SIP模块测试的整体解决方案 Total Solution for SIP Module Test

Ensure High Quality Electronics & Revolutionize Manufacturing Automation

2

Wireless Products Semiconductors Advanced Automation Printed Circuit Boards HDD, SSD, SLT

Chip Test Sub System Test

Final Product Test

Collaborative Robots

System Test Group 2016 Sales: $190M

• Circuit board, defense and aerospace and HDD/SSD test • Cost of test and time-to-market advantages

Revenue

2013 $1.43B

2014 $1.65B

2015 $1.64B

2016 $1.75B

Wireless Test 2016 Sales: $96M • Production optimized for best cost performance • Fast time-to-market for wireless products

Semiconductor Test 2016 Sales: $1.4B • Aligned to mobility (~50% of 2015 revenue) • Cost of test and time-to-market advantages • #1 with 48% market share; gained over 20 points of share since 2004

Industrial Automation 2016 Sales: $99M

• Easy to deploy, program and re-program • Safe, lightweight and economical • Fast ROI

Teradyne’s Four Operating Segments

3 (1) Non-GAAP

2016 Sales

78%

11%

6% 5%

Semi Test

System Test

Industrial Automation

Wireless Test

传统封装芯片ATE测试流程 Traditional ATE Test Flow

晶圆制造

Wafer Fab

晶圆测试

Wafer Test

封装

Assemble

封装测试

Final Test

系统级测试

SLT

系统级封装引入新的挑战 之一 ： 从简单晶圆测试走向全面KGD测试 Challenge for SIP Testing – From Simple CP test to KGD Test

Cellular baseband SiP 6 dies including 2 stacked dies

DieNDieDieDieSIP 321

SIP

DieN

SIP合封芯片良率

第N颗Die的良率

SIP芯片将推动高质量 全面的晶圆级测试 SIP test will drive high quality/full coverage CP test

全面的晶圆测试覆盖： 数字测试+ 模拟测试 + 射频测试 Full Coverage CP Test : Digital + Mix Signal + RF

DC

Digital

DC

Digital Mix Signal

RF

模拟与射频测试比重增加 整体测试难度将显著提升 More Analog/RF test will increase the test complexity in CP

传统晶圆测试测试项比例 SIP所需晶圆测试测试项比例

传统晶圆测试硬件的挑战 Challenges from traditional CP test hardware

传统的CP测试机台接口 Traditional CP tester interface

信号经过长的传输通路 信号完整性无法保证 损耗过大 Signal quality will degrade though long trace 无法保证高质量的模拟/射频测试需求 Difficult to offer high quality analog/RF test

优化的基于晶圆模拟与射频测试的硬件方案 Optimized Hardware Solution for Analog and RF test in CP test

支持模拟射频测试的CP测试机台接口 New interface for analog/RF probe test

极大算短信号通路长度 达成高质量的模拟射频信号传输 Optimized signal delivery for better analog/RF signal transmission 配合最新的Probe Card技术 （比如Cascade Microtech’s Pyramid-MW Probe） New probe card technology ready for high performance 目前已经有方案支持未来5G毫米波的测试需求 Solution is ready for future 5G mmWave test needs

X X

系统级封装引入新的挑战 之二 ： 从传统ATE测试走向全面SLT测试 Challenge for SIP Testing – From traditional ATE test to SLT Test

AP

DDR

WIFI SENSOR

PMIC

每个模块可能来自不同公司 Different die from different company 合封后模块可测性降低 Poor DFT support 缺乏ATE测试模式支持 No ATE test mode support

从原先基于模块的ATE测试转向系统级测试 Trend is from structure ATE test to SLT test

如何满足海量产品的SLT测试需求？ How to fulfill high volume SLT test requirements?

> 100台

SLT测试时间5分钟 SLT Test time > 5 Mins 月出货1千万颗 10M parts per Month

> 10 人

> 500 平方米

泰瑞达创新的高产出SLT测试机 Teradyne offer innovated high throughput SLT tester

最高同测>400 颗 Test more than 400 DUT in parallel 占地小于8平方米 Test floor less than 8 mm 异步软件控制构架 Asynchronous software control

Pick DUT 1

Pick DUT 2

Pick DUT 3

Bin Out DUT 1

Bin Out DUT 2

Bin Out DUT 3

泰瑞达提供全面解决方案 确保总体测试成本最低 Teradyne offer turnkey solution for lowest test cost

CP测试覆盖

FT测试覆盖

SLT测试覆盖

需要综合考虑CP/FT/SLT测试覆盖与成本 Trade off CP/FT/SLT test coverage and cost 优化三道测试工序中重复覆盖部分 Optimize overlap in three test insertions

依赖大数据分析 Need big data support for analysis

4300个工程人员服务全球客户 4300 Employee support WW customers

Japan

•Design Center

•Applications Development

•Sales & Support

Korea

•Sales & Support

US •Headquarters

•Product Development

•Sales & Support

•New Product Introduction

Costa Rica

•Repair Center

Europe-

•UR HQ

•Sales and Support

Rest of Asia

•Applications Development

•Sales & Support

•Repair Center

•Global Sourcing Group

China

•Applications Development

•Sales & Support

•Production

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合作共赢迎接新的机会…. Collaboration to win new business

Q1’17 Actual

现金及有价证券 15亿美金

半导体测试市场份额 48%

公司市值 71亿美金

2011 2015

$510M $285M

持续支持客户的成功

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25% 22%

25% 24%

33% 37%

44%

36% 37%

44% 46% 47% 48%

-20%

0%

20%

40%

60%

0

1,500

3,000

4,500

6,000

2004 2005 2006 2007 2008 2009 2010 2011 2012 2013 2014 2015 2016

Tota

l ATE

Sh

ip S

har

e %

Tota

l ATE

Sh

ip T

AM

($M

)

SOC TAM($M) Memory TAM($M) TERADYNE

15

谢谢