2

(Inelastically scattered electrons), (Secondary electrons, SE)

. ( ).

.

(50eV) , . .

. . .

(+100V) . . (CRT), . .

2.3

(X-Rays): (Bremsstahlung) (Characteristic)

Auger

, ( ) Bremsstahlung. . .

. , . .

( ) . , , eV (Multi Channel Analyzer). (Look Up Table) .

, .

.

Auger

Auger .3. SEM . , , . :

1)

2) , ,

3) .

.

3.1

( ), .

(filament current). , 1-30 KV (accelerating voltage). . , .

, . (filament saturation). , , . , . (emission current 100 ). (filament tip) (Wehnelt cap aperture). .

(condenser lens) ( ). (spot size).

. : () (). . , :

S

, f . , . , , .3.2

SEM, . . 2e-3 Pa. 3.3

(--). Everhart Thornley (ETD), (Large Field Detector, LFD), (Gaseous Electron Dtector GED), (Solid State Electron Detector, SSED) (BSE), (SiLi), - (Energy Dispersive Spetrometer, EDS).

4. . , , , , , , , , , , , . , SEM . . SEM XRD , , , .

, . SEM..

1.

. , . , , . , . , , .

, , . , . , , . , .

2.

Quanta 200 FEI -EDAX. Quanta 200 100,000x 6 nm.

Quanta 200 :

(High Vacum 2e-3 Pa)

(Low Vacum 3-12 Pa)

(ESEM, Environmental Scanning Electron Microscopy) - .

, 2cm 5cm x,y,z . ( ): Everhart Thornley (ETD), Large Field Detector (LFD), Gaseous Electron Dtector (GED), Solid State Electron Detector (SSED) (EDX). :

EDAX Genesis. . . . .

1. Principles of Instrumental Analysis Skoog, Holler, Nilman, Harcourt College Publishers, 1998

2. Analytical Chemistry R.Kellner, J.M.Mermet, M.Otto, H.M.Widmer, Wiley-VCH, 1997

3. mse.iastate.edu/microscopy/home.html

4. www.mos.org/sln/SEM/5. science.nasa.gov/newhome/headlines/ast05mar98_3.htm

6. www.sciencemuseum.org.uk/on-line/electron/section4/sem.asp7. acept.la.asu.edu/PiN/rdg/elmicr/elmicr.html

8. www.wiley.com/cp/mmr/mmrsampl.htm

1:

2: -

e

E1

E0

e

E1

E0

3:

4:

5:

6: K L

7: Auger

8:

9:

EMBED MSPhotoEd.3

10:

. . .

. .

, .

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