半導體量測技術 Semiconductor Materials and Device Characterization

半導體量測技術Semiconductor Materials and Device Characterization

Topic 7: time-of-flight technique and carrier mobility

Instructor: Dr. Yi-Mu Lee

Department of Electronic Engineering

National United University

Review and new topics:

• Charge pumping method (p. 379)• Haynes-Shockley experiment (time of flight)• Photoelectric effect (time of flight)• Introduction to mobility• Presentation: 12/29 = 3 students

01/05 = 5 students

• Final exam: (3:00pm~5:30pm)

Time-of-flight (drift mobility)

QA

Mobility

• MOSFET mobility

• Effective mobility

• Field-effect mobility

• Time-of-flight or drift mobility– Mobility and carrier velocity at high E-field

D. K. Schroder, p. 540

D. K. Schroder, p. 541

D. K. Schroder, p. 541

D. K. Schroder, p. 541

D. K. Schroder, p. 542~543

Continue to study p. 545

D. K. Schroder, p. 541

D. K. Schroder, p. 547

D. K. Schroder, p. 548

D. K. Schroder, p. 549

D. K. Schroder, p. 549

Continue to study p. 551

D. K. Schroder, p. 550

Review suggested

• 8.4 8.5• 8.6 8.8• (in D. K. Schroder)

*You are welcome to submit the above homework to get extra bonus for your semester grade!!

**These questions are still in the range of final exam!!