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IRFP260NHEXFET® Power MOSFET
10/11/00
Parameter Max. UnitsID @ TC = 25°C Continuous Drain Current, VGS @ 10V 50ID @ TC = 100°C Continuous Drain Current, VGS @ 10V 35 AIDM Pulsed Drain Current � 200PD @TC = 25°C Power Dissipation 300 W
Linear Derating Factor 2.0 W/°CVGS Gate-to-Source Voltage ±20 VEAS Single Pulse Avalanche Energy� 560 mJIAR Avalanche Current� 50 AEAR Repetitive Avalanche Energy� 30 mJdv/dt Peak Diode Recovery dv/dt � 10 V/nsTJ Operating Junction and -55 to +175TSTG Storage Temperature Range
Soldering Temperature, for 10 seconds 300 (1.6mm from case )°C
Mounting torque, 6-32 or M3 srew 10 lbf•in (1.1N•m)
Absolute Maximum Ratings
Parameter Typ. Max. UnitsRθJC Junction-to-Case ––– 0.50RθCS Case-to-Sink, Flat, Greased Surface 0.24 ––– °C/WRθJA Junction-to-Ambient ––– 40
Thermal Resistance
www.irf.com 1
Fifth Generation HEXFETs from International Rectifier utilize advanced processingtechniques to achieve extremely low on-resistance per silicon area. This benefit,combined with the fast switching speed and ruggedized device design thatHEXFET Power MOSFETs are well known for, provides the designer with anextremely efficient and reliable device for use in a wide variety of applications.
The TO-247 package is preferred for commercial-industrial applications wherehigher power levels preclude the use of TO-220 devices. The TO-247 is similarbut superior to the earlier TO-218 package because of its isolated mounting hole.
Description
VDSS = 200V
RDS(on) = 0.04Ω
ID = 50AS
D
G
� Advanced Process Technology� Dynamic dv/dt Rating� 175°C Operating Temperature� Fast Switching� Fully Avalanche Rated� Ease of Paralleling� Simple Drive Requirements
TO-247AC
PD - 94004A
IRFP260N
2 www.irf.com
S
D
G
Parameter Min. Typ. Max. Units ConditionsIS Continuous Source Current MOSFET symbol
(Body Diode) ––– ––– showing theISM Pulsed Source Current integral reverse
(Body Diode)� ––– ––– p-n junction diode.VSD Diode Forward Voltage ––– ––– 1.3 V TJ = 25°C, IS = 28A, VGS = 0V �trr Reverse Recovery Time ––– 268 402 ns TJ = 25°C, IF = 28AQrr Reverse Recovery Charge ––– 1.9 2.8 μC di/dt = 100A/μs �ton Forward Turn-On Time Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)
Source-Drain Ratings and Characteristics
50
200A
� Starting TJ = 25°C, L = 1.5mH RG = 25Ω, IAS = 28A.
� Repetitive rating; pulse width limited by max. junction temperature.
Notes:� ISD ≤ 28A, di/dt ≤ 486A/μs, VDD ≤ V(BR)DSS, TJ ≤ 175°C� Pulse width ≤ 400μs; duty cycle ≤ 2%.
Parameter Min. Typ. Max. Units ConditionsV(BR)DSS Drain-to-Source Breakdown Voltage 200 ––– ––– V VGS = 0V, ID = 250μAΔV(BR)DSS/ΔTJ Breakdown Voltage Temp. Coefficient ––– 0.26 ––– V/°C Reference to 25°C, ID = 1mARDS(on) Static Drain-to-Source On-Resistance ––– ––– 0.04 Ω VGS = 10V, ID = 28A��VGS(th) Gate Threshold Voltage 2.0 ––– 4.0 V VDS = VGS, ID = 250μAgfs Forward Transconductance 27 ––– ––– S VDS = 50V, ID = 28A �
––– ––– 25 μA VDS = 200V, VGS = 0V––– ––– 250 VDS = 160V, VGS = 0V, TJ = 150°C
Gate-to-Source Forward Leakage ––– ––– 100 VGS = 20VGate-to-Source Reverse Leakage ––– ––– -100
nAVGS = -20V
Qg Total Gate Charge ––– ––– 234 ID = 28AQgs Gate-to-Source Charge ––– ––– 38 nC VDS = 160VQgd Gate-to-Drain ("Miller") Charge ––– ––– 110 VGS = 10V �td(on) Turn-On Delay Time ––– 17 ––– VDD = 100Vtr Rise Time ––– 60 ––– ID = 28Atd(off) Turn-Off Delay Time ––– 55 ––– RG = 1.8Ωtf Fall Time ––– 48 ––– VGS = 10V��
Between lead,––– –––
6mm (0.25in.)from packageand center of die contact
Ciss Input Capacitance ––– 4057 ––– VGS = 0VCoss Output Capacitance ––– 603 ––– pF VDS = 25VCrss Reverse Transfer Capacitance ––– 161 ––– ƒ = 1.0MHz
nH
Electrical Characteristics @ TJ = 25°C (unless otherwise specified)
LD Internal Drain Inductance
LS Internal Source Inductance ––– –––S
D
G
IGSS
ns
5.0
13
IDSS Drain-to-Source Leakage Current
IRFP260N
www.irf.com 3
0.1
1
10
100
1000
0.1 1 10 100
�
20μs PULSE WIDTHT = 25 CJ °
�
TOP
BOTTOM
VGS15V10V8.0V7.0V6.0V5.5V5.0V4.5V
V , Drain-to-Source Voltage (V)
I ,
Dra
in-to
-Sou
rce
Cur
rent
(A)
DS
D
4.5V
0.1
1
10
100
1000
0.1 1 10 100
�
20μs PULSE WIDTHT = 175 CJ °
�
TOP
BOTTOM
VGS15V10V8.0V7.0V6.0V5.5V5.0V4.5V
V , Drain-to-Source Voltage (V)I
, D
rain
-to-S
ourc
e C
urre
nt (A
)
DS
D
4.5V
Fig 2. Typical Output CharacteristicsFig 1. Typical Output Characteristics
Fig 3. Typical Transfer Characteristics
1
10
100
1000
4.0 5.0 6.0 7.0 8.0 9.0 10.0
�
V = 50V20μs PULSE WIDTH
DS
V , Gate-to-Source Voltage (V)
I ,
Dra
in-to
-Sou
rce
Cur
rent
(A)
GS
D
�
T = 175 CJ °
�
T = 25 CJ °
-60 -40 -20 0 20 40 60 80 100 120 140 160 1800.0
0.5
1.0
1.5
2.0
2.5
3.0
3.5
T , Junction Temperature( C)
R
, D
rain
-to-S
ourc
e O
n R
esis
tanc
e(N
orm
aliz
ed)
J
DS
(on)
°
�
�
V =
I =
GS
D
10V
50A
Fig 4. Normalized On-ResistanceVs. Temperature
IRFP260N
4 www.irf.com
Fig 7. Typical Source-Drain DiodeForward Voltage
Fig 5. Typical Capacitance Vs.Drain-to-Source Voltage
Fig 6. Typical Gate Charge Vs.Gate-to-Source Voltage
1
10
100
1000
1 10 100 1000
�
OPERATION IN THIS AREA LIMITEDBY RDS(on)
� Single Pulse T T
= 175 C= 25 C°
°JC
V , Drain-to-Source Voltage (V)
I ,
Dra
in C
urre
nt (A
)I
, D
rain
Cur
rent
(A)
DS
D
�10us
�100us
�1ms
�10ms
Fig 7. Typical Source-Drain DiodeForward Voltage
Fig 8. Maximum Safe Operating Area
Fig 6. Typical Gate Charge Vs.Gate-to-Source Voltage
1 10 100 1000
VDS, Drain-to-Source Voltage (V)
0
1000
2000
3000
4000
5000
6000
7000
8000
C, C
apac
itanc
e(pF
)
Coss
Crss
Ciss
VGS = 0V, f = 1 MHZCiss = Cgs + Cgd, Cds SHORTEDCrss = CgdCoss = Cds+ Cgd
0 50 100 150 2000
4
8
12
16
Q , Total Gate Charge (nC)
V
, G
ate-
to-S
ourc
e V
olta
ge (V
)
G
GS
�
I =D 28A
�V = 40VDSV = 100VDSV = 160VDS
0.1
1
10
100
1000
0.2 0.6 1.0 1.4 1.8 2.2V ,Source-to-Drain Voltage (V)
I
, Rev
erse
Dra
in C
urre
nt (A
)
SD
SD
�
V = 0 V GS
�
T = 25 CJ °
�
T = 175 CJ °
IRFP260N
www.irf.com 5
RD
Fig 9. Maximum Drain Current Vs.Case Temperature
Fig 10a. Switching Time Test Circuit
VDS90%
10%VGS
td(on) tr td(off) tf
Fig 10b. Switching Time Waveforms
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case
VDS
Pulse Width ≤ 1 μsDuty Factor ≤ 0.1 %
VGS
RG
D.U.T.
10V
+-
25 50 75 100 125 150 1750
10
20
30
40
50
T , Case Temperature ( C)
I ,
Dra
in C
urre
nt (A
)
°C
D
Fig 9. Maximum Drain Current Vs.Case Temperature
Fig 10a. Switching Time Test Circuit
VDS90%
10%VGS
td(on) tr td(off) tf
Fig 10b. Switching Time Waveforms
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case
VDS
Pulse Width ≤ 1 μsDuty Factor ≤ 0.1 %
VGS
RG
D.U.T.
10V
VDD
25 50 75 100 125 150 1750
10
20
30
40
50
T , Case Temperature ( C)
I ,
Dra
in C
urre
nt (A
)
°C
D
0.001
0.01
0.1
1
0.00001 0.0001 0.001 0.01 0.1 1
�
Notes:1. Duty factor D = t / t2. Peak T =P x Z + T
1 2J DM thJC C
�
P
t
t
DM
1
2
t , Rectangular Pulse Duration (sec)
Ther
mal
Res
pons
e(Z
)
1
thJC
0.010.02
0.05
0.10
0.20
D = 0.50
�
SINGLE PULSE(THERMAL RESPONSE)
IRFP260N
6 www.irf.com
QG
QGS QGD
VG
Charge
D.U.T.VDS
IDIG
3mA
VGS
.3μF
50KΩ
.2μF12V
Current RegulatorSame Type as D.U.T.
Current Sampling Resistors
+-
10 V
Fig 13b. Gate Charge Test CircuitFig 13a. Basic Gate Charge Waveform
Fig 12b. Unclamped Inductive Waveforms
Fig 12a. Unclamped Inductive Test Circuit
tp
V (B R )D S S
IA S
Fig 12c. Maximum Avalanche EnergyVs. Drain Current
R G
IA S
0 .01Ωtp
D .U .T
LV D S
+- VD D
D R IV E R
A
15V
20V
25 50 75 100 125 150 1750
500
1000
1500
Starting T , Junction Temperature ( C)
E
, S
ingl
e P
ulse
Ava
lanc
he E
nerg
y (m
J)
J
AS
°
�
IDTOP
BOTTOM
11A20A28A
IRFP260N
www.irf.com 7
P.W.Period
di/dt
Diode Recoverydv/dt
Ripple ≤ 5%
Body Diode Forward DropRe-AppliedVoltage
ReverseRecoveryCurrent
Body Diode ForwardCurrent
VGS=10V
VDD
ISD
Driver Gate Drive
D.U.T. ISD Waveform
D.U.T. VDS Waveform
Inductor Curent
D = P.W.Period
+
-
+
+
+-
-
-
Fig 14. For N-Channel HEXFETS
* VGS = 5V for Logic Level Devices
Peak Diode Recovery dv/dt Test Circuit
�
��
RGVDD
• dv/dt controlled by RG• Driver same type as D.U.T.• ISD controlled by Duty Factor "D"• D.U.T. - Device Under Test
D.U.T Circuit Layout Considerations • Low Stray Inductance
• Ground Plane • Low Leakage Inductance
Current Transformer
�
*
IRFP260N
8 www.irf.com
Part Marking InformationTO-247AC
Package OutlineTO-247AC OutlineDimensions are shown in millimeters (inches)
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105IR EUROPEAN REGIONAL CENTRE: 439/445 Godstone Rd, Whyteleafe, Surrey CR3 OBL, UK Tel: ++ 44 (0)20 8645 8000
IR CANADA: 15 Lincoln Court, Brampton, Ontario L6T3Z2, Tel: (905) 453 2200IR GERMANY: Saalburgstrasse 157, 61350 Bad Homburg Tel: ++ 49 (0) 6172 96590
IR ITALY: Via Liguria 49, 10071 Borgaro, Torino Tel: ++ 39 011 451 0111IR JAPAN: K&H Bldg., 2F, 30-4 Nishi-Ikebukuro 3-Chome, Toshima-Ku, Tokyo 171 Tel: 81 (0)3 3983 0086
IR SOUTHEAST ASIA: 1 Kim Seng Promenade, Great World City West Tower, 13-11, Singapore 237994 Tel: ++ 65 (0)838 4630IR TAIWAN:16 Fl. Suite D. 207, Sec. 2, Tun Haw South Road, Taipei, 10673 Tel: 886-(0)2 2377 9936
Data and specifications subject to change without notice. 10/00
IN TE R N ATIO N AL R ECTIF IE R LOG O
A S S E M B LY L OT COD E
E XAM P LE : TH IS IS A N IR F PE 30 W ITH A S S E M B LY L O T C O D E 3 A1 Q
P A R T N U M B ER
D A TE C O D E(YYW W )YY = YE A RW W W EE K
3A 1 Q 9 302
IR FP E 30
A
LE A D A S S IG N M E N TS
NO TE S :
- D -5 .30 (.209 )4 .70 (.185 )
2 .50 (.089)1 .50 (.059)
4
3X0 .80 (.031)0 .40 (.016)
2.60 (.102)2.20 (.087)3 .40 (.133 )
3 .00 (.118 )
3X
0 .25 (.010 ) M C A S
4.30 (.170 )3 .70 (.145 )
- C -
2X 5.50 (.217)4.50 (.177)
5 .50 (.217)
0.25 (.010)
1 .40 (.056 )1 .00 (.039 )
3.65 (.143 )3.55 (.140 )
DM MB- A -
15.90 (.626)15.30 (.602)
- B -
1 2 3
20 .30 (.800)19 .70 (.775)
14.80 (.583 )14.20 (.559 )
2 .40 (.094)2 .00 (.079)
2X
2X5.45 (.215)
1 D IM E N S IO NING & TO LE R A N CING P E R A N S I Y 14.5M , 1982.2 CO N TR O LLIN G D IM E N S IO N : IN CH .3 CO N F O RM S TO JE D E C O U TLINE TO -247-A C .
1 - G A TE2 - DR A IN3 - S O UR C E4 - DR A IN