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Phase Noise Scaling of LC-VCO for Ultra Low Supply Voltage W iD K i hiOk d d Aki Mt Tokyo Institute of Technology Wei Deng , Kenichi Okada, and Akira Matsuzawa Tokyo Institute of Technology Matsuzawa & Okada Lab. Matsuzawa & Okada Lab. 2010/09/25, AP-RASC

Phase Noise Scaling of LC-VCO for Ultra Low Supply Voltage€¦ · Phase Noise Scaling of LC-VCO for Ultra Low Supply Voltage WiD K i hi Ok d d Aki M t Tokyo Institute of Technology

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Phase Noise Scaling of LC-VCO for Ultra Low gSupply Voltage

W i D K i hi Ok d d Aki M t

Tokyo Institute of Technology

Wei Deng, Kenichi Okada, and Akira Matsuzawa

Tokyo Institute of Technology

Matsuzawa& Okada Lab.Matsuzawa& Okada Lab.

2010/09/25, AP-RASC

1Outline

• Background- Clock generation in System-on-Chip

• Challengingg g- Supply voltage scaling

L lt l k t ’ i• Low voltage clock generator’s issues- Ring VCO becomes infeasible due to too

large phase noise performance• Possible solutionPossible solution• Conclusion

Matsuzawa& Okada Lab.Matsuzawa& Okada Lab.2010/9/25 Wei Deng, Tokyo Tech.

2Research Background

WLANCellular RadarAppliance

DAB 4UWBSoC

RFID GPSWiMax

Matsuzawa& Okada Lab.Matsuzawa& Okada Lab.2010/9/25 Wei Deng, Tokyo Tech.

3Clock Generation in SOC

AD ConverterClock

generationDA Converter

generationDigital circuit

Clock generation circuits are widely used in aClock generation circuits are widely used in a number of applications in which a reference

Matsuzawa& Okada Lab.Matsuzawa& Okada Lab.2010/9/25

tone is requiredWei Deng, Tokyo Tech.

4How to Evaluate Clock Generator?

– Phase noise • Measure of spectral density in frequency

domain• Units: dBc/Hz (decibels below the carrier

per Hz)

– Jitter (Better choice for clock)( )• Measurement of variations in time domain• Units: Seconds (usually pS)• Units: Seconds (usually pS)

Matsuzawa& Okada Lab.Matsuzawa& Okada Lab.2010/9/25 Wei Deng, Tokyo Tech.

5What is Jitter in Clock Generator?

Jitter Timing variation in signal waveform

Cause of Jitter (phase noise): Thermal noise and shot noise

Jitter g g

Matsuzawa& Okada Lab.Matsuzawa& Okada Lab.2010/9/25 Wei Deng, Tokyo Tech.

Cause of Jitter (phase noise): Thermal noise and shot noise

6How Jitter Affect Performance?

Signal

IdealIdeal clock 1101001

DegradedNoisy clock

Degraded BER

clock1100011

Clock generator with small jitter (phase noise) is

Matsuzawa& Okada Lab.Matsuzawa& Okada Lab.

g j (p )strongly desired

2010/9/25 Wei Deng, Tokyo Tech.

7Scaling of Supply Voltage2

V]

1.5

age

[V

ITRS 20091

Volta

ITRS 20000.5

pply

V

Leakage current& Process fluctuation

ITRS 2000

01999 2004 2009 2014 2019

Sup & Process fluctuation

1999 2004 2009 2014 2019

How about phase noise performance along withMatsuzawa& Okada Lab.Matsuzawa& Okada Lab.2010/9/25 Wei Deng, Tokyo Tech.

How about phase noise performance along with supply voltage scaling?

8Phase Noise Comparison

LC-VCO [A. Mazzanti, et al., JSSC 2008]

20 1 nkTω γ+⋅ ⋅ 2

n2

20 1kT γω +

⋅⋅2 2offset DD biasV I Qω

⋅ ⋅

+30dB worse2

biasDD2 QIVoffsetω

Ring-VCO30d o se

[A. Abidi, JSSC 2006]

2 VkT ⎧ ⎫( )20 2 1DD

2 n pVkT M

V I V Vω γ γω

⎧ ⎫⋅ ⋅ + +⎨ ⎬−⎩ ⎭

M: #stages2V

offset DD bias DD THV I V Vω ⎩ ⎭

Matsuzawa& Okada Lab.Matsuzawa& Okada Lab.

g2, , 3, 10

4 3= = = = =DD

TH n pVV M Qγ γ2, , 3, 10

4 3DD

TH n p VV M Qγ γ= = = = =2010/9/25 Wei Deng, Tokyo Tech.

9Scaling of Jitter15

Cl k %]

z]15 15

Cl k %]

z]15

10Clock

ock

[%

k [G

H 10

510

Clock

ock

[%

k [G

H 10

5Ring-VCO 5 te

r/Clo

Clo

ck 5

0 Ring-VCO 5 ter/C

lo

Clo

ck 5

0

LC VCO31.6x

5

6σJi

tt0

LC VCO31.6x

5

6σJi

tt0

2007 2010 2013 2016 2019 2022

LC-VCO 0

6

2007 2010 2013 2016 2019 2022

LC-VCO 0

6

2007 2010 2013 2016 2019 2022Year

2007 2010 2013 2016 2019 2022Year

With same power consumption LC-VCO has much smaller

Matsuzawa& Okada Lab.Matsuzawa& Okada Lab.2010/9/25 Wei Deng, Tokyo Tech.

With same power consumption, LC-VCO has much smallerjitter performance

10Scaling of Phase Noise

VDD Type PDCPhase Noise +10dB

margin @1MHz Jitterg @

1.2-V(N )

LC 1mW -121.6 dBc/Hz 0.16ps

(Now)Ring 1mW -91.6 dBc/Hz 5.0ps

LC 0 17 W 114 0 dB /H 0 38

0.5-V

LC 0.17mW -114.0 dBc/Hz 0.38ps

0.17mW -84.0 dBc/Hz 12.0ps(Future)

Ring0.17mW 84.0 dBc/Hz 12.0ps

174mW -114.0 dBc/Hz 0.38ps

For 0.5-V clock generators, ring-VCO becomes infeasible due

Matsuzawa& Okada Lab.Matsuzawa& Okada Lab.2010/9/25 Wei Deng, Tokyo Tech.

to large power consumption and/or large jitter.

11Comparison of Performance

Parameter Jitter P Area Tuning rangeParameter Jitter PDC Area Tuning range

0 5-V0.5 VRing VCO Very Bad Good Good Good

0 5 V F i b t F i d i d F i b t0.5-VLC VCO Very Good Fair, but can

be improvedFair, and improved

in [1]Fair, but can be improved

LC-VCO with PDC, area and tuning range optimization

[1]: R Murakami K Okada and A Matsuzawa "A 484 μm2 21 GHz LC VCO beneath a Stacked Spiral Inductor "

is necessary for 0.5-V clock generation circuits

Matsuzawa& Okada Lab.Matsuzawa& Okada Lab.2010/9/25 Wei Deng, Tokyo Tech.

[1]: R. Murakami, K. Okada, and A. Matsuzawa, A 484-μm2 21-GHz LC-VCO beneath a Stacked-Spiral Inductor, to be presented at IEEE MTT-S European Microwave Conference (EuMC), Paris, France, Sep. 2010.

12Research Status- Unit [2] [3] [4] [5] [6]

Topology - LC LC LC LC Ringp gy g

VDD V 0.6 0.5 0.9 0.5 0.5

Frequency GHz 5.3 ~ 6 3.65 ~ 3.76 2.17 ~ 2.73 2.15~2.62 0.12-1.3T ningTuning range % 8.1 3 22.8 20 85Jitter ps <1 <1 <1 <1 >15

[2] H.-H. Hsieh, et al., MTT 2007 [3] K. Kwok, et al., JSSC 2005 [4] S.Y. Lee, et al., TCAS II 2008 [5] D. Park, et al., MTT 2009 [6] T.W. Li, et al., ASICON 2009

Ul l l l k i h id iUltra-low-voltage clock generator with wide tuningrange (merit of ring VCO)and sub-picosecond-jitter( i f LC VCO) d i d i f 0 5 V S C(merit of LC VCO) are desired in future 0.5-V SoCand power aware SoC.

Matsuzawa& Okada Lab.Matsuzawa& Okada Lab.2010/9/25 Wei Deng, Tokyo Tech.

13Possible Solution

0f

Nf /00f

Nf 2/0

Nf 4/0

0 / 64f N

Conventional Proposed[REF]: Wei Deng, Kenichi Okada, and Akira Matsuzawa "A 0.5-V, 0.05-to-3.2 GHz, 4.1-to-6.4 GHz LC-VCO Using E-TSPC Frequency Di id i h F d B d Bi f S b Pi d Ji Cl k G i “ b d A i S lid S Ci i C f

Matsuzawa& Okada Lab.Matsuzawa& Okada Lab.2010/9/25 Wei Deng, Tokyo Tech.

Divider with Forward Body Bias for Sub-Picosecond -Jitter Clock Generation“ to be presented at Asian Solid-State Circuits Conference (A-SSCC), Nov. 2010

14Summary

• Lowering of supply voltage is required to realize g pp y g qlow-active-power circuits.

• Phase noise (Jitter) will become larger according toPhase noise (Jitter) will become larger according to the voltage scaling.

• Ring VCO become infeasible due to too large• Ring-VCO become infeasible due to too large phase noise (jitter) and/or too large power consumptionconsumption.

• To reduce the power consumption of the clock generator adoption of LC VCOs is an na oidablegenerator, adoption of LC-VCOs is an unavoidable way in such low-voltage condition.

Matsuzawa& Okada Lab.Matsuzawa& Okada Lab.2010/9/25 Wei Deng, Tokyo Tech.

15Toward the Future

• Ultra-low-voltage LC-VCO offers tremendousopportunities in phase noise (jitter) performanceopportunities in phase noise (jitter) performanceof clock generator in SoC design.

• The tuning range of ultra-low-voltage LC-VCOshould be improved to fulfill the requirement forfuture 0.5-V sub-picosecond-jitter clockgeneration.

Matsuzawa& Okada Lab.Matsuzawa& Okada Lab.2010/9/25 Wei Deng, Tokyo Tech.

16

Thanks for your attention!y

Q & A

Matsuzawa& Okada Lab.Matsuzawa& Okada Lab.2010/9/25 Wei Deng, Tokyo Tech.