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MU Sigma GroupJan 2017
() : A
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DOE(DOE Program)
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Design of Experiments, DOE
DOEDOEMinitabDOEDOE
DOEDMAICDOE 3-4 6 - 12
3
1. 2.
3. DOE
4. 5. DMAIC6. Minitab
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DOE
5
DOE
6
7
-- 4
()
DOEDOE
Box-Behnken
Minitab (CCCCCICCF)
Minitab, Box-Behnken DOERoadmap
DOE
, Minitab
,
Minitab
DOE, ,
, , ,
Minitab
Minitab
Minitab (PSA) ()
Skills of DOE
Plackett-Burman DOE
Q & A
DOE DOE
, DOE)LunchDOE Video
8
TTF
Perc
ent
2000150010005000
100
80
60
40
20
0
Table of Statistics
Median 743.927IQR 602.563Failure 10Censor 0AD* 1.277
Shape
Correlation 0.995
1.90180Scale 902.043Mean 800.416StDev 437.815
Parametric Survival Plot for TTF
Complete Data - LSXY EstimatesWeibull
Taguchi
Process or Product Name: Prepared by:
Responsible: FMEA Date (Orig) ______________ (Rev) ___
Process Step/Part Number Potential Failure Mode Potential Failure Effects
SEV Potential Causes
OCC Current Controls
DET
RPN
Spin Draw Process
Fiber Breakouts Undersized package, High SD panel-hours lost 2
Dirty Spinneret8
Visual Detection of Wraps and broken Filaments 9 144
5Filament motion
2Visual Sight-glass
8 80
8Polymer defects
2Fuzzball Light
9 144
0
Process/Product Failure Modes and Effects Analysis
(FMEA)
FMEA
DOE/RSM
f(x) CPM
;
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(RSM) Plackett-Burman
10
(Sequential Experimentation)
(POA)
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Plackett-Burman()
C.C.D
()
()
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///DMAIC/MFSS/ DFSSDFX/DFA/DFM /DFT/DFP
MBA /
/MBB 09-10;
/MBB 03-08 BMG (MBB) 02-03 (GE)
/MBB(EHS) 95-02
92-95/ 91-92 NPI 88-90 1987
: 2000 GE(ACFC) 2001 GEe(eGE) 2007 DSS 2009.02 2013.08 DFX
: 36Netgear5Arris4
DFSS/DFX: 1313552233224/////// 9255 22 ABB24
(Steven Lee) /MBB
13
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