原子力显微镜在聚合物膜研究方面的应用

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Seminar 2. 原子力显微镜在聚合物膜研究方面的应用. 学生:李红剑 导师:曹义鸣. 大连化学物理研究所905组. 1982 年 , Gerd Binnig 和 Heinrich Rohrer 共同研制成功了第一台扫描隧道显微镜 ( scanning tunneling microscope ,STM), 1986 年 , Binnig 和 Rohrer 被授予诺贝尔物理学奖 。 衍生出一系列扫瞄探针显微镜( Scanning Probe microscope). - PowerPoint PPT Presentation

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  • 905Seminar 2

  • 1982 ,Gerd Binnig Heinrich Rohrer ( scanning tunneling microscope ,STM), 1986 ,Binnig Rohrer Scanning Probe microscope

  • (Atomic Force Microscopy, AFM)BinnigQuate

  • AFMSTM , STM AFM

  • AFM

  • AFM

  • AFM1000;100;AFM10,

  • ,; ,,,,AFM

  • ;AFMAFM,:

  • 1988 Albrecht AFM

  • ()

    AFM

  • AFM

  • 1

  • Fig. 1. Section analysis of TM-AFM image.1

  • Fig. 2. Three-dimensional TM-AFM images of the PVDF membranes (W0, W3, W5, W7).

  • 2

  • 2

  • Fig. 2. Tapping mode atomic force micrographs of (a) (scan size: 500 nm, scan rate: 0.4268 Hz), and (b) outside (scansize: 10m, scan rate: 0.4002 Hz) with generally used silicon single-crystal probe and J-scanner, (c) APS-150 inside (scan size: 500 nm,scan rate: 0.3290 Hz) with highly sharpened silicon single-crystal probe and E-scanner having smaller maximum scan area and smaller maximum scan height, and (d) distribution of pore diameter determined by TMAFM.3

  • 4

  • 3 Surface roughness

  • 5Fig. 2. Atomic force micrographs of 0.20 pm microfiltration membranes: (a) nylon; (b) polysulfone; (c) poly(vinylidene) fluoride; (d)polyethersulfone.

  • 6Fig. 3. AFM images of modified NF-270 membranes of low (a), moderate (b) and heavy (c and d) modification. The average roughness (in nm) is: (a) 1.3; (b) 1.9; (c) 9.9 ; (d) 4.9.

  • 4

  • 3 X 1m/ ; Z 50 nm/ 4 X 1m/ ; Z 2 000 nm/ 7

  • 8Fig.1: 105 ppm membrane, raw scan at 9.7 x 9.7 mm2; RMS roughness is 105 nm.Fig.2: 104 ppm membrane, raw scan at 9.7 x 9.7 mm2; RMS roughness is 7.11 nm.

  • Fig.3: 105 ppm membrane, raw scan at 9.7 x 9.7 mm2 and cross section of pits.Fig.4: 104 ppm membrane, raw scan at 9.7 x 9.7 mm2 and cross section of pits.

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